IP Library › Granted Patent US 10,090,108
Granted Patent B2
US 10,090,108 · App. 15/484,467 · Granted Oct 2, 2018

Conductive paste, electronic component, and method for manufacturing electronic component

Inventors: Tetsuya Kisumi (Nagaokakyo, JP); Toshiki Nagamoto (Nagaokakyo, JP); Yasuhiro Nishisaka (Nagaokakyo, JP); Yoko Okabe (Nagaokakyo, JP)
Assignee: MURATA MANUFACTURING CO., LTD.
H01G4/30H01B1/16H01B1/22H01G4/0085H01G4/012H01G4/129H01G4/232H01G4/2325
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Quick Facts
Patent No.
US 10,090,108
App. No.
15/484,467
Granted
Oct 2, 2018
Kind
B2
Abstract

A multilayer ceramic capacitor having an external electrode with a glass phase, where an occupation rate of the glass phase is 30% to 60% on an area ratio, and a maximum length c of the glass phase is 5 μm or less.

Claims (8)

1. An electronic component comprising:

an external electrode covering an end portion of a base component; and

at least one plating film on a surface of the external electrode,

wherein the external electrode was sintered in a state in which a glass phase containing at least a Si component and metal portions are mixed together,

an occupation rate of the glass phase in the external electrode is 30% to 60% on an area ratio, and a maximum length c of the glass phase is 5 μm or less,

in a central region of an end surface of the base component, the occupation rate is calculated using as a measurement region which is an area surrounded by the end surface and a first straight line which is parallel to the end surface and which passes through a first point on the interface between the external electrode and the plating film located at a shortest distance from the end surface of the base component, and

in the central region of the end surface of the base component, the glass phase present on an intermediate line which equally divides a distance between the first straight line and a second straight line which is parallel to the end surface and which passes a second point on the surface of the plating film in contact with the interface located at a longest distance from the end surface of the base component is extracted, and of the glass phase thus extracted, the maximum length c indicates the maximum value of a length parallel to the end surface.

2. The electronic component according to claim 1 , wherein a penetration distance of the glass phase into the base component is 1 μm or less.

Priority Claims (1)
JP 2012-043729 · Feb 29, 2012 · national
Continuity (3)
Continuation 14457167 · Aug 12, 2014
Continuation PCTJP2013050449 · Jan 11, 2013
Related Publication 20170221635A1 · Aug 3, 2017