IP Library › Granted Patent US 10,281,490
Granted Patent B2
US 10,281,490 · App. 14/769,782 · Granted May 7, 2019

Testing probe for testing liquid crystal screen and testing device comprising the same

Inventors: Xuepeng Wang (Beijing, CN); Zhaowei Yin (Beijing, CN)
Assignees: BOE TECHNOLOGY GROUP CO., LTD.; BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
G01R1/06716G02F1/1309
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Quick Facts
Patent No.
US 10,281,490
App. No.
14/769,782
Granted
May 7, 2019
Kind
B2
Abstract

A testing probe including a base, an elastic extensible element and a probe needle. The probe needle is disposed on the base through the elastic extensible element, and the elastic extensible element is in a stretched state. The testing probe requires only coating silver adhesive on the testing area of the liquid crystal screen previously, eliminating the need to make solder wire, fix solder wire, etc., thereby simplifying preparation before testing and ensuring reliable connections, which greatly reduces testing time and improves testing efficiency. A testing device including the above testing probe.

Claims (14)

1. A testing probe for testing a liquid crystal screen, comprising:

a base,

a plurality of non-coaxial elastic extensible elements; and

a probe needle disposed on the base through the elastic extensible elements, wherein one end of the probe needle is for being electrically connected to a detecting signal line of a testing device, and the other end of the probe needle is for being electrically connected to a testing area of the liquid crystal screen to collect signals from the testing area of the liquid crystal screen to test a parameter of the liquid crystal screen,

wherein at least one of the elastic extensible elements is in a stretched state.

2. The testing probe according to claim 1 , wherein the probe needle contacts the base under effect of tension of the elastic extensible elements.

3. The testing probe according to claim 2 , wherein the base has a depression, and the elastic extensible elements are disposed at the depression.

4. The testing probe according to claim 3 , wherein the depth of the depression is larger than the height of the elastic extensible elements in a nature state.

5. The testing probe according to claim 4 , wherein the longitudinal section of the base is of an L-like shape or is concave.

6. The testing probe according to claim 1 , wherein the plurality of elastic extensible elements comprise a first elastic extensile element stretched and a second elastic extensile element compressed, the probe needle is disposed on the base through the first elastic extensile element stretched and the second elastic extensile element compressed.

7. The testing probe according to claim 1 , wherein the probe needle includes a needle rod portion and a needle head portion, and the range of the angle between the needle rod portion and the needle head portion is from 90 degree to 160 degree.

8. The testing probe according to claim 1 , wherein the needle tip of the probe needle is at the same level with the bottom of the base or below the level.

9. The testing probe according to claim 1 , further including a probe needle carrier for carrying the probe needle, and through the probe needle carrier, the probe needle connects with the elastic extensible elements and is disposed on the base.

10. A testing device, including the testing probe according to claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2015
From: WANG, XUEPENG; YIN, ZHAOWEI
To: BOE TECHNOLOGY GROUP CO., LTD.; BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 036394/0863 →
Priority Claims (1)
CN 2014 1 0748723 · Dec 9, 2014 · national
Continuity (1)
Related Publication 20170315151A1 · Nov 2, 2017