Large field of view, high resolution microscope
A microscope system including: a source of light; a sample objective configured for focusing the light at a focal plane within a sample; a remote focus unit configured for changing a position of the focal plane along an axis perpendicular to the focal plane; one or more optical element configured for directing the focused light to a location within the focal plane; and a detector configured for detecting light emitted from the focal plane within the sample; wherein the one or more optical element is located after the remote focus unit along a beam path of the light from the source to the sample objective, such that the changing the position of the focal plane along the axis is performed before the directing the focused light to the location within the focal plane.
1. A lateral scan unit comprising a first rotatable mirror, a second rotatable mirror, and a third rotatable mirror configured for scanning a light beam within a focal plane;
wherein rotation of the first and second mirrors scans the light beam in the same plane, and the first and second mirrors rotate simultaneously about parallel axes with an angle of rotation of the first mirror being proportional to an angle of rotation of the second mirror, such that the beam rotates about a pupil downstream of the first and second mirrors;
wherein the third mirror is located at the pupil about which the beam rotates by the first and second mirrors; and
wherein rotation of the third mirror scans the light beam in a plane that is orthogonal to the plane in which the beam is scanned by the first and second mirrors.
2. The lateral scan unit of claim 1 , further comprising a forth rotatable mirror arranged in series with the first, second and third mirrors.
3. The lateral scan unit of claim 2 , wherein scan rate of the fourth mirror is higher than scan rates of the first, second and third mirrors, and scan range of the fourth mirror is less than scan ranges of the first, second and third mirrors.
4. The lateral scan unit of claim 3 , wherein the first, second and third mirrors are galvo scan mirrors, and the fourth mirror is a resonant scan mirror.
5. A method for scanning a light beam within a focal plane, comprising:
rotating a first rotatable mirror and a second rotatable mirror simultaneously about parallel axes in order to scan the light beam in the same plane, wherein an angle of rotation of the first mirror being proportional to an angle of rotation of the second mirror, such that the beam rotates about a pupil downstream of the first and second mirrors; locating a third mirror at the pupil about which the beam rotates by the first and second mirrors, and
rotating of the third mirror in order to scan the light beam in a plane that is orthogonal to the plane in which the beam is scanned by the first and second mirrors.
6. The method of claim 5 , further comprising scanning by a forth rotatable mirror arranged in series with the first, second and third mirrors.
7. The method of claim 6 , further comprising rotating the fourth mirror at a rate higher than rotation rates of the first, second and third mirrors, and rotating the fourth mirror at a range less than rotation ranges of the first, second and third mirrors.