X-ray inspection apparatus and control method
An X-ray inspection apparatus includes a 3D processing unit that performs 3D imaging of a first area in an inspection area, a 2D processing unit that performs 2D imaging of a second area in the inspection area, an extraction unit that extracts 3D information for a first inspection target from a 3D image of the first area, and 2D information for a second inspection target from a 2D image of the second area, a 3D information estimation unit that estimates 3D information for the second inspection target using the extracted 3D information for the first inspection target, and an inspection unit that inspects the second inspection target using the 2D information for the second inspection target and the estimated 3D information for the second inspection target.
1. An X-ray inspection apparatus for inspecting a workpiece including a plurality of inspection targets, the apparatus comprising:
a 3D processing unit configured to perform 3D imaging for capturing a 3D image of a first area through multiple X-ray irradiations, the first area being a part of an inspection area defined for the workpiece;
a 2D processing unit configured to perform 2D imaging for capturing a 2D image of a second area through a single X-ray irradiation, the second area being a part of the inspection area and being different from the first area;
an extraction unit configured to extract 3D information for a first inspection target included in the first area from the 3D image of the first area captured through the 3D imaging, and to extract 2D information for a second inspection target included in the second area from the 2D image of the second area captured through the 2D imaging;
a 3D information estimation unit configured to estimate 3D information for the second inspection target using the 3D information for the first inspection target extracted by the extraction unit; and
an inspection unit configured to inspect the second inspection target using the 2D information for the second inspection target extracted by the extraction unit and the 3D information for the second inspection target estimated by the 3D information estimation unit.
2. The X-ray inspection apparatus according to claim 1 , wherein
the first area includes a plurality of first inspection targets, and
the 3D information estimation unit calculates the 3D information for the second inspection target through interpolation or extrapolation using the 3D information for the plurality of first inspection targets.
3. The X-ray inspection apparatus according to claim 2 , wherein
when an XYZ coordinate system is defined to have an XY-plane orthogonal to a direction of X-ray irradiation in the 2D imaging,
the extraction unit extracts an XY-position and a Z-direction height of each of the plurality of first inspection targets from the 3D image of the first area, and extracts an XY-position of the second inspection target from the 2D image of the second area, and
the 3D information estimation unit calculates a Z-direction height of the second inspection target at the XY-position through interpolation or extrapolation using the Z-direction height of each of the plurality of first inspection targets.
4. The X-ray inspection apparatus according to claim 2 , wherein
when an XYZ coordinate system is defined to have an XY-plane orthogonal to a direction of X-ray irradiation in the 2D imaging,
the extraction unit extracts an XY-position and volumetric information of each of the plurality of first inspection targets from the 3D image of the first area, and extracts an XY-position of the second inspection target from the 2D image of the second area, and
the 3D information estimation unit calculates volumetric information of the second inspection target at the XY-position through interpolation or extrapolation using the volumetric information of each of the plurality of first inspection targets.
5. The X-ray inspection apparatus according to claim 2 , wherein
when an XYZ coordinate system is defined to have an XY-plane orthogonal to a direction of X-ray irradiation in the 2D imaging,
the extraction unit extracts an XY-position of each of the plurality of first inspection targets from the 3D image of the first area, and
the 3D information estimation unit calculates a predicted XY-positon of the second inspection target through interpolation or extrapolation using the XY-position of each of the plurality of first inspection targets.
6. The X-ray inspection apparatus according to claim 2 , wherein
when an XYZ coordinate system is defined to have an XY-plane orthogonal to a direction of X-ray irradiation in the 2D imaging, and the workpiece has a first end and a second end in Z-direction,
the extraction unit extracts XYZ-positions of a first end and a second end of each of the plurality of first inspection targets from the 3D image of the first area,
the 3D information estimation unit calculates a predicted XYZ-position of a first end of the second inspection target through interpolation or extrapolation using the XYZ-position of the first end of each of the plurality of first inspection targets, and calculates a predicted XYZ-position of the second end of the second inspection target through interpolation or extrapolation using the XYZ-position of the second end of each of the plurality of the first inspection targets.
7. The X-ray inspection apparatus according to claim 6 , wherein
the 3D information estimation unit calculates a deviation between the first end and the second end of the second inspection target in the XY-plane using the predicted XYZ-position of the first end and the predicted XYZ-position of the second end.
8. The X-ray inspection apparatus according to claim 6 , wherein
the 3D information estimation unit calculates a predicted XY-positon of the second inspection target by calculating an average of the predicted XYZ-position of the first end and the predicted XYZ-position of the second end.
9. The X-ray inspection apparatus according to claim 5 , wherein
the extraction unit extracts an actual XY-position of the second inspection target from the 2D image of the second area, and
the inspection unit compares the actual XY-position of the second inspection target extracted by the extraction unit with the predicted XY-position of the second inspection target estimated by the 3D information estimation unit to determine whether the second inspection target is defective.
10. The X-ray inspection apparatus according to claim 7 , wherein
the extraction unit extracts a distance between the second inspection target and an inspection target adjacent to the second inspection target from the 2D image of the second area, and
the inspection unit determines whether the second inspection target is defective using the distance extracted by the extraction unit and the deviation between the first end and the second end of the second inspection target in the XY-plane estimated by the 3D information estimation unit.
11. The X-ray inspection apparatus according to claim 7 , wherein
the extraction unit extracts an actual circularity of the second inspection target from the 2D image of the second area, and
the inspection unit estimates a circularity of the second inspection target using the deviation between the first end and the second end of the second inspection target in the XY-plane, and compares the estimated circularity with the actual circularity of the second inspection target extracted by the extraction unit to determine whether the second inspection target is defective.
12. The X-ray inspection apparatus according to claim 2 , wherein
when an XYZ coordinate system is defined to have an XY-plane orthogonal to a direction of X-ray irradiation in the 2D imaging,
the extraction unit extracts an XY-position, a Z-direction height, and volumetric information of each of the plurality of first inspection targets from the 3D image of the first area, and extracts an XY-position and a surface area of the second inspection target from the 2D image of the second area,
the 3D information estimation unit calculates a Z-direction height and volumetric information of the second inspection target at the XY-position through interpolation or extrapolation using the Z-direction height and the volumetric information of each of the plurality of first inspection targets, and
the inspection unit compares the volumetric information of the second inspection target calculated from the surface area of the second inspection target extracted by the extraction unit and the Z-direction height of the second inspection target estimated by the 3D information estimation unit with the volumetric information of the second inspection target estimated by the 3D information estimation unit to determine whether the second inspection target is defective.
13. The X-ray inspection apparatus according to claim 1 , wherein
the workpiece is an electronic component, and each inspection target is a solder piece for joining the electronic component and a circuit board.
14. A method for controlling an X-ray inspection apparatus that inspects a workpiece including a plurality of inspection targets using X-rays, the method comprising:
performing 3D imaging for capturing a 3D image of a first area through multiple X-ray irradiations, the first area being a part of an inspection area defined for the workpiece;
performing 2D imaging for capturing a 2D image of a second area through a single X-ray irradiation, the second area being a part of the inspection area and being different from the first area;
extracting 3D information for a first inspection target included in the first area from the 3D image of the first area captured through the 3D imaging; and
extracting 2D information for a second inspection target included in the second area from the 2D image of the second area captured through the 2D imaging;
estimating 3D information for the second inspection target using the extracted 3D information for the first inspection target; and
inspecting the second inspection target using the extracted 2D information for the second inspection target and the estimated 3D information for the second inspection target.
15. A non-transitory computer-readable recording medium storing a program causing a processor included in an X-ray inspection apparatus to implement the method for controlling an X-ray inspection apparatus according to claim 14 .