IP Library Granted Patent US 10,032,750
Granted Patent B2
US 10,032,750 · App. 15/196,884 · Granted Jul 24, 2018

Integrated DC-DC power converters through face-to-face bonding

Inventors: Hariklia Deligianni (Alpine, NJ); Devendra K. Sadana (Pleasantville, NY); Edmund J. Sprogis (Myrtle Beach, SC); Naigang Wang (Ossining, NY)
Assignee: International Business Machines Corporation
H01L25/0657H01L21/4853H01L21/8238H01L27/092H01L28/10H01L2225/06513H01L2225/06541
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Quick Facts
Patent No.
US 10,032,750
App. No.
15/196,884
Granted
Jul 24, 2018
Kind
B2
Abstract

DC-DC power converters with GaN switches, magnetic inductors and CMOS power drivers integrated through face-to-face wafer bonding techniques are provided. In one aspect, an integrated DC-DC power converter includes: a Si CMOS chip having at least one Si CMOS transistor formed thereon; a GaN switch chip, bonded to the Si CMOS chip in a face-to-face manner, having at least one GaN transistor formed thereon; and an on-chip magnetic inductor present either on the Si CMOS chip or on the GaN switch chip. A method of forming an integrated DC-DC power converter is also provided.

Claims (39)

1. An integrated DC-DC power converter, comprising:

a silicon complementary metal-oxide semiconductor (Si CMOS) chip comprising at least one Si CMOS transistor formed thereon and a first dielectric on a front of the Si CMOS chip covering the at least one Si CMOS transistor;

a gallium nitride (GaN) switch chip comprising at least one GaN transistor formed thereon and a second dielectric on a front of the GaN switch chip covering the at least one GaN transistor, wherein the GaN switch chip is bonded to the Si CMOS chip with the front of the GaN switch chip facing the front of the Si CMOS chip; and

an on-chip magnetic inductor present either on the Si CMOS chip or on the GaN switch chip in between the front of the GaN switch chip and the front of the Si CMOS chip.

2. The integrated DC-DC power converter of claim 1 , wherein the GaN switch chip is bonded to the Si CMOS chip via a solder bond, wherein the solder bond creates a space between the front of the GaN switch chip and the front of the Si CMOS chip, and wherein the on-chip magnetic inductor is present within the space.

3. The integrated DC-DC power converter of claim 1 , wherein the on-chip magnetic inductor is present on the Si CMOS chip.

4. The integrated DC-DC power converter of claim 3 , wherein the on-chip magnetic inductor is present on the front of the Si CMOS chip.

5. The integrated DC-DC power converter of claim 1 , wherein the on-chip magnetic inductor is present on the GaN switch chip.

6. The integrated DC-DC power converter of claim 5 , wherein the on-chip magnetic inductor is present on the front of the GaN switch chip.

7. The integrated DC-DC power converter of claim 1 , wherein the Si CMOS chip further comprises a first set of bond pads, and wherein the GaN switch chip comprises a second set of bond pads.

8. The integrated DC-DC power converter of claim 7 , wherein the Si CMOS chip further comprises:

a substrate on which the at least one Si CMOS transistor is formed;

the first dielectric on the substrate covering the at least one Si CMOS transistor; and

a metal wiring in the first dielectric connecting the at least one Si CMOS transistor with the first set of bond pads.

9. The integrated DC-DC power converter of claim 7 , wherein the GaN switch chip further comprises:

a substrate;

an active layer on the substrate on which the at least one GaN transistor is formed;

the second dielectric over the at least one GaN transistor; and

an interconnect metal wiring in the second dielectric that connects the at least one GaN transistor to the second set of bond pads.

10. The integrated DC-DC power converter of claim 9 , wherein the active layer comprises a first active material on the substrate, and a second active material on the first active material.

11. The integrated DC-DC power converter of claim 10 , wherein the first active material comprises GaN, and wherein the second active material has a higher band gap than the first active material.

12. The integrated DC-DC power converter of claim 11 , wherein the second active material comprises aluminum-gallium-nitride (AlGaN).

13. The integrated DC-DC power converter of claim 1 , further comprising:

a chip package, wherein the chip package has a cavity in which the GaN switch chip or the Si CMOS chip is positioned.

14. The integrated DC-DC power converter of claim 8 , wherein the on-chip magnetic inductor is present on the front of the Si CMOS chip, and wherein the metal wiring in the first dielectric connects the at least one Si CMOS transistor to the on-chip magnetic inductor.

15. The integrated DC-DC power converter of claim 9 , wherein the on-chip magnetic inductor is present on the front of the GaN switch chip, and wherein the interconnect metal wiring in the second dielectric connects the at least one GaN transistor to the on-chip magnetic inductor.

16. A method of forming an integrated DC-DC power converter, the method comprising:

forming at least one Si CMOS transistor on an Si CMOS chip;

depositing a first dielectric on a front of the Si CMOS chip covering the at least one Si CMOS transistor;

forming at least one GaN transistor on a GaN switch chip;

depositing a second dielectric on a front of the GaN switch chip covering the at least one GaN transistor;

forming an on-chip magnetic inductor on either the Si CMOS chip or on the GaN switch chip; and

bonding the Si CMOS chip to the GaN switch chip with the front of the GaN switch chip facing the front of the Si CMOS chip, wherein the on-chip magnetic inductor is present in between the front of the GaN switch chip and the front of the Si CMOS chip.

17. The method of claim 16 , further comprising:

forming the on-chip magnetic inductor on the front of the Si CMOS chip.

18. The method of claim 16 , further comprising:

forming the on-chip magnetic inductor on the front of the GaN switch chip.

19. The method of claim 16 , further comprising:

bonding the Si CMOS chip to the GaN switch chip via a solder bond which creates a space between the front of the GaN switch chip and the front of the Si CMOS chip, and wherein the on-chip magnetic inductor is present within the space.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2016
From: DELIGIANNI, HARIKLIA; SADANA, DEVENDRA K.; SPROGIS, EDMUND J.; WANG, NAIGANG
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 039044/0214 →
Continuity (1)
Related Publication 20180005988A1 · Jan 4, 2018
Cited By (2)
US 12,334,430 US 12,593,488