Memory device correcting data error of weak cell

1. A memory device comprising:

a plurality of memory cells;

a weak cell information storage unit suitable for storing a weak address and parity information corresponding to at least one weak cell having a shorter data retention time than a reference time, among the plurality of memory cells, and generating a weak signal based on the weak address and inputted addresses;

an error correction code (ECC) circuit suitable for generating the parity information of the at least one weak cell to store in the weak cell information storage unit, and correcting an error bit of the at least one weak cell using the parity information stored in the weak cell information storage unit, among the plurality of memory cells, in response to the weak signal; and

a refresh control unit suitable for controlling the plurality of memory cells to be refreshed at a cycle equal to or more than the reference time.

2. The memory device of claim 1 , wherein the ECC circuit generates the parity information by ECC encoding write data corresponding to the at least one weak cell, among the plurality of memory cells, in response to the weak signal, during a write operation.

3. The memory device of claim 1 , wherein the ECC circuit generates error-corrected data by ECC decoding read data outputted from the at least one weak cell and the parity information in response to the weak signal, during a read operation.

4. The memory device of claim 1 , wherein when reading data of memory cells other than the at least one weak cell among the plurality of memory cells, the memory device outputs the data without delaying the data.

5. The memory device of claim 4 , further comprising:

a first data path that passes through the ECC circuit during a read or write operation;

a second data path that bypass the ECC circuit during a read or write operation; and

a path selection unit suitable for selecting the first data path to transfer data inputted to or outputted from the at least one weak cell, and selecting the second data path to transfer data inputted to or outputted from the memory cells other than the at least one weak cell.

6. The memory device of claim 1 , wherein when reading data of memory cells other than the at least one weak cell, the memory device delays the data of the memory cells other than the at least one weak cell by an operation time of the ECC circuit.

7. The memory device of claim 6 , further comprising:

a first data path that passes through the ECC circuit during a read or write operation;

a second data path that bypass the ECC circuit during a read or write operation; and

a path selection unit suitable for selecting the first data path to transfer data inputted to or outputted from the at least one weak cell, selecting the second data path to transfer data inputted to or outputted from the memory cells other than the at least one weak cell, and delaying the data inputted to or outputted from the memory cells other than the at least one weak cell by the operation time of the ECC circuit.

8. The memory device of claim 1 , wherein the weak cell information storage unit comprises:

a first region suitable for storing a row address of the at least one weak cell;

a second region suitable for storing a column address of the at least one weak cell; and

a third region suitable for storing the parity information of the at least one weak cell.

9. A memory device comprising:

a plurality of memory cells;

at least one redundancy cell;

a weak cell information storage unit suitable for storing a weak address and parity information corresponding to at least one weak cell having a shorter data retention time than a reference time, among the plurality of memory cells, and repair information corresponding to all or part of the at least one weak cell, and generating a weak signal based on the weak address and inputted addresses;

an error correction code (ECC) circuit suitable for generating the parity information of the at least one weak cell to store in the weak cell information storage unit, and correcting an error bit of the at least one weak cell using the parity information stored in the weak cell information storage unit, among the plurality of memory cell, in response to the weak signal;

a refresh control unit suitable for controlling the plurality of memory cells to be refreshed at a cycle equal to or more than the reference time; and

a repair control unit suitable for replacing a weak cell corresponding to the repair information among the at least one weak cell with the at least one redundancy cell, in response to the repair information.

10. The memory device of claim 9 , wherein the weak cell information storage unit stores repair information of a weak cell having an error bit which cannot be corrected by the ECC circuit, among the at least one weak cell.

11. The memory device of claim 9 , wherein the repair information of the at least one weak cell comprises an address of the at least one weak cell.

12. The memory device of claim 9 , wherein the repair information of the at least one weak cell comprises one bit indicating whether the at least one weak cell is repaired.

13. The memory device of claim 9 , wherein the ECC circuit generates the parity information by ECC encoding write data corresponding to the at least one weak cell, among the plurality of memory cell, in response to the weak signal, during a write operation.

14. The memory device of claim 9 , wherein the ECC circuit generates error-corrected data by ECC decoding the parity information and read data outputted from the at least one weak cell in response to the weak signal, during a read operation.

15. The memory device of claim 9 , wherein when reading data of memory cells other than the at least one weak cell among the plurality of memory cells, the memory device outputs the data without delaying the data.

16. The memory device of claim 9 , wherein when reading data of memory cells other than the at least one weak cell, the memory device delays the data of the memory cells other than the at least one weak cell by an operation time of the ECC circuit.

17. The memory device of claim 9 , wherein the weak cell information storage unit comprises:

a first region suitable for storing a row address of the at least one weak cell;

a second region suitable for storing a column address of the at least one weak cell;

a third region suitable for storing the parity information of the at least one weak cell; and

a fourth region suitable for storing the repair information of the at least one weak cell.