Metrology methods, metrology apparatus and device manufacturing method
A lithographic manufacturing system produces periodic structures with feature sizes less than 10 nm and a direction of periodicity (D). A beam of radiation ( 1904 ) having a range of wavelengths in the EUV spectrum (1-100 nm or 1-150 nm) is focused into a spot (S) of around 5 μm diameter. Reflected radiation ( 1908 ) is broken into a spectrum ( 1910 ) which is captured ( 1913 ) to obtain a target spectrum signal (ST). A reference spectrum is detected ( 1914 ) to obtain a reference spectrum signal (SR). Optionally a detector ( 1950 ) is provided to obtain a further spectrum signal (SF) using radiation diffracted at first order by the grating structure of the target. The angle of incidence (α) and azimuthal angle (φ) are adjustable. The signals (ST, SR, SF) obtained at one or more angles are used to calculate measured properties of the target, for example CD and overlay.
1. A method of measuring a property of a structure manufactured by a lithographic process, the method comprising:
irradiating a periodic structure with a beam of radiation along an irradiation direction, the periodic structure having been formed by said lithographic process on a substrate and having a periodicity in at least a first direction, the radiation comprising a plurality of wavelengths in the range of 1-100 nm, the irradiation direction being greater than 2° from a direction parallel to the substrate, wherein the beam of radiation has a spot size of less than 10 μm on the substrate;
detecting a spectrum of radiation reflected by the periodic structure, and
processing signals representing the detected spectrum to determine a property of the periodic structure.
2. The method as claimed in claim 1 , wherein the irradiation direction relative to a direction parallel to the substrate is adjusted prior to detecting said spectrum and a diameter of the beam of radiation is adjusted correspondingly to adjust the extent of beam when projected onto the periodic structure.
3. The method as claimed in claim 1 , wherein an illumination system used to generate the beam of radiation is housed in a vacuum environment and the substrate is held in a low-pressure gaseous environment, the low-pressure gaseous environment being defined by a housing that is openable to load and unload new substrates without disturbing the vacuum environment of the illumination system.
4. The method as claimed in claim 1 , wherein a detection system used to detect the spectrum of the reflected radiation is housed in a vacuum environment and the substrate is held in a low-pressure gaseous environment, the low-pressure gaseous environment being defined by a housing that is openable to load and unload new substrates without disturbing the vacuum environment of the detection system.
5. The method as claimed in claim 1 , wherein the irradiation direction defines a non-zero azimuthal angle relative to the first direction, when projected onto a plane of the substrate.
6. The method as claimed in claim 1 , wherein the detecting further comprises detecting a non-zero diffraction order of radiation diffracted by the periodic structure, the non-zero diffraction order being spread into a spectrum by the periodic structure.
7. The method as claimed in claim 1 , wherein said property is asymmetry.
8. The method as claimed in claim 6 , wherein:
the irradiating and the detecting are performed at least twice, with the periodic structure rotated 0° and 180° about a normal axis, and
during the processing signals representing the spectrum of the non-zero diffraction order under 0° and 180° rotation are used together to determine asymmetry of the periodic structure.
9. The method as claimed in claim 1 , wherein:
the irradiating and the detecting are repeated using different irradiation directions; and
the processing comprises processing signals representing the spectrum of reflected radiation detected using a plurality of different irradiation angles to determine the property of the periodic structure.
10. The method as claimed in claim 1 , wherein the processing includes defining a parameterized model of the periodic structure and using the model to perform mathematical reconstruction of the structure based on the detected reflected radiation.
11. A metrology apparatus for use in measuring performance of a lithographic process, the apparatus comprising:
an irradiation system configured to generate a beam of radiation, the radiation comprising a plurality of wavelengths in the range of 1-100 nm;
a substrate support configured to support a substrate and operable with the irradiation system to irradiate a periodic structure formed on the substrate with the beam of radiation along an irradiation direction, the irradiation direction being greater than 2° from a direction parallel to the substrate, wherein the beam of radiation has a spot size of less than 10 μm on the substrate; and
a detection system configured to detect a spectrum of radiation reflected by the periodic structure.
12. The apparatus as claimed in claim 11 , wherein the irradiation direction relative to a direction parallel to the substrate is adjustable and a diameter of the beam of radiation is adjustable correspondingly to adjust the extent of beam when projected onto the periodic structure.
13. The apparatus as claimed in claim 11 , wherein an illumination system used to generate the beam of radiation is housed in a vacuum environment and the substrate is held in a low-pressure gaseous environment, the low-pressure gaseous environment being defined by a housing that is openable to load and unload new substrates without disturbing the vacuum environment of the illumination system.
14. The apparatus as claimed in claim 11 , wherein a detection system used to detect the spectrum of the reflected radiation is housed in a vacuum environment and the substrate is held in a low-pressure gaseous environment, the low-pressure gaseous environment being defined by a housing that is openable to load and unload new substrates without disturbing the vacuum environment of the detection system.
15. The apparatus as claimed in claim 11 , wherein the irradiation direction defines a non-zero azimuthal angle relative to the first direction, when projected onto a plane of the substrate, and the azimuthal angle is adjustable without demounting the substrate.
16. The apparatus as claimed in claim 11 , further comprising a detector configured to detect a non-zero diffraction order of radiation diffracted by the periodic structure, the non-zero diffraction order being spread into a spectrum by the periodic structure.
17. The apparatus as claimed in claim 11 , wherein the substrate support is adapted to receive semiconductor wafers from an automated wafer handler.
18. The apparatus as claimed in claim 11 , further comprising a processing system configured to process signals representing the detected reflected radiation to determine a property of the periodic structure.
19. A device manufacturing method comprising:
transferring a pattern from a patterning device onto a substrate using a lithographic process, the pattern defining at least one periodic structure;
measuring one or more properties of the periodic structure to determine a value for one or more parameters of the lithographic process; and
applying a correction in subsequent operations of the lithographic process in accordance with the measured property,
wherein the step of measuring the properties of the periodic structure includes measuring a property by a method comprising:
irradiating a periodic structure with a beam of radiation along an irradiation direction, the periodic structure having been formed by said lithographic process on a substrate and having a periodicity in at least a first direction, the radiation comprising a plurality of wavelengths in the range of 1-100 nm, the irradiation direction being greater than 2° from a direction parallel to the substrate, wherein the beam of radiation has a spot size of less than 10 μm on the substrate;
detecting a spectrum of radiation reflected by the periodic structure, and
processing signals representing the detected spectrum to determine a property of the periodic structure.
20. A method of measuring a property of a structure manufactured by a lithographic process, the method comprising:
irradiating a periodic structure with a beam of radiation along an irradiation direction, the periodic structure having been formed by said lithographic process on a substrate and having a periodicity in at least a first direction, the radiation comprising a plurality of wavelengths in the range of 1-100 nm, the irradiation direction being greater than 2° from a direction parallel to the substrate, wherein the beam of radiation has a spot size of less than 10 μm on the substrate;
detecting a spectrum of radiation diffracted by the periodic structure, wherein a non-zero diffraction order of the radiation is spread into said spectrum by the periodic structure; and,
processing signals representing the detected spectrum to determine a property of the periodic structure.
21. The method as claimed in claim 1 , wherein the beam of radiation has a spot size of less than 5 μm on the substrate.
22. The apparatus as claimed in claim 11 , wherein the beam of radiation has a spot size of less than 5 μm on the substrate.