IP Library Granted Patent US 10,248,911
Granted Patent B2
US 10,248,911 · App. 15/520,108 · Granted Apr 2, 2019

Ion trapping device with insulating layer exposure prevention and method for manufacturing same

Inventors: Taehyun Kim (Seoul, KR); Dongil Cho (Seoul, KR); Seokjun Hong (Seoul, KR); Minjae Lee (Seoul, KR); Hongjin Cheon (Seoul, KR)
Assignees: ID QUANTIQUE; SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
G06N99/002H01J3/00H01L49/006H01J49/0018
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Quick Facts
Patent No.
US 10,248,911
App. No.
15/520,108
Granted
Apr 2, 2019
Kind
B2
Abstract

An ion trap device is provided as well as a method of manufacturing the ion trap device including a substrate, central DC electrode, RF electrode, side electrode and an insulating layer. Disposed over the substrate, the central DC electrode includes DC connector pad and DC rail connected thereto. The RF electrode includes RF rail adjacent to the DC rail and RF pad connected to RF rail. The side electrode has RF electrode disposed between thereof and the central DC electrode. The insulating layer supports one of the central DC electrode, RF electrode and side electrode, on a top surface of the substrate. The insulating layer includes first insulating layer and second insulating layer disposed over the first insulating layer, and the second insulating layer includes an overhang protruding with respect to the first insulating layer in a width direction of the ion trap device.

Claims (25)

1. An ion trap device, comprising:

a substrate;

at least one central DC electrode disposed over the substrate and comprising:

a DC connector pad, and

a DC rail connected to the DC connector pad;

an RF electrode disposed over the substrate and comprising:

at least one RF rail located adjacent to the DC rail, and

an RF pad connected to the at least one RF rail;

at least one side electrode disposed over the substrate with the RF electrode disposed between the central DC electrode and the side electrode; and

a plurality of insulating layers configured to support at least one of the central DC electrode, the RF electrode or the side electrode, on a top surface of the substrate,

wherein

the plurality of insulating layers includes a first insulating layer and a second insulating layer disposed over the first insulating layer,

the second insulating layer includes an insulating overhang that protrudes with respect to the first insulating layer in a width direction of the ion trap device, and

the insulating overhang comprises at least one bottom side, substantially parallel to the substrate, and a lateral sidewall, substantially perpendicular to the substrate,

wherein the lateral sidewall of the insulating overhang has a conductive film formed thereon, and

wherein the bottom side has no conductive film formed thereon.

2. The ion trap device of claim 1 , wherein

the central DC electrode comprises a first central DC electrode having a first DC rail and a second central DC electrode having a second DC rail,

the first DC rail and the second DC rail are spaced apart from each other to form a trap region therebetween, and

an entire thickness of the substrate is removed at a region corresponding to the trap region.

3. The ion trap device of claim 2 , wherein the second insulating layer that supports the electrode close to the trap region includes the insulating overhang.

4. The ion trap device of claim 2 , wherein the insulating overhang protrudes in a direction heading for the trap region.

5. The ion trap device of claim 1 , wherein the at least one side electrode includes a plurality of side electrodes disposed at predetermined intervals in a longitudinal direction of the RF electrode.

6. The ion trap device of claim 1 , wherein

the conductive file is electrically connected to an electrode conductive film.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2019
From: ID QUANTIQUE
To: ID QUANTIQUE; SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
Reel/Frame 048217/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2019
From: SK TELECOM CO., LTD.; SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
To: ID QUANTIQUE
Reel/Frame 048018/0034 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2017
From: KIM, TAEHYUN; CHO, DONGIL; HONG, SEOKJUN; LEE, MINJAE; CHEON, HONGJIN
To: SK TELECOM CO., LTD.; SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
Reel/Frame 042059/0829 →
Priority Claims (1)
KR 10-2014-0150078 · Oct 31, 2014 · national
Continuity (2)
Continuation PCTKR2015011581 · Oct 30, 2015
Related Publication 20170316335A1 · Nov 2, 2017