IP Library › Granted Patent US 10,283,179
Granted Patent B2
US 10,283,179 · App. 15/879,975 · Granted May 7, 2019

Magnetic Tunnel Junction Memory Device

Inventor: Chwen Yu (Taipei, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
G11C11/161G11C11/155G11C11/16G11C11/1655G11C11/1675H01L27/222H01L43/02H01L43/08
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Quick Facts
Patent No.
US 10,283,179
App. No.
15/879,975
Granted
May 7, 2019
Kind
B2
Abstract

Various memory devices and associated methods of operation are disclosed herein. An exemplary method includes flowing a current through an electrode of a memory device. The current exerts a spin-torque for orienting a magnetic field of a magnetic layer of the memory device and produces a magnetic field in the electrode that assists in orienting the magnetic field of the magnetic layer. The current can produce the magnetic field in the electrode when flowing through a region of the electrode having a winding orientation that is substantially perpendicular to a longitudinal axis of the memory device. In some implementations, flowing the current through the electrode includes storing data in the memory device.

Claims (51)

1. A method comprising:

flowing a current through an electrode of a memory device, wherein the current:

exerts a spin-torque for orienting a magnetic field of a magnetic layer of the memory device, and

produces a magnetic field in the electrode that assists in orienting the magnetic field of the magnetic layer.

2. The method of claim 1 , wherein the orienting the magnetic field includes inducing a magnetic orientation that is substantially parallel to a longitudinal axis of the memory device.

3. The method of claim 1 , wherein:

the memory device is a magnetic tunnel junction device and the magnetic layer is a free layer of the magnetic tunnel junction device; and

the orienting the magnetic field includes inducing a magnetic orientation that is substantially parallel to and in substantially the same direction as a magnetic orientation of a magnetic field of a pinned layer of the magnetic tunnel junction device.

4. The method of claim 1 , wherein:

the memory device is a magnetic tunnel junction device and the magnetic layer is a free layer of the magnetic tunnel junction device; and

the orienting the magnetic field includes inducing a magnetic orientation that is substantially parallel to and in substantially the opposite direction as a magnetic orientation of a magnetic field of a pinned layer of the magnetic tunnel junction device.

5. The method of claim 1 , wherein the current produces the magnetic field in the electrode when flowing through a region of the electrode having a winding orientation that is substantially perpendicular to a longitudinal axis of the memory device.

6. The method of claim 5 , wherein the region has a partially circular shape.

7. The method of claim 5 , wherein the region has a partially rectangular shape.

8. The method of claim 5 , wherein the region has a partially circular shape having piecewise linear segments.

9. A method comprising:

providing a memory device having:

a first electrode,

a first magnetic layer disposed over the first electrode,

a second magnetic layer disposed over the first magnetic layer,

a barrier layer disposed between the first magnetic layer and the second magnetic layer, and

a second electrode disposed over the second magnetic layer; and

flowing a current through the second electrode, wherein the current:

exerts a spin-torque for orienting a magnetic field of the second magnetic layer of the memory device, and

produces a magnetic field in the second electrode that assists in orienting the magnetic field of the second magnetic layer.

10. The method of claim 9 , wherein the flowing the current through the second electrode includes:

generating a first current to flow through the second electrode in a first direction to establish a first magnetic orientation of the magnetic field in the second magnetic layer; and

generating a second current to flow through the second electrode in a second direction to establish a second magnetic orientation of the magnetic field in the second magnetic layer, wherein the second direction is opposite the first direction and the second magnetic orientation is opposite the first magnetic orientation.

11. The method of claim 10 , wherein:

the first magnetic orientation is substantially parallel to and in substantially the same direction as a magnetic orientation in the first magnetic layer; and

the second magnetic orientation is substantially parallel to and in substantially the opposite direction as the magnetic orientation in the first magnetic layer.

12. The method of claim 9 , wherein the second electrode includes a portion having a winding orientation that is substantially perpendicular to a longitudinal axis of the memory device.

13. The method of claim 9 , wherein the flowing the current through the second electrode includes storing data in the memory device.

14. The method of claim 13 , wherein the storing the data in the memory device includes storing a first data value when flowing the current through the second electrode along a first direction and storing a second data value when flowing the current through the second electrode along a second direction that is different than the first direction.

15. A method comprising:

providing a memory device having:

a first electrode,

a pinned layer disposed over the first electrode,

a free layer disposed over the pinned layer,

a barrier layer disposed between the pinned layer and the free layer, and

a second electrode disposed over the free layer; and

flowing a current through the second electrode, wherein the current:

exerts a spin-torque for orienting a magnetic field of the free layer, and

produces a magnetic field in the second electrode that assists in orienting the magnetic field of the free layer.

16. The method of claim 15 , wherein the flowing the current through the second electrode includes:

generating a first current to flow through the second electrode in a first direction to establish a first magnetic orientation of the magnetic field in the free layer; and

generating a second current to flow through the second electrode in a second direction to establish a second magnetic orientation of the magnetic field in the free layer, wherein the second direction is opposite the first direction and the second magnetic orientation is opposite the first magnetic orientation.

17. The method of claim 16 , wherein the establishing the first magnetic orientation of the magnetic field in the free layer includes storing a first data value and the establishing the second magnetic orientation of the magnetic field in the free layer includes storing a second data value that is different than the first data value.

18. The method of claim 16 , wherein the first magnetic orientation and the second magnetic orientation are substantially parallel to a longitudinal axis of the memory device.

19. The method of claim 15 , further comprising reading a data value stored by the memory device.

20. The method of claim 19 , wherein the reading the data value stored by the memory device includes measuring a resistance when an electric potential is applied between the first electrode and the second electrode.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 044730 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 9, 2018
From: YU, CHWEN
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 046110/0132 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2018
From: YU, CHWEN
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
Reel/Frame 044730/0385 →
Continuity (4)
Continuation 15691099 · Aug 30, 2017
Division 14968591 · Dec 14, 2015
Division 13692493 · Dec 3, 2012
Related Publication 20180151213A1 · May 31, 2018