IP Library Granted Patent US 10,049,865
Granted Patent B2
US 10,049,865 · App. 14/703,868 · Granted Aug 14, 2018

Intelligently controlled spectrometer methods and apparatus

Inventors: Mark A Osgood (Brookline, NH); Ching Wu (Boxborough, MA)
Assignee: Excellims Corporation
H01J49/004C07B63/00G01N27/622H01J49/0027H01J49/0031H01J49/0495H01J49/067
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Quick Facts
Patent No.
US 10,049,865
App. No.
14/703,868
Granted
Aug 14, 2018
Kind
B2
Abstract

The present invention relates to improving the ability of a hyphenated instrument to analyze a sample benefiting from having the first instrument's analysis of the same sample. A fast switching mechanism can be used as the interface between an ion mobility spectrometer (IMS) and a mass spectrometer (MS) such that the obtained IMS spectrum is converted into a timing diagram that controls the vacuum inlet's size dynamically during analysis of a neutral and/or charged chemical and/or biological species such that a smaller pumping system can be used.

Claims (20)

1. A method for operating a hyphenated ion mobility spectrometer—mass spectrometer comprising:

a. ionizing a sample to produce an ion beam containing sample ions;

b. separating the sample ions based on ion mobility to create an ion mobility separated ion beam;

c. splitting the ion mobility separated ion beam such that an ion detector of the ion mobility spectrometer receives a first continuous uninterrupted portion of the ion beam, and an inlet of the mass spectrometer receives a second continuous uninterrupted portion of the ion beam;

d. measuring a first signal from the first portion of the ion beam using the ion detector of the ion mobility spectrometer;

e. measuring a second signal from the second portion of the ion beam using the mass spectrometer.

2. The method in claim 1 , wherein the ion detector of the ion mobility spectrometer is either at the ambient pressure or vacuum pressure.

3. The method in claim 1 , wherein the ion detector of the ion mobility spectrometer is outside a vacuum inlet of the mass spectrometer.

4. The method in claim 1 , wherein the first signal and the second signal are measured simultaneously.

5. The method in claim 1 , wherein the first signal of ion mobility measurement and the second signal of mass measurement are correlated.

6. A hyphenated ion mobility spectrometer mass—spectrometer instrument comprising:

a. an ion source that ionizes a sample to produce an ion beam containing sample ions;

b. an ion mobility spectrometer that separates the sample ions based on ion mobility to create an ion mobility separated ion beam;

c. a first detector that measures a first signal from a first continuous uninterrupted portion of the ion mobility separated ion beam while at the same time allowing a second continuous uninterrupted portion of the ion mobility separated ion beam into an inlet of a mass spectrometer.

7. The instrument in claim 6 , wherein the first detector is either at the ambient pressure or vacuum pressure.

8. The instrument in claim 6 , wherein the first detector is outside a vacuum inlet of the mass spectrometer.

9. The method of claim 1 , wherein the ion detector of the ion mobility spectrometer is a Faraday plate.

10. The method of claim 9 , where the Faraday plate has a hole that allows a portion of the ion beam to pass through the Faraday plate.

11. The instrument of claim 6 , wherein the ion detector of the ion mobility spectrometer is a Faraday plate.

12. The instrument of claim 11 , where the Faraday plate has a hole that allows a portion of the ion beam to pass through the Faraday plate.

Continuity (4)
Continuation 12764808 · Apr 21, 2010
Continuation In Part 11776392 · Jul 11, 2007
Provisional Application 61171447 · Apr 21, 2009
Related Publication 20150303043A1 · Oct 22, 2015