IP Library Granted Patent US 10,006,936
Granted Patent B2
US 10,006,936 · App. 15/601,504 · Granted Jun 26, 2018

Poly(thioaminal) probe based lithography

Inventors: Dylan J. Boday (Tucson, AZ); Jeannette M. Garcia (San Leandro, CA); James L. Hedrick (Pleasanton, CA); Rudy J. Wojtecki (San Jose, CA)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
G01Q80/00C08G12/06C08G12/08C08G14/06C08G16/02C08G16/0237C08G73/0253C08G75/00C08G75/04C08G75/10C08G75/23G03F7/0002
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Quick Facts
Patent No.
US 10,006,936
App. No.
15/601,504
Granted
Jun 26, 2018
Kind
B2
Abstract

Methods and materials for patterning a substrate are disclosed herein. A poly(thioaminal) material may be utilized as a thermal resist material for patterning substrates in a thermal scanning probe lithography process. The poly(thioaminal) material may be functionalized with an electron withdrawing group and various monomers may be volatilized upon exposure to a thermal scanning probe.

Claims (35)

1. A method of patterning a substrate, comprising:

forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol;

disposing the poly(thioaminal) material on a substrate; and

patterning the poly(thioaminal) material with a thermal scanning probe.

2. The method of claim 1 , wherein the poly(thioaminal) material is disposed on the substrate by a spin coating process.

3. The method of claim 1 , wherein the thermal scanning probe contacts the poly(thioaminal) material during the patterning.

4. The method of claim 3 , wherein the thermal scanning probe is maintained at a temperature of greater than about 225° C. during the patterning.

5. The method of claim 4 , wherein monomers of the poly(thioaminal) material are volatilized upon contact with the thermal scanning probe.

6. The method of claim 5 , wherein the monomers are one or more of a dithiol, an electron deficient amine, or combinations and mixtures thereof.

7. The method of claim 1 , wherein a temperature difference between a bulk of the poly(thioaminal) material and the thermal scanning probe is greater than about 200° C.

8. The method of claim 1 , wherein the stabilized imine intermediate is synthesized from an electron deficient amine.

9. The method of claim 1 , further comprising:

etching deprotected regions of the substrate after performing the patterning.

10. A method of patterning a substrate, comprising:

forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol, the poly(thioaminal) material having a CH 2 —N(R′)—CH 2 —S—R—S repeating group, wherein:

each instance of R is selected from the group consisting of alkyl, aryl, and oligomer, and

each instance of R′ is an electron withdrawing group selected from the group consisting of CnF n+1 , CnF n−1 , C 6 H 4 X, and heterocyclyl thereof, and wherein X is selected from the group consisting of Br, Cl, NO 2 CF 3 , F, CO 2 Me CO 2 H, CN, and combinations thereof;

disposing the poly(thioaminal) material on a substrate; and

patterning the poly(thioaminal) material with a thermal scanning probe.

11. The method of claim 10 , wherein each instance of R is an oligomer selected from the group consisting of ether, siloxane, styrene, carbonate, lactide, methacrylate, acrylate, polyolefin, polyester, polyamide, polyamino, and combinations thereof.

12. The method of claim 10 , wherein the thermal scanning probe is maintained at a temperature of greater than about 225° C. during the patterning.

13. The method of claim 12 , wherein a temperature difference between a bulk of the poly(thioaminal) material and the thermal scanning probe is greater than about 200° C.

14. The method of claim 10 , wherein dithiol monomers, electron deficient amines, and combinations thereof are volatilized from the poly(thioaminal) material during the patterning.

15. The method of claim 10 , further comprising:

etching deprotected regions of the substrate after performing the patterning.

16. The method of claim 10 , wherein each instance of R is selected to tune a glass transition temperature of the poly(thioaminal) material.

17. The method of claim 10 , wherein each instance of R includes aromatic substituents, hydroxyl substituents, or combinations thereof.

18. The method of claim 10 , wherein each instance of R is

wherein each W is independently hydrogen or an electron withdrawing group, and Z is selected from the group consisting of CH 2 and C(CF 3 ) 2 .

19. A method of patterning a substrate, comprising:

forming a poly(thioaminal) material by either (a) ring opening of a hexahydrotriazine with a thiol, or (b) reacting a stabilized imine intermediate with a thiol, the poly(thioaminal) material having a S—CH 2 —NH—R—NH—CH 2 repeating group, wherein each instance of R is selected from the group consisting of alkyl, aryl, and oligomer;

disposing the poly(thioaminal) material on a substrate; and

patterning the poly(thioaminal) material with a thermal scanning probe.

20. The method of claim 19 , wherein each instance of R is selected from the group consisting of siloxane, styrene, carbonate, lactide, methacrylate, acrylate, polyamide, polyamino,

and combinations thereof, wherein each W is independently hydrogen or an electron withdrawing group, and Z is selected from the group consisting of CH 2 and C(CF 3 ) 2 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2017
From: BODAY, DYLAN J.; GARCIA, JEANNETTE M.; HEDRICK, JAMES L.; WOJTECKI, RUDY J.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 042458/0413 →
Continuity (2)
Division 14954398 · Nov 30, 2015
Related Publication 20170261534A1 · Sep 14, 2017