IP Library Granted Patent US 10,184,993
Granted Patent B2
US 10,184,993 · App. 15/018,989 · Granted Jan 22, 2019

Magnetometric sensor and current sensor

Inventors: Yosuke Ide (Tokyo, JP); Masamichi Saito (Tokyo, JP)
Assignee: ALPS ELECTRIC CO., LTD.
G01R33/093G01R33/098H01L43/02H01L43/08H01L43/10
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Quick Facts
Patent No.
US 10,184,993
App. No.
15/018,989
Granted
Jan 22, 2019
Kind
B2
Abstract

A magnetometric sensor comprises a magnetoresistance effect element having a sensitivity axis in a specific direction; including a fixed magnetic layer, a nonmagnetic material layer, and a free magnetic layer stacked in this order on a substrate; and including a first antiferromagnetic layer on the free magnetic layer on the opposite side to the side facing the nonmagnetic material layer to cause an exchange coupling bias between the first antiferromagnetic layer and the free magnetic layer and align the magnetization direction of the free magnetic layer in a prescribed direction in a state of permitting variation in magnetization. The free magnetic layer includes a first free magnetic sub-layer, a misfit-reducing sub-layer for decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer, and a second free magnetic sub-layer ferromagnetically coupled to the first free magnetic sub-layer in this order from the first antiferromagnetic layer side.

Claims (58)

1. A magnetometric sensor comprising:

a magnetoresistance effect element having a sensitivity axis in a specific direction, wherein

the magnetoresistance effect element has a layered structure on a substrate, the layered structure comprising a fixed magnetic layer and a free magnetic layer stacked with a nonmagnetic material layer interposed therebetween;

the magnetoresistance effect element includes a first antiferromagnetic layer on the free magnetic layer on the opposite side to the side facing the nonmagnetic material layer to cause an exchange coupling bias between the first antiferromagnetic layer and the free magnetic layer to make the magnetization direction of the free magnetic layer in a prescribed direction in a state of permitting variation in magnetization; and

the free magnetic layer includes a misfit-reducing sub-layer for decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer.

2. The magnetometric sensor according to claim 1 , wherein the free magnetic layer includes:

a misfit-reducing sub-layer for decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer;

a first free magnetic sub-layer disposed between the misfit-reducing sub-layer and the nonmagnetic material layer; and

a second free magnetic sub-layer disposed between the misfit-reducing sub-layer and the first antiferromagnetic layer and ferromagnetically coupled to the first free magnetic sub-layer.

3. The magnetometric sensor according to claim 2 , wherein

the misfit-reducing sub-layer and the second free magnetic sub-layer each have a face-centered cubic (fcc) structure; and

the lattice spacing of the fcc(111) plane of the misfit-reducing sub-layer is larger than that of the fcc(111) plane of the second free magnetic sub-layer.

4. The magnetometric sensor according to claim 2 , wherein the misfit-reducing sub-layer contains at least one selected from the group consisting of Pt, Pd, Ta, and W.

5. The magnetometric sensor according to claim 2 , wherein

the first antiferromagnetic layer contains a platinum group element and Mn.

6. The magnetometric sensor according to claim 2 , wherein

the first antiferromagnetic layer is formed of at least one of IrMn and PtMn.

7. The magnetometric sensor according to claim 2 , wherein

the fixed magnetic layer includes a first magnetic sub-layer and a second magnetic sub-layer stacked with a nonmagnetic intermediate sub-layer interposed therebetween, the second magnetic sub-layer being in contact with the nonmagnetic material layer, wherein

the first magnetic sub-layer and the second magnetic sub-layer are self-pinned magnetic layers having magnetization fixed in mutually antiparallel directions.

8. The magnetometric sensor according to claim 2 , wherein

the fixed magnetic layer includes a second antiferromagnetic sub-layer on the opposite side to the side facing the nonmagnetic material layer and a ferromagnetic sub-layer to cause an exchange coupling bias between the second antiferromagnetic sub-layer and the ferromagnetic sub-layer and align the magnetization direction of the fixed magnetic layer in a prescribed direction.

9. The magnetometric sensor according to claim 2 , wherein

the layered structure has the free magnetic layer between the fixed magnetic layer and the substrate.

10. The magnetometric sensor according to claim 2 , wherein

the layered structure has the fix magnetic layer between the free magnetic layer and the substrate.

11. A current sensor comprising the magnetometric sensor according to claim 2 .

12. The magnetometric sensor according to claim 1 , wherein

the free magnetic layer includes:

a misfit-reducing sub-layer being in contact with the first antiferromagnetic layer and decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer; and

a ferromagnetic sub-layer made of a ferromagnetic material disposed on the misfit-reducing sub-layer on the opposite side to the side facing the first antiferromagnetic layer.

13. The magnetometric sensor according to claim 12 , wherein

the misfit-reducing sub-layer and the ferromagnetic sub-layer each have a face-centered cubic (fcc) structure; and

the lattice spacing of the fcc(111) plane of the misfit-reducing sub-layer is larger than that of the fcc(111) plane of the ferromagnetic sub-layer.

14. The magnetometric sensor according to claim 12 , wherein

the misfit-reducing sub-layer contains at least one iron group element and at least one platinum group element.

15. A current sensor comprising the magnetometric sensor according to claim 12 .

16. A current sensor comprising the magnetometric sensor according to claim 1 .

17. A magnetometric sensor comprising:

a magnetoresistance effect element having a sensitivity axis in a specific direction, wherein

the magnetoresistance effect element includes:

a layered structure on a substrate, the layered structure comprising a fixed magnetic layer and a free magnetic layer stacked with a nonmagnetic material layer interposed therebetween; and

a first antiferromagnetic layer on the free magnetic layer on the opposite side to the side facing the nonmagnetic material layer to cause an exchange coupling bias between the first antiferromagnetic layer and the free magnetic layer and align the magnetization direction of the free magnetic layer in a prescribed direction in a state of permitting variation in magnetization, wherein

the free magnetic layer includes:

a first sub-layer serving as a misfit-reducing sub-layer for decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer;

a first free magnetic sub-layer disposed between the first sub-layer and the nonmagnetic material layer; and

a second free magnetic sub-layer disposed between the first sub-layer and the first antiferromagnetic layer and ferromagnetically coupled to the first free magnetic sub-layer, wherein

the first sub-layer contains at least one selected from the group consisting of Pt, Pd, Ta, and W.

18. A current sensor comprising the magnetometric sensor according to claim 17 .

19. A magnetometric sensor comprising:

a magnetoresistance effect element having a sensitivity axis in a specific direction, wherein

the magnetoresistance effect element has a layered structure on a substrate, the layered structure comprising a fixed magnetic layer and a free magnetic layer stacked with a nonmagnetic material layer interposed therebetween;

the magnetoresistance effect element includes a first antiferromagnetic layer on the free magnetic layer on the opposite side to the side facing the nonmagnetic material layer to cause an exchange coupling bias between the first antiferromagnetic layer and the free magnetic layer and align the magnetization direction of the free magnetic layer in a prescribed direction in a state of permitting variation in magnetization;

the free magnetic layer includes:

a first sub-layer being in contact with the first antiferromagnetic layer and serving as a misfit-reducing sub-layer for decreasing the lattice mismatch of the free magnetic layer with the first antiferromagnetic layer; and

a ferromagnetic sub-layer made of a ferromagnetic material disposed on the first sub-layer on the opposite side to the side facing the first antiferromagnetic layer, wherein

the first sub-layer contains at least one iron group element and at least one platinum group element.

20. A current sensor comprising the magnetometric sensor according to claim 19 .

Assignments (2)
CHANGE OF NAME Recorded Jan 31, 2019
From: ALPS ELECTRIC CO., LTD
To: ALPS ALPINE CO., LTD
Reel/Frame 048206/0968 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2016
From: IDE, YOSUKE; SAITO, MASAMICHI
To: ALPS ELECTRIC CO., LTD.
Reel/Frame 037694/0015 →
Priority Claims (2)
JP 2015-024891 · Feb 12, 2015 · national
JP 2015-034532 · Feb 24, 2015 · national
Continuity (1)
Related Publication 20160238675A1 · Aug 18, 2016