IP Library › Granted Patent US 10,283,551
Granted Patent B2
US 10,283,551 · App. 15/764,492 · Granted May 7, 2019

Back-illuminated solid-state imaging element

Inventors: Masaharu Muramatsu (Hamamatsu, JP); Hisanori Suzuki (Hamamatsu, JP); Yasuhito Yoneta (Hamamatsu, JP); Shinya Otsuka (Hamamatsu, JP); Hirotaka Takahashi (Hamamatsu, JP)
Assignee: HAMAMATSU PHOTONICS K.K.
H01L27/1464H01L27/146H01L27/1462H01L31/02H04N5/369
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Quick Facts
Patent No.
US 10,283,551
App. No.
15/764,492
Granted
May 7, 2019
Kind
B2
Abstract

A back-illuminated solid-state imaging element includes a semiconductor substrate which has a front surface and a back surface provided with a recess, and in which a thinned section, which is a bottom section of the recess, is an imaging area, a signal read-out circuit formed on the front surface of the semiconductor substrate, a boron layer formed on at least the back surface of the semiconductor substrate and a lateral surface of the recess, a metal layer formed on the boron layer, and provided with an opening opposing a bottom surface of the recess, and an anti-reflection layer formed on the bottom surface of the recess.

Claims (15)

1. A back-illuminated solid-state imaging element comprising:

a semiconductor substrate which has a front surface and a back surface provided with a recess, and in which a thinned section which is a bottom section of the recess is an imaging area;

a signal read-out circuit formed on the front surface of the semiconductor substrate;

a boron layer formed on at least the back surface of the semiconductor substrate and a lateral surface of the recess;

a metal layer formed on the boron layer, and provided with an opening opposing a bottom surface of the recess; and

an anti-reflection layer formed on the bottom surface of the recess.

2. The back-illuminated solid-state imaging element according to claim 1 ,

wherein the recess has a frustum shape spreading toward a side opposite to the front surface side of the semiconductor substrate.

3. The back-illuminated solid-state imaging element according to claim 1 ,

wherein the boron layer is further formed on the bottom surface of the recess, and

wherein the anti-reflection layer is formed on the bottom surface of the recess with the boron layer interposed therebetween.

4. The back-illuminated solid-state imaging element according to claim 1 ,

wherein at least a region surrounding the recess in the semiconductor substrate is made of a P type semiconductor material.

5. The back-illuminated solid-state imaging element according to claim 1 ,

wherein the metal layer is a plating layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2018
From: MURAMATSU, MASAHARU; SUZUKI, HISANORI; YONETA, YASUHITO; OTSUKA, SHINYA; TAKAHASHI, HIROTAKA
To: HAMAMATSU PHOTONICS K.K.
Reel/Frame 045386/0309 →
Priority Claims (1)
JP 2015-192975 · Sep 30, 2015 · national
Continuity (1)
Related Publication 20180286901A1 · Oct 4, 2018
Cited By (2)
US 12,610,640 US 12,696,553