Package structure with dummy die
A package structure and method for forming the same are provided. The package structure includes a package component, and a device die formed over the package component. The device die includes a device substrate and a conductive pad over the device substrate, and the device die has a first height. The package structure also includes a dummy die formed over the package component and adjacent to the device die, and the dummy die has a second height smaller than the first height.
1. A package structure, comprising:
a package component;
a device die formed over the package component, wherein the device die comprises a device substrate and a conductive pad over the device substrate, and the device die has a first height; and
a dummy die formed over the package component and adjacent to the device die, wherein the dummy die has a second height smaller than the first height.
2. The package structure as claimed in claim 1 , further comprising:
a buffer layer formed below the dummy die, wherein a bottom surface of the buffer layer is higher than a bottom surface of the device die.
3. The package structure as claimed in claim 1 , further comprising:
a through via formed adjacent to the device die, wherein the through via has a third height, the third height is higher than the first height; and
a package layer formed between the through via and the device die.
4. The package structure as claimed in claim 3 , wherein the package component comprises a redistribution structure formed below the package layer, wherein the redistribution structure is electrically connected to the device die.
5. The package structure as claimed in claim 1 , wherein a height ratio of the second height to the first height is in a range from about 65% to about 85%.
6. The package structure as claimed in claim 1 , wherein a coefficient of thermal expansion (CTE) of the dummy die is substantially identical to a coefficient of thermal expansion (CTE) of the device die.
7. The package structure as claimed in claim 1 , further comprising:
a through via formed adjacent to the device die; and
a second package structure formed below the device die, wherein the second package structure is electrically connected to the through via.
8. A package structure, comprising:
a redistribution structure having a first side and a second side;
a first device die arranged on the first side of the redistribution structure and electrically connected to the redistribution structure, wherein the first device die defines a first thickness;
a first dummy die arranged on the first side of the redistribution structure and adjacent to the first device die, wherein the first dummy die defines a second thickness smaller than the first thickness; and
a first package layer surrounding the first device die and the first dummy die.
9. The package structure as claimed in claim 8 , further comprising:
a through via formed adjacent to the first device die, wherein a top surface of the through via is leveled with a top surface of the first device die.
10. The package structure as claimed in claim 9 , further comprising:
a second package structure formed below the device die, wherein the second package structure is electrically connected to the through via.
11. The package structure as claimed in claim 8 , wherein a top surface of the first device die and a top surface of the first dummy die are substantially coplanar.
12. The package structure as claimed in claim 8 , wherein the first dummy die is separated from the redistribution structure by the first package layer.
13. The package structure as claimed in claim 8 , wherein a coefficient of thermal expansion (CTE) of the first dummy die is the same as a coefficient of thermal expansion (CTE) of the first device die.
14. The package structure as claimed in claim 8 , further comprising:
a second device die formed below the first package layer; and
a second dummy die formed adjacent to the second device die.
15. The package structure as claimed in claim 14 , further comprising:
a second package layer formed between the second device die and the second dummy die, wherein a bottom surface of the second dummy die is covered by the second package layer.
16. A package structure, comprising:
a first package structure, comprising:
a first redistribution structure having a first side and a second side;
a first device die arranged over the first side of the redistribution structure;
a first dummy die arranged over the first side of the first redistribution structure; and
a first package layer surrounding the first device die and the first dummy die, wherein a surface of the first dummy die facing away the first redistribution structure is covered by the first package layer; and
a second package structure, comprising:
a second redistribution structure formed over the first package layer.
17. The package structure as claimed in claim 16 , further comprising:
a through via formed adjacent to the first device die, wherein the through via is electrically connected to the first redistribution structure, and the second redistribution structure is electrically connected to the first device die.
18. The package structure as claimed in claim 16 , further comprising:
a second dummy die formed over the second redistribution structure, wherein the first device die has a first height, the first dummy die has a second height, and the second height is smaller than the first height.
19. The package structure as claimed in claim 16 , further comprising:
a buffer layer formed below a bottom surface of the first dummy die, wherein the buffer layer is formed between the first dummy die and the first package layer.
20. The package structure as claimed in claim 16 , further comprising:
a third package structure formed above the second package structure, wherein the second package structure is formed between the first package structure and the third package structure.