IP Library › Granted Patent US 10,148,280
Granted Patent B2
US 10,148,280 · App. 15/853,779 · Granted Dec 4, 2018

Hybrid flash architecture of successive approximation register analog to digital converter

Inventors: Wai Lee (Portland, OR); Jianping Wen (Tigard, OR); Garry N. Link (Pacific City, OR)
Assignee: Avnera Corporation
H03M1/462H03M1/1033H03M1/447H03M1/188H03M1/468
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,148,280
App. No.
15/853,779
Granted
Dec 4, 2018
Kind
B2
Abstract

The disclosure includes a mechanism for mitigating electrical current leakage in a Successive Approximation Register (SAR) Analog to Digital Converter (ADC) by using a Flash ADC in conjunction with the SAR ADC. A sequence controller in the SAR ADC uses the output of the Flash ADC to control a switch array. Depending on the output of the Flash ADC, the sequence controller can control the switch array to couple at least one capacitor in the capacitor network of the SAR ADC to a voltage that reduces charge leakage in the SAR ADC. The voltage may be a pre-defined positive or negative reference voltage.

Claims (27)

1. A Successive Approximation Register (SAR) Analog to Digital Converter (ADC) comprising:

a comparator;

a capacitor array coupled to an input of the comparator, the capacitor array structured to be selectively coupled to an analog input signal for converting to a digital output signal;

a flash ADC structured to be selectively coupled to the analog input signal; and

a SAR sequencer configured to:

accept an output of the flash ADC; and

couple at least one capacitor of the capacitor array to a pre-defined voltage based on the output of the flash ADC.

2. The SAR ADC of claim 1 in which the pre-defined voltage is a negative reference voltage.

3. The SAR ADC of claim 1 in which the pre-defined voltage is a positive reference voltage.

4. The SAR ADC of claim 1 in which the at least one capacitor is a most significant bit (MSB) capacitor.

5. The SAR ADC of claim 1 in which the SAR sequencer is configured to couple more than one capacitor of the capacitor array to the pre-defined voltage based on the output of the flash ADC.

6. The SAR ADC of claim 1 in which the capacitor array has a radix less than 2.

7. The SAR ADC of claim 1 in which the capacitor array has a non-uniform radix between adjacent capacitors of the capacitor array.

8. The SAR ADC of claim 7 in which the flash ADC has a radix that matches the radix of the capacitor array.

9. The SAR ADC of claim 7 , further comprising a calibration ADC structured to calibrate one or more capacitors in the capacitor array.

10. A method comprising:

loading an analog voltage signal into a capacitor array of a Successive Approximation Register (SAR);

generating a digital output signal from a flash Analog to Digital Converter (ADC) that corresponds to the analog voltage signal; and

coupling at least one capacitor in the capacitor array to a predefined voltage based on the digital output signal.

11. The method of claim 10 , in which coupling the at least one capacitor comprises operating an active switch.

12. The method of claim 10 in which the at least one capacitor in the capacitor array includes a most significant bit (MSB) capacitor.

13. The method of claim 10 , in which at least one capacitor of the capacitor array is a calibrated capacitor.

14. The method of claim 10 , in which the pre-defined voltage is a negative reference voltage.

15. The method of claim 10 , in which the pre-defined voltage is a positive reference voltage.

16. The method of claim 10 , further comprising coupling at least two capacitors in the capacitor array to the pre-defined voltage based on the digital output signal.

17. The method of claim 10 , further comprising calibrating one or more capacitors in the capacitor array by a calibration ADC.

18. The method of claim 10 , in which the at least one capacitor is a most significant bit (MSB) capacitor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2018
From: LEE, WAI; WEN, JIANPING; LINK, GARRY N.
To: AVNERA CORPORATION
Reel/Frame 045511/0151 →
Continuity (2)
Provisional Application 62438931 · Dec 23, 2016
Related Publication 20180183458A1 · Jun 28, 2018
Cited By (1)
US 12,574,043