Lithographic apparatus and device manufacturing method
A lithographic apparatus with a cover plate formed separately from a substrate table, the cover plate configured to be to a side of the substrate during exposure, the cover plate being removable from the substrate table and supported on the substrate table by a protrusion. The lithographic apparatus further includes a linear encoder system configured to measure at least translation of the substrate table, a part of the linear encoder system being on the substrate table and located outward of the cover plate.
1. A lithographic apparatus, comprising:
a substrate table arranged to support a substrate;
a projection system configured to project a modulated radiation beam onto a substrate;
a liquid supply system configured to provide a liquid in a region between the projection system and the substrate during exposure;
a cover plate configured to be to a side of the substrate during exposure, the cover plate being removable from the substrate table and supported on the substrate table by a protrusion; and
a linear encoder system configured to measure at least translation of the substrate table, a part of the linear encoder system being on the substrate table and located outward of the cover plate.
2. The lithographic apparatus of claim 1 , wherein the substrate table comprises a two-dimensional array of protrusions, the array of protrusions arranged to extend under the cover plate.
3. The lithographic apparatus of claim 2 , wherein the protrusions extend under the substrate when supported by the substrate table and wherein the tops of the plurality of protrusions under the cover plate and the substrate are arranged in a substantially flat plane.
4. The lithographic apparatus of claim 1 , wherein the cover plate surrounds the substrate.
5. The lithographic apparatus of claim 1 , wherein the substrate table comprises a heater configured to heat at least part of the substrate table.
6. The lithographic apparatus of claim 1 , further comprising a reflective surface on an upper surface of the substrate table, the cover plate, or both.
7. The lithographic apparatus of claim 1 , wherein the protrusion has a lower thermal conductance than the cover plate.
8. The lithographic apparatus of claim 1 , wherein an open gap separates the part of the encoder system and the cover plate.
9. A lithographic apparatus, comprising:
a substrate table arranged to support a substrate, the substrate table comprising a heater configured to heat at least part of the substrate table and comprising an array of protrusions at an upper surface;
a projection system configured to project a modulated radiation beam onto a substrate;
a liquid supply system configured to provide a liquid in a region between the projection system and the substrate during exposure;
a cover plate arranged to have an upper surface to be co-planar with the substrate when supported on the substrate table, the cover plate being removable from the substrate table and supported on the protrusions; and
a linear encoder system configured to measure at least translation of the substrate table, a part of the linear encoder system being on the substrate table and located outward of the cover plate.
10. The lithographic apparatus of claim 9 , further comprising a reflective surface on an upper surface of the substrate table, the cover plate, or both.
11. The lithographic apparatus of claim 9 , wherein the protrusions have a lower thermal conductance than the cover plate.
12. The lithographic apparatus of claim 9 , wherein the protrusions extend under the substrate when supported by the substrate table and wherein the tops of the plurality of protrusions under the cover plate and the substrate are arranged in a substantially flat plane.
13. The lithographic apparatus of claim 9 , wherein the cover plate surrounds the substrate.
14. The lithographic apparatus of claim 9 , wherein an open gap separates the part of the encoder system and the cover plate.
15. A lithographic apparatus, comprising:
a substrate table arranged to support a substrate;
a projection system configured to project a modulated radiation beam onto a substrate;
a liquid supply system configured to provide a liquid in a region between the projection system and the substrate during exposure;
a cover plate arranged to have an upper surface to be co-planar with the substrate when supported on the substrate table, the cover plate being removable from the substrate table and having an arrangement configured to reduce heat transfer between the substrate table and the cover plate; and
a linear encoder system configured to measure at least translation of the substrate table, a part of the linear encoder system being on the substrate table and located outward of the cover plate.
16. The lithographic apparatus of claim 15 , comprising a two-dimensional array of burls located between the cover plate and the substrate table.
17. The lithographic apparatus of claim 15 , comprising a reflective surface on an upper surface of the substrate table, the cover plate, or both.
18. The lithographic apparatus of claim 15 , wherein the arrangement comprises a structure between the cover plate and the substrate table having a lower thermal conductance than the cover plate.
19. The lithographic apparatus of claim 15 , wherein the substrate table comprises a heater configured to heat at least part of the substrate table.
20. The lithographic apparatus of claim 15 , wherein an open gap separates the part of the encoder system and the cover plate.