IP Library › Granted Patent US 10,278,273
Granted Patent B2
US 10,278,273 · App. 15/198,179 · Granted Apr 30, 2019

X-ray generator and X-ray analyzer

Inventor: Takao Marui (Kyoto, JP)
Assignee: SHIMADZU CORPORATION
H05G1/025G01N23/2076
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Quick Facts
Patent No.
US 10,278,273
App. No.
15/198,179
Granted
Apr 30, 2019
Kind
B2
Abstract

A heat pump is used to cool an X-ray tube, and waste heat from the heat pump is used to heat a separate part (a spectroscope, for example). As a result, the X-ray tube can be cooled using the heat pump, and the waste heat from the heat pump resulting from the cooling thereof can be used to heat a separate part. In this way, by heating a separate part using the waste heat from the heat pump, it is possible to effectively utilize heat generated from the X-ray tube so as to reduce the power consumption.

Claims (39)

1. An X-ray generator for generating X-rays, comprising:

an X-ray tube;

a heat pump being used to cool the X-ray tube, waste heat from the heat pump being used to heat a separate part; and

a processor configured to:

determine an amount of power supplied to the X-ray tube; and

control the heat pump based on the amount of power being supplied to the X-ray tube.

2. An X-ray analyzer for analyzing a sample using X-rays, comprising:

the X-ray generator according to claim 1 , wherein the X-rays generated by the X-ray generator are used to analyze the sample.

3. The X-ray analyzer according to claim 2 , wherein the separate part comprises a spectroscope for splitting light from a sample;

wherein waste heat from the heat pump is used to heat the spectroscope.

4. The X-ray analyzer according to claim 3 , wherein the waste heat from the heat pump is used to heat another separate part.

5. The X-ray analyzer according to claim 4 , wherein the other separate part comprises the sample, wherein waste heat from the heat pump is used to heat the sample.

6. The X-ray generator according to claim 1 , wherein the heat pump comprises:

a compressor that is configured to cool a cooling medium used to cool the X-ray tube; and

a radiator, that is connected to the compressor via piping, to radiate the waste heat from the compressor to heat the separate part.

7. An X-ray analyzer, comprising:

an X-ray tube;

a heat pump that is configured to cool the X-ray tube, wherein waste heat generated from the heat pump is used to heat a spectroscopic chamber of the X-ray analyzer;

a processor configured to:

determine an amount of power supplied to the X-ray tube; and

control the heat pump based on the amount of power being supplied to the X-ray tube.

8. The X-ray analyzer of claim 7 , wherein the heat pump comprises:

a compressor that is configured to provide a heating medium to a radiator via piping; and

the radiator that is configured to heat the spectroscopic chamber based on the heating medium being provided via the compressor.

9. The X-ray analyzer of claim 7 , further comprising:

a circulator configured to circulate a cooling medium to cool the X-ray tube; wherein

the heat pump is configured to absorb heat from the circulator.

10. The X-ray analyzer of claim 7 , wherein the processor is further configured to:

control a driving of a heater of the spectroscopic chamber based on a detection signal from a temperature sensor of the spectroscopic chamber.

11. The X-ray analyzer of claim 7 , wherein the processor is further configured to:

control a driving of an opening mechanism of the spectroscopic chamber to adjust a temperature of a spectroscope of the X-ray analyzer based on a detection signal from a temperature sensor of the spectroscopic chamber.

12. The X-ray analyzer of claim 7 , wherein the processor is further configured to:

control a driving of an air conditioner of the spectroscopic chamber based on a detection signal from a temperature sensor of the spectroscopic chamber.

13. The X-ray analyzer of claim 7 , wherein:

the heat pump comprises a first radiator and a second radiator; and

wherein the processor is further configured to:

adjust a driving of a flow rate adjustment part based on a detection signal from a temperature sensor of the spectroscopic chamber, wherein the flow rate adjustment part

adjusts a flow rate of a cooling medium to the first radiator and another flow rate of the cooling medium to the second radiator.

14. The X-ray analyzer of claim 13 , wherein the first radiator is disposed within the spectroscopic chamber, and the second radiator is disposed outside of the spectroscopic chamber.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2016
From: MARUI, TAKAO
To: SHIMADZU CORPORATION
Reel/Frame 039055/0749 →
Continuity (1)
Related Publication 20180007768A1 · Jan 4, 2018
Cited By (1)
US 12,517,070