Detection assembly, system and method

1. An electron detector assembly configured for detecting electrons emitted from a sample irradiated by an electron beam, comprising:

a scintillator comprising a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon;

a light guide plate coupled to the scintillator layer and comprising a peripheral surface, wherein the light guide plate is formed as an annular disk; and

a single or plurality of silicon photomultiplier devices, each device formed with a photomultiplication surface, the silicon photomultiplier device being positioned upon the peripheral surface and arranged with its photomultiplication surface perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from an electron impinging upon the scintillator layer.

2. An electron detector assembly according to claim 1 , wherein the electrons comprise at least one of backscatter electrons (BSE), secondary electrons (SE), tertiary electrons (SE3) or a combination thereof.

3. An electron detector assembly according to claim 2 , wherein the SE comprise accelerated SE.

4. An electron detector assembly according to claim 1 , wherein the light guide plate is formed with a central bore to allow the electron beam to propagate therethrough.

5. An electron detector assembly according to claim 4 , wherein the central bore is formed with an internal perpendicular wall in respect to the scintillator layer.

6. An electron detector assembly according to claim 4 , wherein the central bore is formed with an internal inclined wall in respect to the scintillator layer.

7. An electron detector assembly according to claim 4 , wherein the central bore is formed with an internal wall coated with a partial or complete reflective/diffusive layer.

8. An electron detector assembly according to claim 1 , wherein an additional silicon photomultiplier device is positioned on a top surface of the electron detector assembly and arranged parallel to the scintillator layer.

9. An electron detector assembly according to claim 1 , wherein the assembly comprises a top surface, the assembly is formed with a partial or complete reflective/diffusive coating at least one of the peripheral surface and the top surface or a combination thereof.

10. An electron detector assembly according to claim 1 , wherein the assembly is configured to facilitate detection of a spatial location of the electrons according to the spatial location of an input signal generated by electrons impinging upon the scintillator layer.

11. An electron detector assembly according to claim 1 , wherein a voltage supplier is provided to bias the scintillator layer relative to the sample thereby accelerating secondary electrons (SE) to the detector assembly, or tertiary electrons (SE3) to the detector assembly or a combination thereof.

12. An electron detector assembly according to claim 1 , wherein the assembly is positioned intermediate a pole piece of an electron beam column and the sample.

13. An electron detector assembly according to claim 1 , wherein the assembly is positioned within an electron beam column.

14. An electron detector assembly according to claim 1 , wherein a central bore of the detector assembly is positioned in alignment with the electron beam.

15. An electron detector assembly according to claim 1 , wherein the assembly is positioned at a lateral distance away and off-axis from an electron beam column.

16. An electron detector assembly according to claim 1 , wherein the assembly is configured to detect ions emitted from the sample.

17. An electron detection system, comprising:

an electron beam irradiating a sample;

an electron detector assembly for detecting electrons emitted from the sample comprising:

a scintillator comprising a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon;

a light guide plate coupled to the scintillator and comprising a peripheral surface, wherein the light guide plate is formed as an annular disk; and

a single or plurality of silicon photomultiplier devices, each formed with a photomultiplication surface, the silicon photomultiplier device being positioned upon the peripheral surface and arranged with its photomultiplication surface perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from electrons impinging upon the scintillator layer.

18. An electron detection system according to claim 17 , wherein the electrons comprise at least one of backscatter electrons (BSE), secondary electrons (SE), tertiary electrons (SE3) or a combination thereof.

19. An electron detection system according to claim 17 , wherein the electron detector assembly is formed with a central bore and the central bore is formed with an internal inclined wall in respect to the scintillator layer.

20. A method for detecting electrons emitted from a sample irradiated by an electron beam, comprising:

irradiating a sample by an electron beam;

providing an electron detector assembly comprising:

a scintillator comprising a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon;

a light guide plate coupled to the scintillator and comprising a peripheral surface, wherein the light guide plate is formed as an annular disk; and

a single or plurality of silicon photomultiplier devices, each device formed with a photomultiplication surface, the silicon photomultiplier device being positioned upon the peripheral surface and arranged with its photomultiplication surface perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from electrons impinging upon the scintillator layer,

thereby detecting electrons emitted from the sample.

21. An electron detector assembly configured for detecting electrons emitted from a sample irradiated by an electron beam emanating from an electron beam column and forming a beam path along a beam axis, comprising:

a scintillator comprising a scintillator layer, the scintillator layer emitting photons corresponding to impingement of the electrons thereupon;

a light guide plate coupled to the scintillator layer and comprising a peripheral surface, wherein the light guide plate is formed as an annular disk; and

at least one microcell of a tubeless silicon photomultiplier device, each microcell being positioned upon the peripheral surface and arranged perpendicularly or obliquely relative to the scintillating surface, the microcell being configured to:

detect at least a single photon propagating angularly in respect to the beam axis, and

yield an electrical signal from the photon impinging thereon.