IP Library › Granted Patent US 10,166,644
Granted Patent B2
US 10,166,644 · App. 15/026,291 · Granted Jan 1, 2019

Processing inspection workpiece for machine tool, and on-machine measurement method using said workpiece

Inventors: Takayuki Kume (Tokyo, JP); Toshiya Narihara (Tokyo, JP); Michinori Sengiku (Tokyo, JP)
Assignee: MITSUBISHI HEAVY INDUSTRIES MACHINE TOOL CO., LTD.
B23Q17/20B23Q17/2233G01B5/008G01B21/042
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Quick Facts
Patent No.
US 10,166,644
App. No.
15/026,291
Granted
Jan 1, 2019
Kind
B2
Abstract

Provided is a processing inspection workpiece for a machine tool with which it is possible to inspect tool precision by subjecting the machine tool to on-machine measurement. Also provided is an on-machine measurement method using said workpiece. In a processing inspection workpiece, five surfaces, excluding a hexahedron bottom surface, function as processing surfaces, and multiple reference surfaces, which are in the same direction as the respective processing surfaces and for which multiple in-plane coordinates are already known, are disposed on each processing surface. A machine tool is subjected to on-machine measurement using said processing inspection workpiece.

Claims (12)

1. An on-machine measurement method using a processing inspection workpiece for a machine tool, the method comprising:

Using the processing inspection workpiece which has at least one processing surface, and at least one reference surface facing in a direction in which the processing surface faces, and having a plurality of in-plane measurement points whose coordinates are known;

replacing an attachment of the machine tool with a measurement sensor configured to detect a contact position with the processing inspection workpiece, after the machine tool processes the processing inspection workpiece;

performing a first measurement to measure the measurement points on the reference surface by using the measurement sensor;

performing, after the first measurement, a second measurement to measure a measurement point on the processing surface near the measurement points on the reference surface by using the measurement sensor; and

detecting coordinates of all the measurement points by alternately performing the first measurement and the second measurement on all of the reference surface and the processing surface.

2. The on-machine measurement method using the processing inspection workpiece for a machine tool according to claim 1 , wherein

the processing inspection workpiece has a shape of a hexahedron,

each of five surfaces of the hexahedron excluding a bottom surface thereof is the processing surface, and

each of the processing surfaces is provided with a plurality of the reference surfaces.

3. The on-machine measurement method using the processing inspection workpiece for a machine tool according to claim 2 , wherein coordinates of at least the measurement point on the processing surface among the measurement points on the reference surface and the processing surface are determined from average values of coordinates obtained by measuring a position of the measurement point on the processing surface and three or more positions on a circle having a predetermined radius and a center located at the position of the measurement point.

4. The on-machine measurement method using the processing inspection workpiece for a machine tool according to claim 1 , wherein coordinates of at least the measurement point on the processing surface among the measurement points on the reference surface and the processing surface are determined from average values of coordinates obtained by measuring a position of the measurement point on the processing surface and three or more positions on a circle having a predetermined radius and a center located at the position of the measurement point.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2016
From: KUME, TAKAYUKI; NARIHARA, TOSHIYA; SENGIKU, MICHINORI
To: MITSUBISHI HEAVY INDUSTRIES MACHINE TOOL CO., LTD.
Reel/Frame 038169/0453 →
Priority Claims (1)
JP 2013-233604 · Nov 12, 2013 · national
Continuity (1)
Related Publication 20160243663A1 · Aug 25, 2016