Mask for deposition system and method for using the mask
Embodiments of the disclosure provide methods and apparatus for monitoring film properties on a substrate in-situ. In one embodiment, a deposition system is provided. The deposition system includes at least two deposition chambers, and a patterned mask designed specifically for each of the deposition chambers, wherein a first mask of the patterned masks has a first opening formed therethrough outside of a pattern formed thereon, and a second mask of the patterned masks has a first opening formed therethrough outside of a pattern formed thereon, the first opening of the second mask having a position on the second mask that is different than a position of the first opening on the first mask.
1. A deposition system, comprising:
at least two deposition chambers; and
a patterned mask for each of the deposition chambers, wherein:
a first mask of the patterned masks has a first opening formed through a peripheral edge region of the first mask outside of a pattern formed thereon;
a second mask of the patterned masks has a first opening formed through a peripheral edge region of the second mask outside of a pattern formed thereon, the first opening of the second mask having a position on the second mask that is different than a position of the first opening on the first mask; and
a monitoring device is coupled to one of the at least two deposition chambers, the monitoring device positioned to view the peripheral edge region of one of the first mask or the second mask, the monitoring device adapted to monitor a thickness of a film deposited through the openings in the masks.
2. The system of claim 1 , wherein the second mask has a second opening on the peripheral edge thereof at a position that is different than the position of the first opening of the second mask.
3. The system of claim 2 , wherein the second opening of the second mask corresponds to the position of the first opening of the first mask.
4. The system of claim 1 , further comprising:
a third deposition chamber; and
a third mask of the patterned masks has a first opening formed through a peripheral edge region of the third mask outside of a pattern formed thereon, the first opening of the third mask having a position on the third mask that is different than the positions of the first openings of the first and second masks.
5. The system of claim 4 , wherein the third mask has a second opening on the peripheral edge thereof at a position that is different than the position of the first opening of the third mask.
6. The system of claim 5 , wherein the first opening of the third mask corresponds to the position of the first opening of the first mask.
7. The system of claim 5 , wherein the third mask includes a third opening on the peripheral edge thereof adjacent to the second opening of the third mask.
8. The system of claim 7 , wherein the second opening of the third mask corresponds to the position of the second opening of the second mask.
9. The system of claim 4 , wherein the first opening of the third mask corresponds to the position of the first opening of the second mask.
10. The system of claim 1 , wherein the first mask and the second mask each include a second opening opposing the respective first openings.
11. The system of claim 10 , wherein each of the first openings and the respective second openings of each mask are aligned.
12. A deposition system, comprising:
a plurality of deposition chambers; and
a patterned mask dedicated to each of the deposition chambers, wherein:
a first mask of the patterned masks has a first opening formed through a peripheral edge region of the first mask outside of a pattern formed thereon;
a second mask of the patterned masks has a first opening formed through a peripheral edge region of the second mask outside of a pattern formed thereon, the first opening of the second mask having a position on the second mask that is different than a position of the first opening on the first mask;
a third mask of the patterned masks has a first opening formed through a peripheral edge region of the third mask outside of a pattern formed thereon, the first opening of the third mask having a position on the third mask that is different than the positions of the first openings of the first and second masks; and
a monitoring device is coupled to one of the plurality of deposition chambers, the monitoring device positioned to view the peripheral edge region of one of the first mask, the second mask, or the third mask, the monitoring device adapted to monitor properties of a film deposited through openings in the masks.
13. The system of claim 12 , wherein the second mask has a second opening on the peripheral edge thereof at a position that is different than the position of the first opening of the second mask.
14. The system of claim 13 , wherein the second opening of the second mask corresponds to the position of the first opening of the first mask.
15. The system of claim 12 , wherein the third mask has a second opening on the peripheral edge thereof at a position that is different than the position of the first opening of the third mask.
16. The system of claim 15 , wherein the first opening of the third mask corresponds to the position of the first opening of the first mask.
17. The system of claim 15 , wherein the third mask includes a third opening adjacent to the second opening of the third mask.
18. The system of claim 17 , wherein the second opening of the third mask corresponds to the position of the second opening of the second mask.
19. The system of claim 17 , wherein the first opening of the third mask corresponds to the position of the first opening of the second mask.