Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder
A substrate holder for a lithographic apparatus has a planarization layer provided on a surface thereof. The planarization layer provides a smooth surface for the formation of a thin film stack forming an electronic component. The planarization layer is of substantially uniform thickness and/or its outer surface has a peak to valley distance of less than 10 μm. The planarization layer may be formed by applying two solutions of different concentration. A surface treatment may be applied to the burls to repel a solution of the planarization layer material.
1. A method comprising;
applying a first solution of a solvate of planarization material in a solvent onto an object holder to form a first sub-layer of a planarization layer on the object holder; and
applying a second solution of the solvate of planarization material in a solvent onto the first sub-layer to form a second sub-layer of the planarization layer,
wherein the first and second solutions have different concentrations of the solvate.
2. The method of claim 1 , wherein the second solution has a concentration of a greater than or equal to about 25% where the first solution is treated as having 100% concentration or wherein the first solution has a concentration of a greater than or equal to about 25% where the second solution is treated as having 100% concentration.
3. The method of claim 1 , wherein the second solution has a concentration of a greater than or equal to about 40% where the first solution is treated as having 100% concentration or wherein the first solution has a concentration of a greater than or equal to about 40% where the second solution is treated as having 100% concentration.
4. The method of claim 1 , wherein the first sub-layer is thicker than the second sub-layer.
5. The method of claim 1 , wherein the second solution has a higher concentration of the solvate than the first solution.
6. The method of claim 1 , wherein the first and second solutions comprise one or more selected from: benzocyclobutene; perhydropolysilazene, SiO 2 , parylene and/or polyimide.
7. The method of claim 1 , wherein at least part of the object holder to which the planarization layer is provided is repellent to a material used to form the planarization layer.
8. A substrate holder system comprising:
a main body of a substrate holder, the main body having a surface with surface roughness;
a plurality of burls projecting from the surface and having end surfaces to support a substrate; and
a planarization layer provided on at least part of the surface of the main body, the planarization layer comprising at least a first sub-layer and a second sub-layer, the first-sub layer formed from a solvate of planarization material in a first solution and the second-sub layer formed on the first sub-layer from the solvate of planarization material in a second solution, wherein the first and second solutions have different concentrations of the solvate.
9. The substrate holder system of claim 8 , wherein the second solution has a concentration of a greater than or equal to about 25% where the first solution is treated as having 100% concentration or wherein the first solution has a concentration of a greater than or equal to about 25% where the second solution is treated as having 100% concentration.
10. The substrate holder system of claim 8 , wherein the second solution has a concentration of a greater than or equal to about 40% where the first solution is treated as having 100% concentration or wherein the first solution has a concentration of a greater than or equal to about 40% where the second solution is treated as having 100% concentration.
11. The substrate holder system of claim 8 , wherein the first sub-layer is thicker than the second sub-layer.
12. The substrate holder system of claim 8 , wherein the second solution has a higher concentration of the solvate than the first solution.
13. The substrate holder system of claim 8 , wherein the first and second solutions comprise one or more selected from: benzocyclobutene; perhydropolysilazene, SiO 2 , parylene and/or polyimide.
14. The substrate holder system of claim 8 , wherein at least part of the object holder to which the planarization layer is provided is repellent to a material used to form the planarization layer.
15. A method comprising:
applying planarization material with a first concentration onto an object holder to form a first sub-layer of a planarization layer on the object holder;
applying planarization material with a second concentration onto the first sub-layer to form a second sub-layer of the planarization layer; and
forming an electric or electronic component on the planarization layer,
wherein the first and second concentrations are different.
16. The method of claim 15 , wherein the planarization material with the second concentration has a concentration of a greater than or equal to about 25% where the planarization material with the first concentration is treated as having 100% concentration or wherein the planarization material with the first concentration has a concentration of a greater than or equal to about 25% where the planarization material with the second concentration is treated as having 100% concentration.
17. The method of claim 15 , wherein the first sub-layer is thicker than the second sub-layer.
18. The method of claim 15 , wherein the second concentration is higher than the first concentration.
19. The method of claim 15 , wherein the planarization material comprise one or more selected from: benzocyclobutene; perhydropolysilazene, SiO 2 , parylene and/or polyimide.
20. The method of claim 15 , wherein at least part of the object holder to which the planarization layer is provided is repellent to a material used to form the planarization layer.