High temperature silicon oxide atomic layer deposition technology
Processes for depositing SiO 2 films on a wafer surface utilizing an aminosilane compound as a silicon precursor are described.
1. A method of depositing a film, the method comprising:
exposing a wafer surface to a silicon precursor that adsorbs onto the wafer surface, the silicon precursor comprising R 3 Si:NY 3 , wherein each R is independently selected from hydrogen, Cl, Br, I, a linear or branched C 1 -C 10 alkyl group, a linear or branched C 1 -C 10 alkoxy group, and a C 6 -C 10 aryl group, and each Y is independently selected from the group consisting of Cl, Br, I, a linear or branched C 1 -C 10 alkylsilyl group, and a C 6 -C 10 aryl group;
heating the wafer surface to a temperature in the range of about 450° C. to about 650° C. to decompose the adsorbed silicon precursor on the wafer surface to form a monolayer or sub-monolayer silicon film; and
exposing the monolayer or sub-monolayer silicon film and wafer surface to an oxygen source, wherein the oxygen source reacts with the monolayer or sub-monolayer silicon film to form a monolayer or sub-monolayer SiO 2 film.
2. The method of claim 1 , wherein exposing the wafer surface to a silicon precursor comprises passing the silicon precursor through a shower head, and passing the wafer beneath the showerhead.
3. The method of claim 2 , wherein the wafer is a silicon wafer, and the silicon wafer is supported by a susceptor that rotates, so the wafer surface is exposed to the silicon precursor for a predetermined amount of time by passing beneath the showerhead.
4. The method of claim 1 , wherein the source of oxygen is an oxygen plasma and/or a gas comprising ozone.
5. The method of claim 4 , wherein the source of oxygen is the oxygen plasma in combination with the gas comprising ozone.
6. The method of claim 1 , wherein the wafer surface comprises one or more device features with an aspect ratio in the range of about 10:1 to about 100:1, and the silicon precursor forms a conformal layer on the one or more device features.
7. The method of claim 6 , wherein the one or more device features are trenches having a trench depth in the range of about 1 μm to about 3.5 μm.
8. The method of claim 6 , wherein the one or more device features are trenches having a trench depth in the range of about 100 nm to about 700 nm.
9. The method of claim 6 , wherein the monolayer or sub-monolayer SiO 2 film formed conformally on the device features contains essentially no carbon or nitrogen contaminants.
10. A method of depositing a film, the method comprising:
placing at least one silicon wafer into a susceptor within a reaction chamber;
heating the at least one silicon wafer to a temperature in the range of about 450° C. to about 650° C.;
introducing a continuous stream of a silicon precursor into the reaction chamber through a showerhead, the silicon precursor comprising R 3 Si:NY 3 , wherein each R is independently selected from hydrogen, Cl, Br, I, a linear or branched C 1 -C 10 alkyl group, a linear or branched C 1 -C 10 alkoxy group, and a C 6 -C 10 aryl group, and each Y is independently selected from the group consisting of Cl, Br, I, a linear or branched C 1 -C 10 alkylsilyl group, and a C 6 -C 10 aryl group;
providing a source of oxygen comprising one or more of an oxygen plasma or an oxygen source gas in at least one processing region of the reaction chamber;
rotating the susceptor, so the at least one silicon wafer passes beneath the showerhead, wherein at least a portion of the silicon precursor adsorbs onto a surface of the silicon wafer, and the one or more of oxygen plasma or oxygen source gas reacts with the absorbed silicon precursor to form a SiO 2 film.
11. The method of claim 10 , further comprising treating the SiO 2 film with a post deposition treatment comprising one or more of a UV cure, a thermal anneal, a post steam anneal, and/or a plasma treatment.
12. The method of claim 10 , wherein the source of oxygen comprises an oxygen plasma and ozone.
13. The method of claim 10 , wherein the wafer surface comprises one or more device features with an aspect ratio in the range of about 10:1 to about 100:1, and the silicon precursor forms a conformal layer on the one or more device features.
14. The method of claim 13 , wherein the one or more device features are trenches having a trench depth in the range of about 1 μm to about 3.5 μm.
15. The method of claim 13 , wherein the one or more device features are trenches having a trench depth in the range of about 100 nm to about 700 nm.
16. The method of claim 13 , wherein the monolayer or sub-monolayer SiO 2 film formed conformally on the device features contains essentially no carbon or nitrogen contaminants.