Optical inspection system
Provided is an optical inspection system including a supporting unit, allowing a target object to be loaded thereon, a light source unit configured to emit a laser beam toward the target object, a light condensing unit collecting scattered light that is scattered at the target object when the laser beam is irradiated onto the target object, and a control unit controlling the light source unit and the light condensing unit and analyzing the scattered light to examine whether there are pollutants on the target object. The supporting unit may include a first supporting unit, on which the target object is disposed, and which is formed of a first material, and a second supporting unit, which is disposed under the first supporting unit and is formed of a second material different from the first material.
1. An optical inspection system, comprising:
a supporting unit;
a light source unit configured to emit a laser beam toward a target object on the supporting unit;
a light condensing unit configured to collect scattered light when the target object is irradiated with the laser beam; and
a control unit configured to control the light source unit and the light condensing unit and to analyze the scattered light to determine if pollutants are on the target object,
wherein the supporting unit comprises:
a first supporting member, on which the target object is disposed, and which comprises a first material; and
a second supporting member under the first supporting member, wherein the second supporting member comprises a second material different from the first material,
wherein the first material has a higher light transmittance than the second material, and
wherein the second material has a higher light reflectance than the first material.
2. The system of claim 1 , wherein the light transmittance of the first material is at least 90%.
3. The system of claim 1 , wherein the second material comprises a metal layer-treated to have a mirror effect.
4. The system of claim 1 , wherein the control unit is configured to control a position of the light source unit such that an incidence angle of the laser beam ranges from about 70° to about 80°.
5. The system of claim 1 , wherein the target object comprises a transparent substrate.
6. The system of claim 1 , wherein the first supporting member comprises at least one recessed region having a bottom surface that is lower than a top surface of the first supporting member.
7. The system of claim 6 , wherein an upper portion of the at least one recessed region has a rounded profile.
8. The system of claim 1 , wherein the light source unit further comprises a refraction plate configured to control an irradiation position of the laser beam.
9. The system of claim 1 , wherein the light source unit is configured to generate an s-polarized laser beam.
10. An optical inspection system, comprising:
a supporting unit;
a light source unit configured to emit a laser beam toward a target object on the supporting unit;
a light condensing unit configured to collect scattered light when the target object is irradiated with the laser beam; and
a control unit configured to control the light source unit and the light condensing unit and to analyze the scattered light to determine if pollutants are on the target object,
wherein the supporting unit comprises:
a first supporting member, on which the target object is disposed, and which comprises a first material; and
a second supporting member under the first supporting member, wherein the second supporting member comprises a second material different from the first material,
wherein the first supporting member comprises at least one recessed region extending from a top surface of the first supporting member toward a bottom surface of the first supporting member,
wherein the first material has a higher light transmittance than the second material, and
wherein the second material has a higher light reflectance than the first material.
11. The system of claim 10 , wherein an upper portion of the at least one recessed region has a rounded profile.
12. The system of claim 10 , wherein the first supporting member further comprises at least one protruding region defined by a pair of the recessed regions, the at least one protruding region having a bar-shaped structure.
13. The system of claim 12 , wherein the target object directly contacts the at least one protruding region.
14. The system of claim 10 , wherein a plurality of the recessed regions are spaced apart from each other by a same distance.
15. An optical inspection system, comprising:
a supporting unit;
a light source unit configured to emit a laser beam toward a target object on the supporting unit;
a light condensing unit configured to collect scattered light when the target object is irradiated with the laser beam; and
a control unit configured to control the light source unit and the light condensing unit and to analyze the scattered light to determine if pollutants are on the target object,
wherein the supporting unit is grounded,
wherein the supporting unit comprises first and second supporting members, wherein the target object is on a top surface of the first supporting member, and
wherein the top surface of the first supporting member comprises a metal layer treated to have a mirror effect.
16. The system of claim 15 , wherein the target object comprises a transparent substrate.
17. The system of claim 15 , wherein the first supporting member of the supporting unit is grounded.