X-ray phase-contrast imaging system and imaging method
The present disclosure relates to X-ray imaging systems and methods. An exemplary system may comprise a distributed X-ray source arrangement, a fixed grating module, an X-ray detecting device, and a computer workstation. In one illustrative implementation, X-ray sources of the distributed incoherent X-ray source arrangement may sequentially generate and emit X-rays to an object to be detected. Further, for each exposure, the X-ray detecting device may receive the X-rays, wherein after a series of stepping exposures and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve; the intensity curve may be compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel may be obtained from a variation of the intensity curves; and image information of the object to be detected may be obtained according to such pixel values.
1. An X-ray phase-contrast imaging system, comprising:
a distributed incoherent X-ray source arrangement;
a fixed grating module, comprising a first grating and a second grating which are disposed in parallel to each other and are fixed relative to each other; and
an X-ray detecting device.
2. The X-ray phase-contrast imaging system according to claim 1 , wherein
X-ray sources of the distributed incoherent X-ray source arrangement are arranged in a direction perpendicular to both an X-ray propagation direction and a grating strip direction.
3. The X-ray phase-contrast imaging system according to claim 2 , wherein
the X-ray phase-contrast imaging system further comprises a computer workstation, which is configured to control the distributed incoherent X-ray source arrangement and the X-ray detecting device such that:
the X-ray sources of the distributed incoherent X-ray source arrangement sequentially generate X-rays to emit X-rays to an object to be detected;
for each exposure, the X-ray detecting device receives the X-rays, wherein after a series of stepping exposures of the distributed incoherent X-ray source arrangement and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve;
the intensity curve at each pixel spot on the X-ray detecting device is compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel is obtained from a variation of the intensity curves; and
an image of the object to be detected is reconstructed from the obtained pixel values.
4. The X-ray phase-contrast imaging system according to claim 3 , further comprising: an actuation device for, under the control of computer workstation, enabling the object to be detected to rotate by an angle relative to other parts of the X-ray imaging system.
5. The X-ray phase-contrast imaging system according to claim 4 , wherein at each rotation angle, the phase stepping and exposure actions are repeated, and then an image of the object to be detected is reconstructed according to a predetermined CT image reconstruction algorithm.
6. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation comprises: a data processing module, for processing data information and calculating pixel values at respective spots on the object to be detected; an image reconstruction module, for reconstructing an image of the object to be detected based on the calculated pixel values; and a control module, for controlling the distributed X-ray source arrangement and the X-ray detecting device.
7. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation comprises: a display unit for displaying the image of the object to be detected.
8. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation is configured to calculate refraction information of X-rays at a predetermined spot on the object to be detected by comparing the intensity curve with the presence of the object to be detected to the intensity curve in the absence of the object to be detected, and thus calculate corresponding pixel value.
9. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation is configured to calculate scattering information of X-rays at a predetermined spot on the object to be detected by comparing the intensity curve with the presence of the object to be detected to the intensity curve in the absence of the object to be detected, and thus calculate corresponding pixel value.
10. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation is configured to calculate attenuation information of X-rays at a predetermined spot on the object to be detected by comparing the intensity curve with the presence of the object to be detected to the intensity curve in the absence of the object to be detected, and thus calculate corresponding pixel value.
11. The X-ray phase-contrast imaging system according to claim 3 , wherein the computer workstation is configured to calculate refraction information, scattering information and attenuation information of X-rays at a predetermined spot on the object to be detected by comparing the intensity curve with the presence of the object to be detected to the intensity curve in the absence of the object to be detected, and thus calculate corresponding pixel value.
12. The X-ray phase-contrast imaging system according to claim 1 , wherein the distributed incoherent X-ray source arrangement uses carbon nanotubes as its electron sources.
13. The X-ray phase-contrast imaging system according to claim 1 , wherein the periods of the first grating and second grating are between 0.1 and 30 μm.
14. An X-ray imaging method, comprising:
sequentially generating, by X-ray sources of a distributed incoherent X-ray source arrangement, X-rays to emit X-rays to an object to be detected;
each time the distributed incoherent X-ray source arrangement emits X-rays, forming an X-ray signal with varying intensities from the X-rays, which are refracted by the object to be detected and then pass through a first absorption grating and a second absorption grating;
by an X-ray detecting device, receiving the X-ray signal with varying intensities and converting the received X-ray signal into an electrical signal;
acquiring, from the converted electrical signal in a multi-period sampling manner, refraction angle information when the X-rays passed through the object, and obtaining pixel values of the object according to a predetermined algorithm; and
reconstructing an image of the object to be detected from the obtained pixel values.
15. The X-ray imaging method according to claim 14 , further comprising:
rotating the object to be detected, wherein at each rotation angle, the X-ray sources of the distributed incoherent X-ray source arrangement sequentially generates X-rays to emit X-rays to the object to be detected, and reconstructing an image of the object to be detected according to a predetermined CT image reconstruction algorithm.
16. The X-ray imaging method according to claim 14 , wherein calculating refraction information of X-rays at a predetermined spot on the object to be detected by comparing an intensity curve with the presence of the object to be detected to a background intensity curve in the absence of the object to be detected, and thus calculating corresponding pixel value.
17. The X-ray imaging method according to claim 14 , wherein calculating scattering information of X-rays at a predetermined spot on the object to be detected by comparing an intensity curve with the presence of the object to be detected to a background intensity curve in the absence of the object to be detected, and thus calculating corresponding pixel value.
18. The X-ray imaging method according to claim 14 , wherein
calculating attenuation information of X-rays at a predetermined spot on the object to be detected by comparing an intensity curve with the presence of the object to be detected to a background intensity curve in the absence of the object to be detected, and thus calculating corresponding pixel value.
19. The X-ray imaging method according to claim 14 , wherein calculating refraction information, scattering information and attenuation information of X-rays at a predetermined spot on the object to be detected by comparing an intensity curve with the presence of the object to be detected to a background intensity curve in the absence of the object to be detected, and thus calculating corresponding pixel value.
20. An X-ray imaging method, which performs X-ray imaging of an object by using an X-ray imaging system, wherein the X-ray imaging system comprises: a distributed incoherent X-ray source arrangement, a fixed grating module, an X-ray detecting device and a computer workstation, the X-ray imaging method comprising the following steps:
sequentially generating, by X-ray sources of the distributed X-ray source arrangement, X-rays to emit X-rays to an object to be detected;
for each exposure, receiving the X-rays by the X-ray detecting device, wherein after a series of stepping exposures of the distributed X-ray source arrangement and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve;
comparing the intensity curve at each pixel spot on the X-ray detecting device to an intensity curve in the absence of the object to be detected, and obtaining a pixel value at each pixel from a variation of the intensity curves; and
reconstructing an image of the object to be detected according to the obtained pixel values.