IP Library › Granted Patent US 10,002,838
Granted Patent B2
US 10,002,838 · App. 15/189,893 · Granted Jun 19, 2018

Method and apparatus for back-biased switch transistors

Inventor: Sinan Goktepeli (San Diego, CA)
Assignee: QUALCOMM Incorporated
H01L23/66H01L23/5225H01L27/1464H01L41/09H01L21/76898H01L2224/03002H01L2224/0401H01L2224/11002H01L2224/13022H01L2924/1421
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Quick Facts
Patent No.
US 10,002,838
App. No.
15/189,893
Granted
Jun 19, 2018
Kind
B2
Abstract

An integrated radio frequency (RF) circuit structure may include an active device on a first surface of an isolation layer. The integrated RF circuit structure may also include a back-bias metallization on a second surface opposite the first surface of the isolation layer. A body of the active device is biased by the back-bias metallization. The integrated RF circuit structure may further include a handle substrate on a front-side dielectric layer on the active device.

Claims (33)

1. An integrated radio frequency (RF) circuit structure, comprising:

an active device including a source region, a drain region, and a body between the source region and the drain region on a first surface of an isolation layer;

a back-bias metallization on a second surface opposite the first surface of the isolation layer, the back-bias metallization overlapping the body and at least the source region of the active device, the back-bias metallization configured to bias the body of the active device; and

means for handling the integrated RF circuit structure on a front-side dielectric layer on the active device.

2. The integrated RF circuit structure of claim 1 , further comprising at least one front-side metallization coupled to the active device and arranged in the front-side dielectric layer, the at least one front-side metallization being distal from the back-bias metallization.

3. The integrated RF circuit structure of claim 1 , in which the back-bias metallization comprises a post-layer transfer metallization layer in a backside dielectric layer on the second surface of the isolation layer.

4. The integrated RF circuit structure of claim 1 , further comprising:

an RF enhancement layer on the front-side dielectric layer; and

the means for handling on the RF enhancement layer.

5. The integrated RF circuit structure of claim 1 , in which the body is biased independently or biased to a gate of the active device.

6. The integrated RF circuit structure of claim 1 , in which the active device comprises an RF switch.

7. An integrated radio frequency (RF) circuit structure, comprising:

an active device including a source region, a drain region, and a body between the source region and the drain region on a first surface of an isolation layer;

a back-bias metallization on a second surface opposite the first surface of the isolation layer, the back-bias metallization overlapping the body and at least the source region of the active device, the back-bias metallization configured to bias the body of the active device; and

a handle substrate on a front-side dielectric layer on the active device.

8. The integrated RF circuit structure of claim 7 , further comprising at least one front-side metallization coupled to the active device and arranged in the front-side dielectric layer, the at least one front-side metallization being distal from the back-bias metallization.

9. The integrated RF circuit structure of claim 1 , in which the back-bias metallization comprises a post-layer transfer metallization layer in a backside dielectric layer on the second surface of the isolation layer.

10. The integrated RF circuit structure of claim 7 , further comprising:

an RF enhancement layer between the front-side dielectric layer and the handle substrate.

11. The integrated RF circuit structure of claim 7 , in which the body is biased independently or biased to a gate of the active device.

12. The integrated RF circuit structure of claim 7 , in which the active device is part of an RF switch.

13. An integrated RF circuit structure, comprising:

an active device on a first surface of an isolation layer;

a back-bias metallization on a second surface opposite the first surface of the isolation layer, the back-bias metallization configured to bias a body of the active device, in which the back-bias metallization includes cutaway portions proximate source/drain regions of the active device; and

means for handling the integrated RF circuit structure on a front-side dielectric layer on the active device.

14. The integrated RF circuit structure of claim 1 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer.

15. The integrated RF circuit structure of claim 1 , in which the means for handling includes at least one other active device or passive device.

16. An integrated RF circuit structure of claim 7 , comprising:

an active device on a first surface of an isolation layer;

a back-bias metallization on a second surface opposite the first surface of the isolation layer, the back-bias metallization configured to bias a body of the active device, and in which the back-bias metallization includes cutaway portions proximate source/drain regions of the active device; and

a handle substrate on a front-side dielectric layer on the active device.

17. The integrated RF circuit structure of claim 7 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer.

18. The integrated RF circuit structure of claim 7 , in which the handle substrate includes at least one other active device or passive device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2016
From: GOKTEPELI, SINAN
To: QUALCOMM INCORPORATED
Reel/Frame 039961/0327 →
Continuity (1)
Related Publication 20170373026A1 · Dec 28, 2017