IP Library › Granted Patent US 10,006,875
Granted Patent B2
US 10,006,875 · App. 14/990,557 · Granted Jun 26, 2018

Nanotip sensor

Inventors: Grover Larkins (Miami, FL); Yuriy A. Vlasov (Weston, FL)
Assignee: THE FLORIDA INTERNATIONAL UNIVERSITY BOARD OF TRUSTEES
G01N27/045B81C1/00111G01N15/1031G01N15/14G01N27/49G01N33/48707B81B2201/0214B81B2203/0361G01N15/1484G01N2015/1006G01N2015/1087
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,006,875
App. No.
14/990,557
Granted
Jun 26, 2018
Kind
B2
Abstract

Embodiments of a nanotip sensor for detecting and identifying chemical or biological particulates in a sample are disclosed. The nanotip sensor may include a plurality of nanotips, each with a cathode, an anode, and a gap between the cathode and the anode. An adsorbed particulate from the sample may bridge the gap between the cathode and the anode, forming an electrical circuit. A conductive spectrum of the particulates in the sample that are adsorbed onto the nanotips of the sensor may be determined, and by comparing the conductive spectrum of the sample with conductive spectrums of known particulates, one or more specific particulates contained in the sample may be detected and identified. Techniques to augment the specificity of the sensor and to clean the sensor for re-use are disclosed. Embodiments of systems and methods that use the nanotip sensor to detect chemical and biological particulates are disclosed.

Claims (19)

1. A sensor system for detecting particulates in a sample, comprising:

a nanotip sensor array comprising a plurality of nanotip sensors, each nanotip sensor in the nanotip sensor array electrically coupled to a variable voltage source and a current measuring device, and comprising:

a semiconductor layer;

an electrically conductive nanotip formed on, and electrically coupled to, the semiconductor layer and configured as one of an anode or a cathode;

an insulating layer formed on the semiconductor layer and having a gap surrounding the metallic nanotip; and

an electrically conductive surface formed on the insulating layer and having a gap surrounding the metallic nanotip, and configured as the other of the anode or the cathode;

a computing device configured to:

control the variable voltage source, causing the variable voltage source to apply a plurality of voltages across the anode and the cathode;

receive from the current measuring device a measured current value at each of the plurality of voltages to create a current versus voltage (I-V) characteristic for an unidentified particulate bridging the gap between the anode and the cathode; and

compare the I-V characteristic for the unidentified particulate to a plurality of identified particulate I-V profiles stored in a database to determine the identity of the unidentified particulate.

2. The sensor system of claim 1 , further comprising a filter configured to separate the sample from a carrier.

3. The sensor system of claim 1 , further comprising a filter configured to prevent non-targeted particulates from reaching the nanotip sensor array.

4. The sensor system of claim 1 , wherein the nanotip sensor array is self-cleaning.

5. The sensor system of claim 4 , wherein the computing device is configured to control the variable voltage source to increase a magnitude of a voltage applied to the sensor to an ionizing voltage so that any particulates adsorbed to the plurality of nanotip sensors are ionized and desorbed.

6. The sensor system of claim 1 , wherein the sensor system is reusable to analyze more than one sample.

7. The sensor system of claim 1 , wherein each of one or more of the plurality of nanotip sensors is primed with a primer corresponding to a target particulate.

8. The sensor system of claim 7 , wherein the primer is an antibody.

9. The sensor system of claim 1 , further comprising a variable frequency light source arranged to shine light on the sensor, and wherein the computing device is further configured to generate a conductive-photonic response curve by creating a current versus voltage (I-V) characteristic at each of a plurality of different wavelengths of the variable frequency light source.

10. The sensor system of claim 9 , wherein comparing the I-V characteristic for the unidentified particulate to a plurality of identified particulate I-V profiles to determine the identity of the unidentified particulate comprises comparing the conductive-photonic response curves for the unidentified particulate to a plurality of identified particulate conductive-photonic response curves to determine the identity of the unidentified particulate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2016
From: LARKINS, GROVER; VLASOV, YURIY A.
To: THE FLORIDA INTERNATIONAL UNIVERSITY BOARD OF TRUSTEES
Reel/Frame 037659/0505 →
Continuity (2)
Continuation 13101324 · May 5, 2011
Related Publication 20160116426A1 · Apr 28, 2016
Cited By (1)
US 12,313,562