Dynamic embedded integrated circuit in trackable item

1. A method comprising:

maintaining a database comprising first scan history data associated with a given integrated circuit associated with a given item;

receiving second scan history data associated with the given integrated circuit; and

determining an authenticity of the given item based on a comparison of the first scan history data to the second scan history data;

wherein the second scan history data is stored in the given integrated circuit each time the given integrated circuit is scanned;

wherein the second scan history data comprises at least current scan data associated with a current scan of the given integrated circuit, and wherein the first scan history data comprises prior scan data associated with at least a scan of the given integrated circuit performed prior to the current scan;

wherein determining the authenticity of the given item comprises comparing the prior scan data to the current scan data; and

wherein the prior scan data and the current scan data comprise respective indications of a location of where the prior scan and the current scan were each performed;

wherein the steps of the method are performed by at least one processing device comprising a processor coupled to a memory.

2. The method of claim 1 , wherein the second scan history data is dynamically stored in the given integrated circuit each time the given integrated circuit is scanned.

3. The method of claim 1 , wherein determining the authenticity of the given item comprises flagging the given item as inauthentic in response to determining that a difference between the location of where the prior scan was performed and the location of where the current scan was performed exceeds a distance threshold.

4. The method of claim 1 , wherein the prior scan data and the current scan data comprise respective indications of a time of when the prior scan and the current scan were each performed.

5. The method of claim 4 , wherein determining the authenticity of the given item comprises flagging the given item as inauthentic in response to determining that a difference between the time of when the prior scan was performed and the time of when the current scan was performed exceeds a time threshold.

6. The method of claim 1 , wherein the second scan history data is received as encrypted second scan history data, and wherein determining the authenticity of the given item further comprises decrypting the encrypted second scan history data.

7. The method of claim 6 , further comprising generating a key associated with the given item based on auxiliary data received with the second scan history data, wherein the encrypted second scan history data is decrypted utilizing the generated key.

8. The method of claim 7 , wherein the auxiliary data comprises a unique identifier associated with the given item.

9. The method of claim 1 , further comprising transmitting results of the determination to a scanner.

10. The method of claim 1 , wherein the given integrated circuit is a radio frequency identification (RFID) integrated circuit.

11. The method of claim 1 , wherein the given item is a currency item.

12. An article of manufacture comprising a processor-readable storage medium having encoded therein executable code of one or more software programs, wherein the one or more software programs when executed by at least one processor implement the steps of:

maintaining a database comprising first scan history data associated with a given integrated circuit associated with a given item;

receiving second scan history data associated with the given integrated circuit;

determining an authenticity of the given item based on a comparison of the first scan history data to the second scan history data;

wherein the second scan history data is stored in the given integrated circuit each time the given integrated circuit is scanned;

wherein the second scan history data comprises at least current scan data associated with a current scan of the given integrated circuit, and wherein the first scan history data comprises prior scan data associated with at least a scan of the given integrated circuit performed prior to the current scan;

wherein determining the authenticity of the given item comprises comparing the prior scan data to the current scan data; and

wherein the prior scan data and the current scan data comprise respective indications of a location of where the prior scan and the current scan were each performed.

13. The article of manufacture of claim 12 , wherein the second scan history data is dynamically stored in the given integrated circuit each time the given integrated circuit is scanned.

14. The article of manufacture of claim 12 , wherein determining the authenticity of the given item comprises flagging the given item as inauthentic in response to determining that a difference between the location of where the prior scan was performed and the location of where the current scan was performed exceeds a distance threshold.

15. The article of manufacture of claim 12 , wherein the prior scan data and the current scan data comprise respective indications of a time of when the prior scan and the current scan were each performed.

16. The article of manufacture of claim 15 , wherein determining the authenticity of the given item comprises flagging the given item as inauthentic in response to determining that a difference between the time of when the prior scan was performed and the time of when the current scan was performed exceeds a time threshold.

17. An apparatus comprising:

at least one computer processor coupled to a memory and configured to:

maintain a database comprising first scan history data associated with a given integrated circuit associated with a given item;

receive second scan history data associated with the given integrated circuit;

determine an authenticity of the given item based on a comparison of the first scan history data to the second scan history data;

wherein the second scan history data is stored in the given integrated circuit each time the given integrated circuit is scanned;

wherein the second scan history data comprises at least current scan data associated with a current scan of the given integrated circuit, and wherein the first scan history data comprises prior scan data associated with at least a scan of the given integrated circuit performed prior to the current scan;

wherein determining the authenticity of the given item comprises comparing the prior scan data to the current scan data; and

wherein the prior scan data and the current scan data comprise respective indications of a location of where the prior scan and the current scan were each performed.

18. The apparatus of claim 17 , wherein the second scan history data is dynamically stored in the given integrated circuit each time the given integrated circuit is scanned.

19. The apparatus of claim 17 , wherein the at least one computer processor is configured to determine the authenticity of the given item at least in part by flagging the given item as inauthentic in response to determining that a difference between the location of where the prior scan was performed and the location of where the current scan was performed exceeds a distance threshold.

20. The apparatus of claim 17 , wherein the prior scan data and the current scan data comprise respective indications of a time of when the prior scan and the current scan were each performed.

21. The apparatus of claim 20 , wherein the at least one computer processor is configured to determine the authenticity of the given item at least in part by flagging the given item as inauthentic in response to determining that a difference between the time of when the prior scan was performed and the time of when the current scan was performed exceeds a time threshold.