Interference security image structure
The interference filter structure has a filter with a top side and a bottom side, a partially reflecting/transmitting thin metal layer, dielectric spacers on each sides of the partially transparent layer and a semi-absorbing film on at least a portion of top side or bottom side of the dielectric spacers. The filter provides a reflection mode when observed from the top or bottom side and light transmission is side independent.
1. An interference filter structure comprising a filter having a top side and a bottom side, the filter comprising:
a partially reflecting/transmitting thin metal layer;
dielectric spacers on each side of the partially reflecting/transmitting thin metal layer, and a semi-absorbing film on at least a portion of a top side of a top one of the dielectric spacers, and a bottom side of a bottom one of the dielectric spacers;
wherein the filter provides a reflection mode when observed from a top or a bottom side of said filter, wherein light transmission is side independent, and wherein the filter is an angular color shift filter.
2. The interference filter structure of claim 1 , wherein the dielectric spacers are asymmetric with respect to the partially transparent layer to provide different light reflection spectra when observed from the top side and bottom side of the filter.
3. The interference filter structure of claim 1 , wherein the dielectric spacers comprise a plurality of dielectric material layers.
4. The interference filter structure of claim 1 , wherein the dielectric spacers are made of a material selected from MgF2, SiO2, Al2O3, ZnCl2, ZnTe, Ta2O5, Nb2O5, ZrO2, TiO2, WO3, VO2, V2O5, Cr2O3, HfO and combinations thereof.
5. The interference filter structure of claim 1 , wherein the dielectric spacer has a thickness of between about 100 nm to about 1000 nm.
6. The interference filter structure of claim 1 , wherein the partially reflecting/transmitting thin metal layer is made of a material selected from Al, Au, Ag, Pt, Cr, V, Ni, W, Inconel, Cu, Zn and combinations thereof.
7. The interference filter structure of claim 1 , wherein the partially reflecting/transmitting thin metal layer has a thickness of between about 2 nm to about 25 nm.
8. The interference filter structure of claim 1 , wherein the semi-absorbing film is a metal film.
9. The interference filter structure of claim 1 , wherein the metal film is of a material selected from Cr, Inconel, Ni, V, Au, Cu, Zn, and combinations thereof.
10. The interference filter structure of claim 1 , wherein the semi-absorbing film has a thickness of between about 2 nm to about 15 nm.
11. The interference filter structure of claim 1 , wherein the filter is combined with an optical component selected from diffractive devices, active electrochromic devices, piezochromic devices, thermochromic devices, photochromic devices, UV-fluorescent devices, upconverting nanoparticles, magnetic materials and combinations thereof.
12. An interference filter structure comprising a filter having a top side and a bottom side, the filter comprising:
a partially reflecting/transmitting thin metal layer;
dielectric spacers on each side of the partially reflecting/transmitting thin metal layer, and a semi-absorbing film on at least a portion of a top side of a top one of the dielectric spacers, and a bottom side of a bottom one of the dielectric spacers;
wherein the filter provides a reflection mode when observed from a top or a bottom side of said filter, wherein light transmission is side independent, and wherein the filter is metameric.
13. An interference filter structure comprising a filter having a top side and a bottom side, the filter comprising:
a partially reflecting/transmitting thin metal layer;
dielectric spacers on each side of the partially reflecting/transmitting thin metal layer, and a semi-absorbing film on at least a portion of a top side of a top one of the dielectric spacers, and a bottom side of a bottom one of the dielectric spacers;
wherein the filter provides a reflection mode when observed from a top or a bottom side of said filter, wherein light transmission is side independent, and wherein the filter further comprises an image patterned therein.
14. The interference filter structure of claim 13 , wherein the filter comprises a section of inverted asymmetry such that the image is visible in reflection mode from the top side and a negative of the image is visible in reflection mode from the bottom side.
15. The interference filter structure of claim 14 , wherein the image is invisible in transmission mode.
16. The interference filter structure of claim 13 , wherein the filter comprises a metameric non-iridescent pigmented material exhibiting an image pattern in transmission mode and wherein said metameric non-iridescent pigmented material exhibits a matching color in reflection mode.
17. The interference filter structure of claim 13 , wherein the image is patterned in only one of the dielectric spacers and is visible in reflection only from the top or bottom side and is visible in transmission mode.
18. The interference filter structure of claim 13 , wherein the semi-absorbing film is patterned such that one or a plurality of predetermined areas of the top or bottom side are free of said semi-absorbing film so as to produce an image in reflection having lower color saturation than areas with said semi-absorbing film.
19. An interference security image structure comprising an interference filter structure having a filter having a top side and a bottom side, the filter further comprising:
a partially reflecting/transmitting thin metal layer;
dielectric spacers on each side of the partially reflecting/transmitting thin metal layer, and a semi-absorbing film on at least a portion of a top side of a top one of the dielectric spacers, and a bottom side of a bottom one of the dielectric spacers;
wherein the filter provides a reflection mode when observed from a top or a bottom side of said filter and wherein light transmission is side independent.