IP Library Granted Patent US 10,174,421
Granted Patent B2
US 10,174,421 · App. 15/105,110 · Granted Jan 8, 2019

Coated tool

Inventors: Yoshikazu Kodama (Satsumasendai, JP); Takahito Tanibuchi (Satsumasendai, JP); Kou Ri (Satsumasendai, JP)
Assignee: KYOCERA CORPORATION
C23C16/06C23C14/081C23C16/0272C23C16/44C23C16/56C23C28/042C23C28/044C23C30/005
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Quick Facts
Patent No.
US 10,174,421
App. No.
15/105,110
Granted
Jan 8, 2019
Kind
B2
Abstract

A coated tool is, for example, a cutting tool which is provided with a base material and a coating layer located on a surface of the base material, wherein a cutting edge and a flank surface are located on the coating layer, the coating layer has a portion in which at least a titanium carbonitride layer and an aluminum oxide layer having an α-type crystal structure are laminated in this order, and, with regard to a texture coefficient Tc (hkl) which is calculated on a basis of a peak of the aluminum oxide layer analyzed by an X-ray diffraction analysis, a texture coefficient Tc1 (0 1 14) as measured from a surface side of the aluminum oxide layer on a side of the flank surface is 1 or more.

Claims (16)

1. A coated tool comprising,

a base material comprising a first surface and a second surface; and

coating layers located over the base material and comprising,

a first layer including titanium carbonitride and located over the base material, and

a second layer including aluminum oxide having an alpha-type crystal structure and located over the first layer, wherein

the second layer comprises a first portion located over the first surface and a second portion located over the second surface, and

a texture coefficient Tc1 (0 1 14) as measured from above a top surface of the first portion is 1 or more, wherein the texture coefficient Tc (hkl) is a value expressed by the formula shown below on the basis of a peak of the second layer analyzed by an X-ray diffraction analysis:

a texture coefficient Tc ( hkl )={ I ( hkl )/ I 0 ( hkl )}/[(⅛)×Σ{ I ( HKL )/ I 0 ( HKL )}]

wherein (HKL) represents a crystal face (012), (104), (110), (113), (024), (116), (124) or (0 1 14);

each of I(HKL) and I(hkl) represents a peak intensity of a peak which is attributed to each crystal face and is detected by an X-ray diffraction analysis of the second layer; and

each of I 0 (HKL) and I 0 (hkl) represents a reference diffraction intensity of each crystal face contained in a JCPDS card No. 43-1484.

2. The coated tool according to claim 1 , wherein a texture coefficient Tc2 (0 1 14), which is detected by the measurement in which the first portion is polished to allow only a side of the base material of the second layer to leave, is smaller than the Tc1 (0 1 14).

3. The coated tool according to claim 1 , wherein one of I(104) and I(116) is the first most-intense peak and another one of I(104) and I(116) is the second most-intense peak among surface side peaks as measured from above a top surface of the first portion.

4. The coated tool according to claim 1 , wherein a texture coefficient Tc3 (104), which is measured from a surface side of the second portion, is smaller than a texture coefficient Tc1 (104), which is measured from above a top surface of the first portion.

5. The coated tool according to claim 1 , wherein the top surface of the first portion comprises a flank surface.

6. The coated tool according to claim 1 , wherein a top surface of the second portion comprises a rake surface.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2016
From: KODAMA, YOSHIKAZU; TANIBUCHI, TAKAHITO; RI, KOU
To: KYOCERA CORPORATION
Reel/Frame 038931/0452 →
Priority Claims (1)
JP 2013-260273 · Dec 17, 2013 · national
Continuity (1)
Related Publication 20160326641A1 · Nov 10, 2016
Cited By (1)
US 12,497,689