IP Library Granted Patent US 10,014,442
Granted Patent B2
US 10,014,442 · App. 14/786,100 · Granted Jul 3, 2018

Method for manufacturing vertical type light emitting diode, vertical type light emitting diode, method for manufacturing ultraviolet ray light emitting diode, and ultraviolet ray light emitting diode

Inventors: Kyoung Kook Kim (Suwon-si, KR); Se Mi Oh (Seoul, KR)
Assignee: Korea Polytechnic University Industry Academic Cooperation Foundation
H01L33/42H01L33/0079H01L33/32H01L33/38H01L33/405H01L33/22H01L2933/0091
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Quick Facts
Patent No.
US 10,014,442
App. No.
14/786,100
Granted
Jul 3, 2018
Kind
B2
Abstract

A vertical type light emitting diode includes a nitride semiconductor having a p-n conjunction structure with a transparent material layer formed on a p type clad layer, the transparent material layer having a refractive index different from that of the p type clad layer and having a pattern structure of mesh, punched plate, or one-dimensional grid form, etc. A reflective metal electrode layer is formed on the transparent material layer as a p-electrode. A stereoscopic pattern is formed in the transparent material layer and the p-electrode deposited, and thereby forming the pattern in the p-electrode. Depositing the p-electrode on only 10 to 70% of the upper portion of the p type clad layer in an ultraviolet ray light emitting diode such that an area where the p type clad layer is exposed is wide increases the transmittance of ultraviolet rays through an area where the p-electrode is not deposited.

Claims (20)

1. A method for manufacturing an ultraviolet light emitting diode based on a nitride semiconductor, the method comprising:

forming a nitride semiconductor layer in which an n-type clad layer, an active layer and a p-type clad layer are sequentially stacked;

forming an n-electrode on the n-type clad layer;

forming a p-electrode on an upper surface of the p-type clad layer such that the p-electrode is deposited on only 3% to 70% of an area of the upper surface of the p-type clad layer; and

forming a bonding pad on the p-electrode,

wherein the p-electrode is formed of one of ITO, ZnO, Ga 2 O 3 , SnO, CuO, Cu 2 O, AgO 2 and AgO,

wherein the p-electrode is formed as a plurality of non-parallel first p-electrode lines extending radially from the bonding pad and a plurality of second p-electrode lines extending across the first p-electrode lines, and

wherein a gap between first p-electrode lines increases radially with increased distance from the bonding pad.

2. The method of claim 1 , wherein a width of a portion of the p-electrode located adjacent to the bonding pad is formed to have a thicker width than that of a portion of the p-electrode located distal to the bonding pad.

3. The method of claim 1 , wherein the composition of materials forming the active layer is adjusted to emit light having a wavelength of 280 to 400 nm.

4. A method for manufacturing an ultraviolet light emitting diode based on a nitride semiconductor, the method comprising:

forming a nitride semiconductor layer in which an n-type clad layer, an active layer and a p-type clad layer are sequentially stacked;

forming an n-electrode on the n-type clad layer;

forming a p-electrode on an upper surface of the p-type clad layer such that the p-electrode is deposited on only 3% to 70% of an area of the upper surface of the p-type clad layer; and

forming a bonding pad on the p-electrode,

wherein the composition of materials forming the active layer is adjusted to emit light having a wavelength of 280 to 400 nm,

wherein the p-electrode is formed as a plurality of non-parallel first p-electrode lines extending radially from the bonding pad and a plurality of second p-electrode lines extending across the first p-electrode lines, and

wherein a gap between first p-electrode lines increases radially with increased distance from the bonding pad.

5. The method of claim 4 , wherein the p-electrode is formed of one of ITO, ZnO, Ga 2 O 3 , SnO, CuO, Cu 2 O, AgO 2 and AgO.

6. The method of claim 4 , wherein a width of a portion of the p-electrode located adjacent to the bonding pad is formed to have a thicker width than that of a portion of the p-electrode located distal to the bonding pad.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2026
From: TECH UNIVERSITY OF KOREA INDUSTRY ACADEMIC COOPERATION FOUNDATION
To: BLESSED PEOPLE CO., LTD.
Reel/Frame 074245/0242 →
CHANGE OF NAME Recorded Jul 18, 2022
From: KOREA POLYTECHNIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
To: TECH UNIVERSITY OF KOREA INDUSTRY ACADEMIC COOPERATION FOUNDATION
Reel/Frame 060680/0437 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2015
From: KIM, KYOUNG KOOK; OH, SE MI
To: KOREA POLYTECHNIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
Reel/Frame 036848/0977 →
Priority Claims (2)
KR 10-2013-0043944 · Apr 22, 2013 · national
KR 10-2013-0050633 · May 6, 2013 · national
Continuity (1)
Related Publication 20160099385A1 · Apr 7, 2016
Cited By (2)
US 12,249,673 US 12,364,077