IP Library › Granted Patent US 10,186,512
Granted Patent B2
US 10,186,512 · App. 15/560,682 · Granted Jan 22, 2019

Solid-state image sensor, image capturing device, and electronic device

Inventors: Katsuhiko Hanzawa (Kanagawa, JP); Yuuichi Kaji (Kanagawa, JP)
Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
H01L27/092H01L27/14643H04N5/365H04N5/378H04N5/37455
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Quick Facts
Patent No.
US 10,186,512
App. No.
15/560,682
Granted
Jan 22, 2019
Kind
B2
Abstract

[Object] The present technology relates to a solid-state image sensor, image capturing device, and electronic device, capable of setting a reference voltage applied to a vertical transfer line to be substantially the same as a reset voltage of a floating diffusion portion. [Solution] A reference voltage generation circuit configured to generate the reference voltage includes the same circuit as a reset transistor, an amplification transistor, and a selection transistor in a pixel circuit, and applies it to the vertical transfer line immediately before transferring an optical signal and a reset signal. This allows the same reference voltage as that immediately after applying the reset signal to the floating diffusion to be applied to the vertical transfer line. The present technology is applicable to CMOS image sensors.

Claims (42)

1. A solid-state image sensor comprising:

a source follower circuit configured to generate a reference voltage,

wherein a gate voltage of an amplification transistor included in the source follower circuit is equal to a reset voltage in resetting an electric charge accumulated in a floating diffusion that accumulates an electric charge generated by a photodiode included in a pixel circuit for each pixel, and

a switch is disposed on a wiring between the gate and a power supply that applies a voltage to the gate, and the switch, when being turned off, sets the voltage to be applied to the gate to be a value equal to a voltage of the floating diffusion obtained after the resetting.

2. The solid-state image sensor according to claim 1 ,

wherein the source follower circuit generates the reference voltage when the switch is turned on.

3. The solid-state image sensor according to claim 1 ,

wherein the source follower circuit is set for each column divided in a horizontal direction, is provided for each vertical transfer line that transfers a signal of each pixel in a vertical direction, and applies the reference voltage to the vertical transfer line.

4. The solid-state image sensor according to claim 3 ,

wherein a plurality of adjacent vertical transfer lines are connected to each other by commonly using a gate of a transistor serving as the switch.

5. The solid-state image sensor according to claim 3 ,

wherein a plurality of adjacent vertical transfer lines are connected to each other via a switch and the switch is turned on at a timing immediately before reading the signal of the pixel.

6. The solid-state image sensor according to claim 1 ,

wherein a power supply that supplies the reset voltage and a power supply that supplies a voltage as the reference voltage via the switch are identical power supplies.

7. The solid-state image sensor according to claim 1 ,

wherein a power supply that supplies the reset voltage and a power supply that supplies a voltage as the reference voltage via the switch are individual power supplies.

8. The solid-state image sensor according to claim 1 ,

wherein a signal of the pixel to be output via a vertical transfer line is output to an auto-zero circuit.

9. The solid-state image sensor according to claim 1 ,

wherein a signal of the pixel to be output via a vertical transfer line is output to an AD converter.

10. The solid-state image sensor according to claim 1 ,

wherein a main body circuit configuration includes one chip.

11. The solid-state image sensor according to claim 1 ,

wherein a main body circuit configuration includes a plurality of chips.

12. The solid-state image sensor according to claim 11 ,

wherein, in a case where the main body circuit configuration includes two chips, the pixel circuit is included in a first chip and the source follower circuit and an analog/digital (AD) converter are included in a second chip.

13. The solid-state image sensor according to claim 11 ,

wherein, in a case where the main body circuit configuration includes two chips, the pixel circuit and the source follower circuit are included in a first chip and an analog/digital (AD) converter is included in a second chip.

14. The solid-state image sensor according to claim 11 ,

wherein, in a case where the main body circuit configuration includes two chips, the pixel circuit, the source follower circuit, and a comparator of an analog/digital (AD) converter are included in a first chip and a counter of the AD converter is included in a second chip.

15. The solid-state image sensor according to claim 1 ,

wherein the source follower circuit is provided for each area transfer line used to transfer a signal of each pixel in each of the areas divided in a two-dimensional direction, and applies the reference voltage to the area transfer line.

16. The solid-state image sensor according to claim 15 ,

wherein a main body circuit configuration includes a first chip including the pixel circuit provided for each of the areas and a second chip including a source follower circuit provided for each of the areas.

17. An image capturing device comprising:

a source follower circuit configured to generate a reference voltage,

wherein a gate voltage of an amplification transistor included in the source follower circuit is equal to a reset voltage in resetting an electric charge accumulated in a floating diffusion that accumulates an electric charge generated by a photodiode included in a pixel circuit for each pixel, and

a switch is disposed on a wiring between the gate and a power supply that applies a voltage to the gate, and the switch, when being turned off, sets the voltage to be applied to the gate to be a value equal to a voltage of the floating diffusion obtained after the resetting.

18. An electronic device comprising:

a source follower circuit configured to generate a reference voltage,

wherein a gate voltage of an amplification transistor included in the source follower circuit is equal to a reset voltage in resetting an electric charge accumulated in a floating diffusion that accumulates an electric charge generated by a photodiode included in a pixel circuit for each pixel, and

a switch is disposed on a wiring between the gate and a power supply that applies a voltage to the gate, and the switch, when being turned off, sets the voltage to be applied to the gate to be a value equal to a voltage of the floating diffusion obtained after the resetting.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2017
From: HANZAWA, KATSUHIKO; KAJI, YUUICHI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 043974/0249 →
Priority Claims (1)
JP 2015-076731 · Apr 3, 2015 · national
Continuity (1)
Related Publication 20180108658A1 · Apr 19, 2018
Cited By (1)
US 12,622,084