IP Library › Granted Patent US 10,043,652
Granted Patent B2
US 10,043,652 · App. 14/539,206 · Granted Aug 7, 2018

Substrate cleaning method, substrate cleaning system, and memory medium

Inventors: Miyako Kaneko (Nirasaki, JP); Keiji Tanouchi (Nirasaki, JP); Takehiko Orii (Nirasaki, JP); Itaru Kanno (Minato-ku, JP)
Assignee: TOKYO ELECTRON LIMITED
H01L21/02041B08B7/0014C11D11/0047H01L21/67051
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Quick Facts
Patent No.
US 10,043,652
App. No.
14/539,206
Granted
Aug 7, 2018
Kind
B2
Abstract

A method for cleaning a substrate, includes supplying to a substrate having a hydrophilic surface a film-forming processing liquid which includes a volatile component and forms a film on the substrate, vaporizing the volatile component in the film-forming processing liquid such that the film-forming processing liquid solidifies or cures on the substrate and forms a processing film on the hydrophilic surface of the substrate, and supplying to the substrate having the processing film a strip-processing liquid for stripping the processing film from the substrate.

Claims (28)

1. A method for cleaning a substrate, comprising:

supplying to a substrate having a hydrophilic surface a film-forming processing liquid which includes a volatile component;

vaporizing the volatile component in the film-forming processing liquid such that the film-forming processing liquid solidifies or cure on the substrate and forms on the hydrophilic surface of the substrate a processing film that captures and contains particles on the hydrophilic surface of the substrate;

supplying to the substrate having the processing film a strip-processing liquid which strips the processing film containing the particles from the hydrophilic surface of the substrate, wherein the strip-processing liquid separates the processing film from the hydrophilic surface by infiltrating between the processing film and the hydrophilic surface; and

when the processing film is separated from the hydrophilic surface and located above the hydrophilic surface, supplying to the processing film a dissolving-processing liquid which dissolves the processing film stripped by the strip-processing liquid such that the dissolving-processing liquid dissolves the processing film stripped by the strip-processing liquid,

wherein the substrate is one of a silicon wafer and a compound semiconductor wafer and wherein the film-forming processing liquid is a topcoat solution comprising resin and the volatile component,

wherein the dissolving-processing liquid is selected from the group consisting of an alkali developing solution having a first alkali concentration that dissolves the processing film into a liquid state, an isopropyl alcohol (IPA) and water solution having a first IPA concentration that dissolves the processing film into a liquid state, 4-methyl-2-pentanol, toluene, a glycol, an acetic acid solution, a formic acid solution, and a hydroxyacetic acid solution, and

wherein the strip-processing liquid is selected from the group consisting of pure water, an alkali developing solution having a second alkali concentration that is lower than the first alkali concentration, an IPA and water solution having a second IPA concentration that is lower than the first IPA concentration, and water mixed with CO 2 gas.

2. The method for cleaning a substrate according to claim 1 , wherein the strip-processing liquid is pure water.

3. The method for cleaning a substrate according to claim 1 , further comprising:

applying hydrophilic treatment to a surface of the substrate such that the hydrophilic surface of the substrate is formed prior to the supplying of the film-forming processing liquid.

4. The method for cleaning a substrate according to claim 1 , wherein the supplying of the film-forming processing liquid comprises supplying the film forming processing liquid to the substrate without a resist layer on the substrate.

5. The method for cleaning a substrate according to claim 1 , wherein the hydrophilic surface of the substrate has a pattern formed on the hydrophilic surface of the substrate, and the supplying of the film-forming processing liquid comprises supplying the film-forming processing liquid to the hydrophilic surface having the pattern.

6. The method for cleaning a substrate according to claim 2 , further comprising:

applying hydrophilic treatment to a surface of the substrate such that the hydrophilic surface of the substrate is formed prior to the supplying of the film-forming processing liquid.

7. The method for cleaning a substrate according to claim 2 , wherein the supplying of the film-forming processing liquid comprises supplying the film-forming processing liquid to the substrate without a resist layer on the substrate.

8. The method for cleaning a substrate according to claim 2 , wherein the hydrophilic surface of the substrate has a pattern formed on the hydrophilic surface of the substrate, and the supplying of the film-forming processing liquid comprises supplying the film-forming processing liquid to the hydrophilic surface having the pattern.

9. The method for cleaning a substrate according to claim 1 , further comprising:

applying hydrophilic treatment to a surface of the substrate such that the hydrophilic surface of the substrate is formed prior to the supplying of the film-forming processing liquid,

wherein the hydrophilic treatment comprises treating the surface of the substrate with ozone water.

10. The method for cleaning a substrate according to claim 1 ,

wherein the dissolving-processing liquid is an alkali developing solution having a concentration of 1.0% or higher.

11. The method for cleaning a substrate according to claim 1 , further comprising:

supplying a rinsing-treatment liquid after the processing film is dissolved by the dissolving-processing liquid such that the rinsing-treatment liquid rinses off the particles and the dissolving-processing liquid from the substrate.

12. The method for cleaning a substrate according to claim 1 , wherein the strip-processing liquid is the diluted isopropyl alcohol, and the dissolving-processing liquid is a second isopropyl alcohol solution having a concentration that is higher than a concentration of the diluted isopropyl alcohol.

13. The method for cleaning a substrate according to claim 1 , wherein the strip-processing liquid is an alkali developing solution having a concentration of 0.5% or less, and the dissolving-processing liquid is an alkali developing solution having a concentration of 1.0% or higher.

14. The method for cleaning a substrate according to claim 1 , wherein the resin in the topcoat solution comprises acrylic resin.

15. The method for cleaning a substrate according to claim 1 , wherein the particles have particle diameters of 100 nm or less, and the hydrophilic surface is a patterned surface.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2014
From: KANEKO, MIYAKO; TANOUCHI, KEIJI; ORII, TAKEHIKO; KANNO, ITARU
To: TOKYO ELECTRON LIMITED
Reel/Frame 034157/0520 →
Priority Claims (1)
JP 2013-234897 · Nov 13, 2013 · national
Continuity (1)
Related Publication 20150128995A1 · May 14, 2015
Cited By (1)
US 12,551,935