Calibration circuit and calibration apparatus including the same
A calibration circuit sharing a resistor for impedance matching includes a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; a selector configured to select one of the calibration enable signal and a start signal according to a select signal, and provide a driving signal; and a calibration driver configured to perform an impedance matching operation in response to the driving signal, and generate a completion signal when performance is completed, wherein the start signal corresponds to a completion signal provided from another calibration circuit which shares the resistor for the impedance matching.
1. A semiconductor device comprising:
a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; and
a calibration driver configured to, based on the calibration enable signal, perform an impedance matching operation by using a resistor for impedance matching, generate a completion signal when performance is completed, and transmit the completion signal to another semiconductor device which shares the resistor for the impedance matching.
2. The semiconductor device according to claim 1 , further comprising:
a terminal for receiving an input signal; and
a selector configured to receive the calibration enable signal and the input signal and provide the calibration enable signal for the calibration driver.
3. A semiconductor device comprising:
a terminal configured to receive a first completion signal provided from another semiconductor device which shares a resistor for impedance matching; and
a calibration driver configured to, based on the first completion signal, perform an impedance matching operation by using the resistor for the impedance matching, generate a second completion signal when performance is completed, and transmit the second completion signal to yet another semiconductor device which shares the resistor for the impedance matching.
4. The semiconductor device according to claim 3 , further comprising:
a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; and
a selector configured to receive the calibration enable signal and the first completion signal and provide the first completion signal for the calibration driver.
5. A semiconductor device comprising:
a terminal configured to receive a completion signal provided from another semiconductor device which shares a resistor for impedance matching; and
a calibration driver configured to, based on the completion signal, perform an impedance matching operation by using the resistor for the impedance matching.
6. The semiconductor device according to claim 5 , further comprising:
a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; and
a selector configured to receive the calibration enable signal and the completion signal and provide the completion signal for the calibration driver.
7. A system comprising:
a first semiconductor device including:
a first calibration driver configured to, based on a first calibration enable signal, perform an impedance matching operation according to a resistor for impedance matching, and
a signal generator configured to generate a completion signal when performance is completed; and
a second semiconductor device configured to share the resistor for the impedance matching with the first semiconductor device, and including a second calibration driver configured to perform an impedance matching operation based on the completion signal.
8. The semiconductor device according to claim 7 , wherein at least one of the first semiconductor device and the second semiconductor device includes a volatile memory.
9. The semiconductor device according to claim 7 , wherein at least one of the first semiconductor device and the second semiconductor device includes a non-volatile memory.
10. The semiconductor device according to claim 7 , wherein the semiconductor device is a memory module.
11. The semiconductor device according to claim 7 , wherein the second semiconductor device further comprises:
a command decoder configured to receive the command signal and decode the command signal into a second calibration enable signal; and
a selector configured to select the first completion signal between the first completion signal and the second calibration enable signal according to a select signal, and provide a driving signal,
wherein the second calibration driver is configured to perform the impedance matching operation according to the driving signal.
12. A system comprising:
a plurality of semiconductor devices configured to share a resistor for impedance matching and be coupled to have a chain shape,
wherein each semiconductor device comprises:
a calibration driver configured to perform an impedance matching operation using the resistor for the impedance matching, and
a signal generator configured to generate a completion signal when the performance is completed, and
wherein each semiconductor device is configured to perform the impedance matching operation based on the completion signal received from at least one of other coupled semiconductor devices.
13. The system according to claim 12 , wherein each semiconductor device further comprises:
a command decoder configured to receive a command signal and generate a calibration enable signal; and
a selector configured to select the completion signal between the completion signal and the calibration enable signal according to a select signal, and provide a driving signal,
wherein the calibration driver is configured to perform the impedance matching operation according to the driving signal.
14. The system according to claim 12 , wherein the semiconductor devices sequentially perform the impedance matching operation according to the chain shape.
15. The system according to claim 12 , wherein each semiconductor device includes a non-volatile memory.
16. The system according to claim 12 , wherein at least one of the semiconductor devices includes a volatile memory and at least one of other semiconductor devices includes non-volatile memories.
17. A system comprising:
a resistor, and
a plurality of semiconductor devices, each of which is coupled to the resistor, and each of which includes a calibration driver configured to perform an impedance matching operation by using the resistor and a signal generator configured to generate a status signal when the performance is completed,
wherein the plurality of semiconductor devices are coupled to have a chain shape for transmitting the status signal.
18. The system according to claim 17 , wherein the plurality of semiconductor device are configured to sequentially perform the impedance matching operation.