Memory cell structure, method of manufacturing a memory, and memory apparatus
The present disclosure relates to a memory cell structure, a method of manufacturing a memory, and a memory apparatus that are capable of providing a memory cell structure of an MRAM, which reduces resistance of drawn wiring to be connected to an MTJ, reduces an area of a memory cell, and avoids performance degradation of the MTJ due to heat. A memory cell includes: a transistor that uses a first diffusion layer formed in a bottom portion of a concave portion formed by processing a silicon substrate into a groove shape, and a second diffusion layer formed in upper end portions of two opposing sidewall portions of the concave portion, to form channels at portions between the first diffusion layer and the second diffusion layer in the two sidewall portions; and a memory element that is disposed below the first diffusion layer. The first diffusion layer is electrically connected to the memory element via a contact formed after the silicon substrate is thinned.
1. A memory device, comprising: a substrate; a plurality of memory cells configured to be located on the substrate, wherein each of the memory cells includes a memory element and a transistor; a plurality of word lines; a plurality of bit lines; and a plurality of data lines, wherein a first node of the transistor connects to the memory element, each of the word lines connects to a gate electrode of the transistor, each of the bit lines connects to a second node of the transistor and each of the data lines connects to the memory element, wherein, in a cross-sectional view, the transistor comprises current paths through channels on opposing sidewalls of the gate electrode and the current paths do not flow along a bottom of the gate electrode.
2. The memory device according to claim 1 , wherein the gate electrode of the transistor is a buried gate structure.
3. The memory device according to claim 2 , wherein the substrate includes a concave portion to form the buried gate structure.
4. The memory device according to claim 1 , wherein the substrate is an SOI substrate.
5. The memory device according to claim 1 , wherein
the memory element is an MTJ element.
6. The memory device according to claim 1 , wherein the first node is disposed on a side of the gate electrode opposite from the second node.
7. The memory device according to claim 1 , wherein current flows through at least one of the bit lines before the transistor, and through the transistor before the memory element.
8. The memory device according to claim 1 , wherein after the current flows through the memory element, the current flows to at least one of the data lines.
9. The memory device according to claim 1 , wherein current flows through the channels prior to any of the plurality of data lines.
10. The memory device according to claim 1 , wherein
the plurality of data lines are parallel to the plurality of bit lines.
11. The memory device according to claim 1 , wherein
the plurality of word lines are wired in a vertical direction and the plurality of bit lines are wired in a lateral direction to intersect with the plurality of word lines.