IP Library Granted Patent US 10,249,750
Granted Patent B2
US 10,249,750 · App. 15/966,879 · Granted Apr 2, 2019

Semiconductor device

Inventors: Sung-Bum Bae (Daejeon, KR); Sung Bock Kim (Daejeon, KR)
Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
H01L29/7787H01L21/762H01L29/0657H01L29/2003H01L29/66462H01L29/7786
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Quick Facts
Patent No.
US 10,249,750
App. No.
15/966,879
Granted
Apr 2, 2019
Kind
B2
Abstract

A semiconductor device includes a first semiconductor layer. A second semiconductor layer is disposed on the first semiconductor layer. A structure layer is disposed on the second semiconductor layer. A metal film covers a side surface of the first semiconductor layer, a side surface of the second semiconductor layer, and an upper surface of the structure layer. A flexible substrate covers the metal film.

Claims (13)

1. A semiconductor device, comprising:

a first semiconductor layer;

a second semiconductor layer disposed on the first semiconductor layer;

a structure layer disposed on the second semiconductor layer;

a metal film covering a side surface of the first semiconductor layer, a side surface of the second semiconductor layer, and an upper surface of the structure layer; and

a flexible substrate covering the metal film,

wherein a width of the first semiconductor layer is smaller than a width of the second semiconductor layer,

wherein the width of the second semiconductor layer is smaller than a width of the structure layer.

2. The semiconductor device of claim 1 , wherein side surfaces of the first semiconductor layer, the second semiconductor layer, and the structure layer form a shape tapered in a direction from the structure layer to the first semiconductor layer.

3. The semiconductor device of claim 1 , wherein the structure layer comprises:

source/drain electrodes arranged on an upper surface of the second semiconductor layer;

a gate electrode disposed on the second semiconductor layer, the gate electrode spaced apart from the source/drain electrodes; and

a protective layer covering the source/drain electrodes and the gate electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 30, 2018
From: BAE, SUNG-BUM; KIM, SUNG BOCK
To: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Reel/Frame 045671/0964 →
Priority Claims (1)
KR 10-2016-0095728 · Jul 27, 2016 · national
Continuity (2)
Division 15591643 · May 10, 2017
Related Publication 20180254337A1 · Sep 6, 2018
Cited By (1)
US 12,740,121