Non-invasive optical characterization of biomaterial mineralization
In one aspect, the present invention generally provides methods for characterizing mineralization of a material, e.g., a biomaterial, by illuminating the material with radiation and analyzing radiation scattered from the material in response to the illumination. For example, in some embodiments, a material can be illuminated with polarized radiation at a plurality of wavelengths and the elastically scattered radiation corresponding to two or more of those wavelengths can be collected at two polarizations: one parallel and the other perpendicular to the illumination polarization. A differential intensity of the scattered radiation at the two polarizations can be analyzed as a function of wavelength to obtain information regarding the morphology of mineral deposits in the sample. Further, the total scattered radiation can be analyzed to derive information regarding the level of mineralization.
1. A method of monitoring mineralization in a sample, comprising
illuminating a sample with polarized radiation having at least two different wavelengths,
for each of the illuminating radiation wavelengths, detecting at least a portion of scattered radiation from the sample having a polarization parallel to said illuminating radiation and a portion having polarization perpendicular to the illuminating radiation in order to obtain a measurement of singly scattered radiation from the sample in response to said illumination at said two wavelengths, and
comparing intensities of said detected singly scattered radiation at said two wavelengths to obtain information regarding one or more mineral constituents of said sample.
2. The method of claim 1 , further comprising calculating, for each of the wavelengths, a differential intensity of the detected scattered radiation at said parallel and perpendicular polarizations.
3. The method of claim 2 , wherein said step of comparing intensities comprises comparing said differential intensity corresponding to one wavelength with the respective differential intensity corresponding to the other wavelength to obtain the information regarding said one or more mineral constituents of said sample.
4. The method of claim 1 , wherein said information relates to a morphology of said one or more mineral constituents of the sample.
5. The method of claim 1 , wherein said illuminating step comprises illuminating the sample concurrently with said two radiation wavelengths.
6. The method of claim 1 , further comprising dispersing said scattered radiation to detect the scattered radiation at each of said wavelengths.
7. The method of claim 1 , wherein said illuminating step comprises illuminating the sample with each of said wavelengths during different temporal intervals.
8. The method of claim 1 , wherein said detecting step comprises detecting at least a portion of radiation elastically scattered from the sample.
9. A method of measuring a property of a sample, comprising
measuring a wavelength spectrum of singly elastically scattered radiation from a sample by illuminating the sample with polarized radiation having a plurality of wavelengths and detecting at least a portion of scattered radiation from the sample having a polarization parallel to said illuminating radiation and a portion having polarization perpendicular to the illuminating radiation in order to obtain a measurement of singly scattered radiation from the sample at each of the plurality of wavelengths, and
utilizing said wavelength spectrum to derive information regarding mineralization of said sample.
10. The method of claim 9 , further comprising fitting said wavelength spectrum to a morphological mineralization model to derive information regarding morphology of mineral content of said sample.
11. The method of claim 9 , further comprising integrating said wavelength spectrum to obtain information regarding an amount of mineral content of said sample.
12. The method of claim 9 , wherein said detected scattered radiation comprises radiation elastically scattered from the sample.
13. A method of monitoring a sample, comprising
measuring scattered radiation from a sample in response to illumination by polarized radiation at a plurality of wavelengths and at a plurality of different scattering angles during each of a plurality of temporal intervals,
for each of said temporal intervals and for each of the illuminating radiation wavelengths, detecting at least a portion of scattered radiation from the sample having a polarization parallel to said illuminating radiation and a portion having a polarization perpendicular to the illuminating radiation in order to obtain a measurement of singly scattered radiation from the sample,
analyzing the measured singly scattered radiation as a function of wavelength and scattering angle to derive information regarding mineralization of the sample, and
comparing said information corresponding to different temporal intervals to monitor changes in the mineralization as a function of time.
14. The method of claim 13 , wherein said step of measuring radiation comprises measuring radiation elastically scattered from the sample.
15. A method of characterizing mineralization, comprising
measuring backscattered radiation from a sample at two different polarizations in response to illumination of the sample with polarized radiation at a plurality of wavelengths in order to obtain a measurement of singly scattered radiation from the sample at each of the plurality of wavelengths,
obtaining a differential intensity of the measured backscattered radiation at said polarizations for said plurality of wavelengths,
analyzing said differential intensity as a function of wavelength to characterize mineralization of the sample.
16. The method of claim 15 , wherein said step of characterizing the mineralization comprises obtaining information about morphology of mineral deposits.
17. The method of claim 15
wherein said analyzing step comprises utilizing a self-affine fractal model to derive information regarding morphology of the mineral deposits from said measured backscattered differential intensity.
18. The method of claim 17 , wherein said self-affine fractal model is described by the following expression:
Δ
I
(
λ
)
∝
λ
-
4
1
[
1
+
(
4
π
L
λ
)
2
]
α
wherein,
L represents the fractal upper scale (the upper bound of fractal correlation lengths) and
the exponent α is related to the Hurst parameter, H, via the following relation:
H=α−D E /2
wherein, D E is the Euclidean dimension of the scattering system.
19. The method of claim 18 , wherein D E =1 denotes a filamentous morphology for said mineral deposits.
20. The method of claim 18 , wherein D E =2 denotes a sheet-like morphology for said mineral deposits.
21. The method of claim 18 , wherein D E =3 denotes a bulk space-filling morphology.
22. The method of claim 15 , wherein said step of measuring radiation comprises measuring radiation elastically backscattered from the sample.