IP Library › Granted Patent US 10,145,791
Granted Patent B2
US 10,145,791 · App. 15/559,906 · Granted Dec 4, 2018

Electric field imaging method

Inventor: Masahiro Tsuchiya (Tokyo, JP)
Assignee: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
G01N21/552G01N21/648G01R29/08
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Quick Facts
Patent No.
US 10,145,791
App. No.
15/559,906
Granted
Dec 4, 2018
Kind
B2
Abstract

To minimize or prevent obstruction by a surface-mounted part or disturbance to an object to be visually observed, an electric field sensor is placed at a predetermined distance from a surface of the object to be visually observed, and a two-dimensional distribution of a high-frequency electric field is detected. Considering that the measured electric field distribution is due to an electrostatic field from the electric field distribution at the surface of the visually observed object, the electric field distribution at the surface is back-calculated from Gauss' flux theorem or the like, and the obtained electric field distribution is displayed or outputted. Thus, the electric field distribution at a position closer to the surface of the visually observed object is imaged while obstruction by a surface-mounted part or disturbance to the visually observed object is suppressed.

Claims (12)

1. An electric field imaging method for detecting and imaging a two-dimensional distribution of a high-frequency electric field emanating from a high frequency circuit as an object to be visually observed (hereinafter abbreviated as a high-frequency electric field distribution), by using an electric field imaging apparatus including an electric field sensor, a sensor signal processing unit, an image signal processing system, and display means, comprising:

(1) detecting, by using the electric field sensor, a high-frequency electric field distribution at a position a predetermined distance away from a surface of the object to be visually observed;

(2) processing, by using the sensor signal processing unit, a signal from the electric field sensor to convert the signal to an image signal;

(3) in processing of the image signal using the image signal processing system, back-calculating, under an assumption that the high-frequency electric field distribution converted to the image signal in (2) is derived from a high-frequency electric field distribution at the surface of the object to be visually observed, the high-frequency electric field distribution at the surface from the detected high-frequency electric field distribution; and

(4) displaying or outputting the high-frequency electric field distribution obtained through the back-calculating,

thereby imaging an electric field distribution at a position closer to the object to be visually observed relative to the position at which the detecting is performed by the electric field sensor or at a position corresponding to the surface of the object to be visually observed, while suppressing disturbance to the object to be visually observed.

2. The electric field imaging method according to claim 1 , wherein collective imaging of a high-frequency electric field distribution is performed by utilizing optical parallelism obtained by using an electrooptic crystal plate as the electric field sensor.

3. The electric field imaging method according to claim 2 , wherein a Gauss' flux theorem is used in the back-calculating.

4. The electric field imaging method according to claim 1 , wherein a Gauss' flux theorem is used in the back-calculating.

5. The electric field imaging method according to claim 1 , wherein a distance at which a resolution of the high-frequency electric field distribution back-calculated from the detected high-frequency electric field distribution is optimum is used as the predetermined distance between the electric field sensor and the surface of the object to be visually observed in the back-calculating, thereby omitting inputting of a numerical value as the predetermined distance.

6. The electric field imaging method according to claim 1 , wherein the high-frequency electric field distribution at the surface obtained in (3) is resolved into a spatial frequency spectrum after multiplied by a predetermined window function, filtered using a spatial spectrum filter having a predetermined filtering characteristic, and subjected to inverse Fourier transform so that a predetermined spatial frequency filtering is carried out.

7. The electric field imaging method according to claim 6 , wherein the spatial spectrum filter has, at least at a high-frequency end, a spectrum reduction rate higher than an average in the spatial frequency spectrum.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2017
From: TSUCHIYA, MASAHIRO
To: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
Reel/Frame 043639/0491 →
Priority Claims (1)
JP 2015-059072 · Mar 23, 2015 · national
Continuity (1)
Related Publication 20180095037A1 · Apr 5, 2018