Arrayed imaging systems having improved alignment and associated methods
Arrayed imaging systems include an array of detectors formed with a common base and a first array of layered optical elements, each one of the layered optical elements being optically connected with a detector in the array of detectors.
1. A method for manufacturing arrayed imaging systems including at least an optics subsystem and an image processor subsystem, both connected with a detector subsystem, the method comprising:
(a) generating, by executing instructions stored on non-transitory computer-readable media, an initial arrayed imaging systems design, including an optics subsystem design, a detector subsystem design and an image processor subsystem design;
(b) testing, by executing instructions stored on non-transitory computer-readable media, at least one of the subsystem designs to determine if the at least one of the subsystem designs conforms within predefined parameters;
if the at least one of the subsystem designs does not conform within the predefined parameters, then:
(c) modifying, by executing instructions stored on non-transitory computer-readable media, the initial arrayed imaging systems design, using a set of potential parameter modifications;
(d) repeating (b) and (c) until the at least one of the subsystem designs conforms within the predefined parameters to yield a modified arrayed imaging systems design;
(e) fabricating the optical, detector and image processor subsystems in accordance with the modified arrayed imaging systems design, fabricating the optical subsystem including forming a first array of templates for first optical elements, in accordance with the optical subsystem design, using at least one of a slow tool servo approach, a fast tool servo approach, a multi-axis milling approach and a multi-axis grinding approach; and
(f) assembling the arrayed imaging systems from the subsystems fabricated in (e).
2. The method of claim 1 , wherein modifying comprises jointly modifying at least two of the optical, detector and image processor subsystem designs.
3. The method of claim 1 , the arrayed imaging systems further including at least an opto-mechanical subsystem connected with at least one of the optics, detector and image processor subsystems, wherein generating the initial arrayed imaging systems design comprises generating an opto-mechanical subsystem design as a part of the initial arrayed imaging systems design.
4. The method of claim 1 , wherein testing the at least one of the subsystems comprises designing a test procedure in accordance with the predefined parameters.
5. The method of claim 1 , further comprising using the first array of templates to form the first optical elements supported on a common base as a portion of the optical subsystem.
6. The method of claim 5 , further comprising:
fabricating a second array of templates for second optical elements, in accordance with the optical system design, and
forming the second optical elements also supported on the common base and in optical communication with the first optical elements.
7. The method of claim 6 , wherein forming the second optical elements comprises layering the second optical elements directly on the first optical elements to form an array of layered optical elements.
8. The method of claim 6 , wherein forming the second optical elements comprises providing a spacer arrangement between the first and second optical elements such that each one of the first and second optical elements are spaced apart from one another.
9. The method of claim 1 , wherein forming the array of templates comprises:
tailoring the optical subsystem design to account for capabilities and limitations of fabrication;
programming the optical subsystem design, so tailored, into fabrication as a fabrication routine; and
running the fabrication routine to yield the array of templates.
10. The method of claim 1 , wherein fabricating the optical, detector and image processor subsystems further comprises:
(e1) testing at least one of the subsystems to determine if the at least one of the subsystems conforms within the predefined parameters; and
(e2) if the at least one of the subsystems does not conform within the predefined parameters, then
(e3) re-fabricating the at least one of the subsystems, and
(e4) repeating (e1) through (e3) until the at least one of the subsystems conforms within the predefined parameters.
11. The method of claim 1 , further comprising:
(g) testing the arrayed imaging systems so assembled to determine whether the arrayed imaging systems conforms to the predetermined parameters; and
if the arrayed imaging systems do not conform within the predefined parameters, then:
(h) repeating (e) through (g) until the arrayed imaging systems conforms within the predefined parameters.
12. The method of claim 1 , the detector subsystem including a plurality of detector pixels, wherein fabricating the detector subsystem further comprises:
forming the plurality of detector pixels by a set of processes, and
forming an optical element within at least one of the detector pixels using at least one of the set of processes, the optical element being configured for affecting electromagnetic energy within that detector pixel over a range of wavelengths.
13. The method of claim 12 , wherein forming the optical element comprises:
generating an optical element design,
testing the optical element design to determine if the optical element design conforms within predefined parameters, if the optical element design does not conform within the predefined parameters, then:
modifying the optical element design, using a set of parameter modifications,
repeating the testing and modifying of the optical element design until the optical element design conforms within the predefined parameters, and
integrating the optical element design into the detector subsystem design.
14. The method of claim 13 , further comprising:
testing the detector subsystem design to determine if the detector subsystem design conforms within the predefined parameters, and
if the detector subsystem design does not conform within the predefined parameters, then
modifying the detector subsystem design, using the set of parameter modifications, and
repeating the testing and modifying of the detector subsystem design until the detector subsystem design conforms within the predefined parameters.
15. The method of claim 1 , wherein testing the at least one of the subsystem designs comprises numerical modeling of the at least one of the subsystem designs.
16. A software product comprising instructions stored on non-transitory computer-readable media, wherein the instructions, when executed by a computer, generate an arrayed imaging systems design, the instructions comprising:
(a) instructions for generating the arrayed imaging systems design, including an optics subsystem design, a detector subsystem design and an image processor subsystem design;
(b) instructions for testing at least one of the optical, detector and image processor subsystem designs to determine if the at least one of the subsystem designs conforms within predefined parameters;
if the at least one of the subsystem designs does not conform within the predefined parameters, then:
(c) instructions for modifying the arrayed imaging systems design, using a set of parameter modifications and including instructions for jointly modifying at least two of the optical, detector and image processor subsystem designs; and
(d) instructions for repeating (b) and (c) until the at least one of the subsystem designs conforms within the predefined parameters to yield the arrayed imaging systems design.