3D refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof

1. A method of using an ultra-high-speed 3-dimensional (3D) refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper, the method comprising:

adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper;

measuring a 2-dimensional (2D) optical field, which passes through the sample, based on the irradiation angle of the plane wave; and

obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm,

wherein the adjusting of the irradiation angle comprises:

adjusting a progression direction of one plane wave by adjusting the irradiation angle of the plane wave such that a diffraction light is incident on the sample and the rest thereof is shielded; and

adjusting a pattern of a digital micromirror device to obtain phase information.

2. The method of claim 1 , further comprising:

adjusting a phase and a pattern of a wavefront of the plane wave.

3. The method of claim 1 , wherein the adjusting of the progression direction comprises:

using only one of diffraction lights generated by the digital micromirror device by using a spatial filter.

4. The method of claim 1 , wherein the measuring of the 2D optical field comprises:

creating an interference pattern between the 2D optical field, which passes through the sample, and a reference beam and measuring the 2D optical field while variously changing the irradiation angle of the plane wave.

5. The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:

making the plane wave incident on the sample with a pattern and adjusting a phase between plane waves of the pattern;

obtaining a plurality of fluorescence images by using patterns controlled by adjusting the phase; and

obtaining a 3D high resolution fluorescence image by reconstructing a 2D fluorescence image of a high resolution from the plurality of fluorescence images by using an algorithm.

6. The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:

forming ‘N*M’ patterns by using ‘N’ patterns for distinguishing an optical field, of which an angle and a phase are adjustable through a pattern of a digital micromirror device, and ‘M’ patterns for azimuthal angle scanning.

7. The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:

obtaining the 3D high resolution fluorescence image by measuring each z-axis portion of the sample after translating a stage or a condenser lens in a z-axis direction.

8. An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper, the system comprising:

a modulation unit configured to adjust an irradiation angle of a plane wave incident on a sample by using the wavefront shaper;

an interferometer configured to measure a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave; and

a refractive index image unit configured to obtain a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm,

wherein the modulation unit adjusts a progression direction of one plane wave by adjusting the irradiation angle of the plane wave such that a diffraction light is incident on the sample and the rest thereof is shielded, and adjusts a pattern of a digital micromirror device to obtain phase information.

9. The system of claim 8 , further comprising:

a fluorescence image unit configured to adjust a phase and a pattern of a wavefront of the plane wave.

10. The system of claim 8 , wherein the modulation unit uses only one of diffraction lights generated by the digital micromirror device by using a spatial filter.

11. The system of claim 8 , wherein the interferometer creates an interference pattern between the 2D optical field, which passes through the sample, and a reference beam and measures the 2D optical field while variously changing the irradiation angle of the plane wave.

12. The system of claim 9 , wherein the fluorescence image unit makes the plane wave incident on the sample with a pattern, obtains a plurality of fluorescence images by using patterns controlled by adjusting a phase between plane waves of the pattern, and obtains a 3D high resolution fluorescence image by reconstructing a 2D fluorescence image of a high resolution from the plurality of fluorescence images by using an algorithm.