Electron channeling pattern acquisition from small crystalline areas
A method for crystal analysis includes identifying a crystalline region on a device where an electronic channeling pattern is needed to be determined, acquiring a whole image for each of a plurality of different positions for the crystalline region using a scanning electron microscope (SEM) as the crystalline region is moved to different positions. Relevant regions are extracted from the whole images. The images of the relevant regions are stitched together to form a composite map of a full electron channeling pattern representative of the crystalline region wherein the electronic channeling pattern is provided due to an increase in effective angular range between a SEM beam and a surface of the crystal region.
1. A system for crystal analysis, comprising:
a scanning electron microscope (SEM) configured to scan a crystalline region of a device using a beam;
a stage configured to mount the device and to step the device through a plurality of imaging positions on the crystalline region; and
a memory device including imaging software configured to:
store whole images taken at each of the plurality of imaging positions on the crystalline region;
extract portions of a full electronic channeling pattern for identifying crystal structure and orientation from the whole images; and
stitch the portions of the electronic channeling pattern together to form a composite map of the crystalline region, wherein the full electronic channeling pattern provided in the composite map increases accuracy of the identification of the crystal s and orientation due to an increase in effective angular range between the beam and the surface of the crystalline region.
2. The system as recited in claim 1 , wherein the SEM is further configured to scan a crystalline region that is smaller than an area needed to view the full electronic channeling pattern.
3. The system as recited in claim 1 , wherein the SEM is further configured to scan a crystalline region buried below a thickness of non-crystalline material, and wherein each of the whole images is acquired through the non-crystalline material.
4. The system as recited in claim 1 , further comprising a stepper motor configured to step the device through the plurality of imaging positions in at least two dimensions.
5. The system as recited in claim 1 , wherein the SEM is further configured to scan a crystalline region that includes a plurality of exposed crystalline regions or a crystalline region of a cross-section of the device.
6. The system as recited in claim 1 , wherein the portions of the electronic channeling pattern are automatically stitched together based on at least one demarcated area.