Detecting process variation of memory cells

1. An integrated circuit, comprising:

a memory cell array disposed in a first area of the integrated circuit, the memory cell array having memory cells with first transistors of multiple types; and

a process sensor disposed in a second area of the integrated circuit that is different than the first area, the process sensor having a process detector with second transistors of the multiple types that are separate from the first transistors,

wherein the second transistors of the process detector are arranged for detecting process variation of the memory cells of the memory cell array based at least in part on detecting a process point of the memory cells skewing to a process corner of one or more process corners.

2. The integrated circuit of claim 1 , wherein detecting process variation of the memory cells of the memory cell array includes sensing process variation of the first transistors of the multiple types.

3. The integrated circuit of claim 1 , wherein the multiple types include N-type and P-type, and wherein the first transistors include N-type metal-oxide-semiconductor (NMOS) transistors and P-type MOS (PMOS) transistors.

4. The integrated circuit of claim 3 , wherein the second transistors include NMOS transistors and PMOS transistors formed along with the first transistors.

5. The integrated circuit of claim 1 , wherein the process detector is configured to:

provide a digital 1-bit output when the second transistors detect process variation of the memory cells of the memory cell array; and

change a write pulse of a write operation associated with at least one memory cell of the memory cells based at least in part on the digital 1-bit output and detecting the process point of the memory cells skewing to the process corner of one or more process corners.

6. The integrated circuit of claim 1 , wherein detecting process variation includes detecting global complementary metal-oxide-semiconductor (CMOS) process variation of the memory cells of the memory cell array.

7. The integrated circuit of claim 1 , wherein detecting process variation comprises detecting a process point when the second transistors detect that process variation has skewed sufficiently to a slower/faster (SF) process corner of the one or more process corners.

8. The integrated circuit of claim 7 , wherein the SF process corner refers to slower N-type metal-oxide-semiconductor (NMOS) transistors of the first transistors and to faster P-type MOS (PMOS) transistors of the first transistors.

9. The integrated circuit of claim 1 , wherein detecting process variation comprises detecting a process point when the second transistors detect that process variation has skewed sufficiently to a faster/slower (FS) process corner of the one or more process corners.

10. The integrated circuit of claim 9 , wherein the FS process corner refers to faster N-type metal-oxide-semiconductor (NMOS) transistors of the first transistors and to slower P-type MOS (PMOS) transistors of the first transistors.

11. The integrated circuit of claim 1 , wherein the memory cells include static random access memory (SRAM) cells, and wherein the memory cell array includes an SRAM cell array.

12. A device, comprising:

memory circuitry having a plurality of memory cells that are implemented with first transistors of an N-type and a P-type; and

process sensing circuitry having a process detector that is implemented with second transistors of the N-type and the P-type,

wherein the second transistors of the process detector are arranged for detecting process variation of the first transistors based at least in part on detecting a process point of the memory cells skewing to a process corner of on one or more process corners.

13. The device of claim 12 , wherein the second transistors are fabricated at a same manufacturing time when the first transistors are fabricated.

14. The device of claim 12 , wherein the process detector is configured to:

generate a digital 1-bit output when the second transistors detect process variation of the first transistors; and

change a write pulse of a write operation associated with at least one memory cell of the memory cells based at least in part on the digital 1-bit output and detecting the process point of the memory cells skewing to the process corner of one or more process corners.

15. The device of claim 12 , wherein detecting process variation comprises detecting a process point when the second transistors detect that process variation has skewed sufficiently to a slower/faster (SF) process corner of the one or more process corners.

16. The device of claim 15 , wherein the SF process corner refers to slower N-type transistors of the first transistors and to faster P-type transistors of the first transistors.

17. The device of claim 12 , wherein detecting process variation comprises detecting a process point when the second transistors detect that process variation has skewed sufficiently to a faster/slower (FS) process corner of the one or more process corners.

18. The device of claim 17 , wherein the FS process corner refers to faster N-type transistors of the first transistors and to slower P-type transistors of the first transistors.

19. The device of claim 12 , wherein the memory circuitry is implemented with static random access memory (SRAM) circuitry, and wherein the plurality of memory cells include SRAM cells.

20. A method, comprising:

fabricating memory circuitry with a plurality of memory cells that are implemented with first transistors of complementary types; and

fabricating process sensing circuitry with a process detector that is implemented with second transistors of the complementary types,

wherein the second transistors of the process detector are arranged for detecting process variation of the first transistors based at least in part on detecting a process point of the memory cells skewing to a process corner of one or more process corners.