IP Library Granted Patent US 10,083,770
Granted Patent B2
US 10,083,770 · App. 14/182,908 · Granted Sep 25, 2018

High energy-density radioisotope micro power sources

Inventors: Jae Wan Kwon (Columbia, MO); Tongtawee Wacharasindhu (Columbia, MO); John David Robertson (Columbia, MO)
Assignee: The Curators of the University of Missouri
G21H1/00G21H1/06
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Quick Facts
Patent No.
US 10,083,770
App. No.
14/182,908
Granted
Sep 25, 2018
Kind
B2
Abstract

A solid-state high energy-density micro radioisotope power source device including a dielectric and radiation shielding body having an internal cavity, a first electrode disposed a first end of the cavity, and a second electrode disposed at an opposing second end of the cavity and spaced apart from the first electrode such that a micro chamber is provided therebetween. The device further includes a solid-state composite voltaic semiconductor disposed within the micro chamber fabricated by combining at least one semiconductor material with at least one radioisotope material to provide a pre-voltaic semiconductor composition; depositing the pre-voltaic semiconductor composition into the micro chamber; heating the body to liquefy the pre-voltaic semiconductor composition within the micro chamber such that the semiconductor and radioisotope materials are uniformly mixed; and cooling the body and liquid state composite mixture such that liquid state composite mixture solidifies to provide the solid-state composite voltaic semiconductor.

Claims (17)

1. A solid-state high energy-density micro radioisotope power source device; said device comprising:

a dielectric and radiation shielding body having an internal cavity formed therein;

an ohmic contact layer comprising a conductive material disposed at a first end of the cavity, and a rectifying contact layer comprising a conductive material disposed at an opposing second end of the cavity and spaced apart from the ohmic contact layer such that a micro chamber is provided therebetween;

a solid-state composite voltaic semiconductor disposed within the micro chamber between and in contact with the ohmic contact layer and the rectifying layer, the solid-state composite voltaic semiconductor comprising at least one non-radioactive semiconductor material uniformly mixed with at least one radioisotope material; and

a rectifying junction formed between the rectifying contact layer and the solid-state composite voltaic semiconductor, the rectifying junction having a depletion region within the solid-state composite voltaic semiconductor that directly converts the energy of the radioisotope material uniformly mixed with the at least one non-radioactive semiconductor material to an electric field generated within the depletion region, wherein the conductive material of one of the ohmic contact layer and the rectifying layer has a high work function compared to the composite voltaic semiconductor, and the conductive material of the opposing one of the contact layer and the rectifying layer comprises a metal having a low work function compared to the composite voltaic semiconductor.

2. The device of claim 1 , wherein the pre-voltaic semiconductor composition further comprises at least one dopant combined with the at least one semiconductor material with the at least one radioisotope material.

3. The device of claim 1 , wherein the body having the internal cavity formed therein comprises a top portion and a bottom portion forming a ‘leak-proof’ seal between the top and bottom body portions, thereby encapsulating the solid-state composite voltaic semiconductor within the internal cavity to reduce radiation losses and increase electron hole pairing within the depletion region.

4. The device of claim 1 , wherein at least one of the ohmic contact layer and the rectifying layer includes a plurality of nanostructures formed on an interface surface of the respective contact layer to increase a surface per volume ratio of the solid-state composite voltaic semiconductor to the respective contact layer, resulting in higher conversion efficiency of the solid-state high energy-density micro radioisotope power source device.

5. The device of claim 1 , wherein:

the ohmic contact layer is structured to include comb-like fingers extending from a base of the ohmic contact layer; and

the rectifying layer is structured to include comb-like fingers extending from a base of the rectifying layer such that the ohmic contact layer comb-like fingers are interposed with the rectifying layer comb-like fingers and a gap is provided between the interposed ohmic contact layer and rectifying layer comb-like fingers in which the solid-state composite voltaic semiconductor is disposed such that a surface per volume ratio of the solid-state composite voltaic semiconductor to the contact layer and rectifying layer is increased, resulting in higher conversion efficiency of the solid-state high energy-density micro radioisotope power source device.

6. The device of claim 1 , wherein the solid-state high energy-density micro radioisotope power source device is structured and operable to provide electrical voltage at least at temperatures between 0° C. and 250° C.

7. A solid-state high energy-density micro radioisotope power source device; said device comprising:

a dielectric and radiation shielding body having an internal cavity formed therein;

an ohmic contact layer comprising a conductive material disposed at a first end of the cavity, and a rectifying contact layer comprising a conductive material disposed at an opposing second end of the cavity and spaced apart from the ohmic contact layer such that a micro chamber is provided therebetween;

a solid-state composite voltaic semiconductor disposed within the micro chamber between and in contact with the ohmic contact layer and the rectifying layer, the solid-state composite voltaic semiconductor comprising at least one non-radioactive semiconductor material uniformly mixed with at least one radioisotope material; and

a rectifying junction formed between the rectifying contact layer and the solid-state composite voltaic semiconductor, the rectifying junction having a depletion region within the solid-state composite voltaic semiconductor that converts the energy of the radioisotope material uniformly mixed with the at least one non-radioactive semiconductor material to an electric field generated within the depletion region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2014
From: KWON, JAE WAN; WACHARASINDHU, TONGTAWEE; ROBERTSON, JOHN DAVID
To: THE CURATORS OF THE UNIVERISTY OF MISSOURI
Reel/Frame 032769/0070 →
Continuity (3)
Division 12723370 · Mar 12, 2010
Provisional Application 61209954 · Mar 12, 2009
Related Publication 20140159541A1 · Jun 12, 2014
Cited By (2)
US 12,505,932 US 12,626,921