IP Library › Granted Patent US 10,090,288
Granted Patent B2
US 10,090,288 · App. 14/966,088 · Granted Oct 2, 2018

Semiconductor device and semiconductor system

Inventor: Jung Hyun Kim (Seongnam-si, KR)
Assignee: SK hynix Inc.
H01L27/0207G01R31/31708G01R31/31715
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Quick Facts
Patent No.
US 10,090,288
App. No.
14/966,088
Granted
Oct 2, 2018
Kind
B2
Abstract

A semiconductor system includes a first semiconductor device suitable for outputting an external command and a termination control signal and being inputted with a data signal; and a second semiconductor device suitable for generating a termination enable signal in response to the external command and the termination control signal, generating a pull-up signal in response to the termination enable signal, and generating a pull-down signal in response to the termination enable signal and a test mode signal.

Claims (32)

1. A semiconductor system comprising:

a first semiconductor device suitable for outputting an external command and a termination control signal and being inputted with a data signal; and

a second semiconductor device suitable for generating a termination enable signal in response to the external command and the termination control signal, generating a pull-up signal in response to the termination enable signal, and generating a pull-down signal in response to the termination enable signal and a test mode signal,

wherein the pull-up signal controls a termination operation that coupled a first resistor element between a first power supply voltage and a first node.

2. The semiconductor system according to claim 1 , wherein the termination enable signal is enabled if a write command is generated in response to the external command.

3. The semiconductor system according to claim 1 , wherein the termination enable signal is enabled if the termination control signal is enabled.

4. The semiconductor system according to claim 1 , wherein the pull-up signal is enabled if the termination enable signal is enabled.

5. The semiconductor system according to claim 1 , wherein the pull-down signal is enabled if the termination enable signal is disabled when the semiconductor system is in a test mode according to the test mode signal.

6. The semiconductor system according to claim 1 , wherein the second semiconductor device pulls up the data signal in response to the pull-up signal, and pulls down the data signal in response to the pull-down signal.

7. The semiconductor system according to claim 1 , wherein the second semiconductor device comprises:

a termination enable signal generation unit suitable for generating the termination enable signal in response to a write command generated from the external command and an internal termination control signal generated from the termination control signal; and

an output driver suitable for driving the data signal in response to the test mode signal and the termination enable signal.

8. The semiconductor system according to claim 7 , wherein the output driver comprises:

a pull-up signal generation unit suitable for generating the pull-up signal in response to the termination enable signal and a pre-pull-up signal; and

a pull-down signal generation unit suitable for generating the pull-down signal in response to the termination enable signal, the test mode signal, and a pre-pull-down signal.

9. The semiconductor system according to claim 8 , wherein the signal levels of the pre-pull-up signal and the pre-pull-down signal are determined according to internal data outputted from a memory cell array in a read operation.

10. The semiconductor system according to claim 8 , wherein the pull-up signal generation unit comprises:

a pull-up pre-driver suitable for generating the pull-up signal in response to the termination enable signal and the pre-pull-up signal; and

a pull-up control section suitable for generating an enabled pull-up signal if the termination enable signal is enabled.

11. The semiconductor system according to claim 8 , wherein the pull-down signal generation unit comprises:

a pull-down control signal generation section suitable for generating a pull-down control signal in response to the termination enable signal and the test mode signal;

a pull-down pre-driver suitable for generating the pull-down signal in response to the pull-down control signal and the pre-pull-down signal; and

a pull-down control section suitable for generating an enabled pull-down signal if the pull-down control signal is enabled.

12. The semiconductor system according to claim 8 , wherein the output driver further comprises:

a pull-up driver suitable for driving the data signal with the first power supply voltage in response to the pull-up signal; and

a pull-down driver suitable for driving the data signal with a second power supply voltage in response to the pull-down signal.

13. The semiconductor system according to claim 12 , wherein the pull-up driver comprises:

a first MOS transistor coupled between the first power supply voltage and the first node, the first MOS transistor being suitable for being turned on in response to the pull-up signal; and

the first resistor element coupled between the first node and a second node through which the data signal is outputted.

14. The semiconductor system according to claim 13 , wherein the pull-down driver comprises:

a second MOS transistor coupled between the second power supply voltage and a third node, the second MOS transistor being suitable for being turned on in response to the pull-down signal; and

a second resistor element coupled between the second node and the third node.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED ON REEL 037274 FRAME 0632. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Aug 28, 2018
From: KIM, JUNG HYUN
To: SK HYNIX INC.
Reel/Frame 046964/0868 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2015
From: KIM, JUNG HYUN
To: SK HYNIX INC.
Reel/Frame 037274/0632 →
Priority Claims (1)
KR 10-2015-0125805 · Sep 4, 2015 · national
Continuity (1)
Related Publication 20170067954A1 · Mar 9, 2017