Methods for titanium silicide formation using TiCl
The present disclosure generally relates to methods of selectively forming titanium silicides on substrates. The methods are generally utilized in conjunction with contact structure integration schemes. In one embodiment, a titanium silicide material is selectively formed on a substrate as an interfacial layer on a source/drain region. The titanium silicide layer may be formed at a temperature within range of about 400 degrees Celsius to about 500 degrees Celsius.
1. A method of forming a titanium silicide layer, comprising:
heating a substrate in a process chamber to a temperature within a range of 400 degrees Celsius to 500 degrees Celsius, the substrate comprising:
one or more source/drain regions;
one or more first n-type silicon layers disposed on the one or more source/drain regions; and
one or more highly-doped n-type silicon layers disposed on the one or more first n-type silicon layers, each of the one or more highly-doped n-type silicon layers having an n-type dopant concentration within a range of 1×10 18 atoms/cm 3 to 4×10 21 atoms/cm 3 ; and
exposing the substrate to a silicon precursor and titanium precursor concurrently while maintaining a pressure within the process chamber between 10 Torr and 100 Torr, the titanium precursor comprising TiCl 4 ; and
forming a titanium silicide layer on the one or more highly-doped n-type silicon layers.
2. The method of claim 1 , wherein the n-type dopant is phosphorus.
3. The method of claim 2 , wherein at least one of the one or more highly-doped n-type silicon layers comprises amorphous silicon.
4. The method of claim 2 , wherein at least one of the one or more highly-doped n-type silicon layers comprises crystalline silicon.
5. The method of claim 1 , wherein the n-type dopant is arsenic or antimony.
6. The method of claim 1 , wherein at least one of the one or more highly-doped n-type silicon layers comprises titanium.
7. The method of claim 1 , wherein the pressure within the process chamber is within a range of 80 Torr to 100 Torr.
8. The method of claim 1 , wherein at least one of the one or more highly-doped n-type silicon layers has a thickness of 1 nanometer to 10 nanometers.
9. The method of claim 1 , wherein at least one of the one or more highly-doped n-type silicon layers has a thickness of 5 nanometers or less.
10. The method of claim 1 , further comprising exposing the substrate to a TiCl 4 soak prior to forming the titanium silicide layer.
11. The method of claim 10 , wherein the TiCl 4 soak is performed for 15 seconds to 120 seconds.
12. The method of claim 1 , wherein the titanium silicide layer is C49 phase.
13. The method of claim 1 , wherein the titanium silicide layer is C54 phase.
14. The method of claim 1 , wherein the one or more highly-doped n-type silicon layers comprises germanium.
15. The method of claim 1 , wherein the substrate further comprises field oxide layers, and formation of the titanium silicide is selective against the field oxide layers.
16. The method of claim 1 , wherein at least one of the one or more highly-doped n-type silicon layers have a higher dopant concentration than each of the one or more first n-type silicon layers.
17. A method of forming a titanium silicide layer, comprising:
heating a substrate in a process chamber to a temperature within a range of 400 degrees Celsius to 500 degrees Celsius, the substrate comprising:
one or more first n-type silicon layers; and
one or more highly-doped n-type silicon layers disposed over the one or more first n-type silicon layers, the one or more highly-doped n-type silicon layers having an n-type dopant concentration within a range of 1×10 18 atoms/cm 3 to 4×10 21 atoms/cm 3 ;
exposing the substrate to a silicon precursor and titanium precursor concurrently while maintaining a pressure within the process chamber between 80 Torr and 100 Torr, the titanium precursor comprising TiCl 4 ; and
forming a titanium silicide layer on the one or more highly-doped n-type silicon layers.
18. The method of claim 17 , wherein at least one of the one or more highly-doped n-type silicon layers have a higher dopant concentration than each of the one or more first n-type silicon layers.
19. The method of claim 17 , wherein at least one of the one or more highly-doped n-type silicon layers has a thickness within a range of 1 nanometer to 10 nanometers.
20. The method of claim 19 , wherein the n-type dopant is phosphorus.