Semiconductor device with buried cavities and dielectric support structures
A semiconductor device includes a semiconductor substrate with a first surface. The device further includes one or more semiconductor devices formed or the first surface in an active area. The device further includes a plurality of cavities in the semiconductor substrate beneath the first surface. The device further includes dielectric support structures between each of the cavities and spaced apart from the first surface. The dielectric support structures support a part of the semiconductor substrate between the active area and the cavities. The dielectric support structures include an oxide.
1. A semiconductor device, comprising;
a semiconductor substrate with a first surface;
one or more semiconductor devices formed on the first surface in an active area;
a plurality of enclosed cavities in the semiconductor substrate beneath the first surface; and
dielectric support structures between two adjacent ones of the cavities in the plurality and spaced apart from the first surface,
a region of semiconductor material extending to the first surface of the semiconductor substrate and covering the plurality of enclosed cavities and the dielectric support structures, the region of semiconductor material comprising the active area,
wherein the dielectric support structures comprise an oxide, and
wherein the dielectric support structures extend along outer sidewalls of the two adjacent ones of the cavities in the plurality,
wherein the plurality of enclosed cavities in the semiconductor substrate and the dielectric support structures collectively form a buried insulator layer disposed in the semiconductor substrate beneath the first surface, and wherein the buried insulator layer comprises an undulating upper side directly adjoining a lower side of the region of semiconductor material.
2. The semiconductor device of claim 1 , wherein each of the cavities in the plurality and the dielectric support structures form a buried insulator layer electrically insulating the active area from a subjacent region of the semiconductor substrate.
3. The semiconductor device of claim 1 , further comprising an access trench extending from the first surface to a first one of the cavities in the plurality, wherein the access trench and the first cavity are filled with an electrically conductive material.
4. The semiconductor device of claim 1 , wherein the access trench and the first cavity enclose a device area of the semiconductor substrate such that the device area is laterally insulated from adjacent portions of the semiconductor substrate, wherein the device area comprises one or more semiconductor devices.
5. The semiconductor device of claim 4 , wherein one or more of the cavities in the plurality and the dielectric support structures form a buried insulator layer inside of the first cavity beneath the first surface such that a three-dimensional region of semiconductor material inside the access trench is completely electrically insulated from adjacent portions of the semiconductor substrate.
6. The semiconductor device of claim 4 , wherein the access trench and the first cavity are configured as a charge storing capacitor that is electrically connected to one of the semiconductor devices.
7. An SOI substrate, comprising;
a semiconductor substrate with a first surface and a second surface opposite the first surface;
an insulating layer disposed in the semiconductor substrate between the first and second surfaces; and
an active area of the semiconductor substrate comprising a semiconductor material disposed between the insulating layer and the first surface, and
wherein the insulating layer comprises:
an undulating upper side directly adjoining a lower side of the active area; and
a plurality of dielectric support structures spaced apart from one another at regular intervals, wherein each of the dielectric support structures in the plurality are vertical columns of oxide that extend in a direction perpendicular to the first and second surfaces, and wherein the each of dielectric support structures in the plurality support the active area of the semiconductor substrate.
8. The SOI substrate of claim 7 , wherein the insulating layer further comprises a plurality of electrically insulating regions disposed between adjacent spaced apart pairs of the dielectric support structures in the plurality.
9. The SOI substrate of claim 8 , wherein the plurality of electrically insulating regions comprises a plurality of unfilled cavities containing air.
10. The SOI substrate of claim 7 , wherein the undulating upper side of the insulating layer comprises a plurality of apexes that are disposed between the each of the dielectric support structures in the plurality and a plurality of nadirs directly adjoining two adjacent ones the dielectric support structures in the plurality, wherein the apexes are spaced closest to the first surface, and wherein the nadirs are furthest away from the first surface.
11. The SOI substrate of claim 7 , wherein the insulating layer completely insulates the active area of the semiconductor substrate from a subjacent region of the semiconductor substrate.
12. The SOI substrate of claim 7 , further comprising one or more semiconductor devices formed in the active area.
13. The semiconductor device of claim 1 , wherein the dielectric support structures extend to a bottom side of the two adjacent ones of the cavities.
14. The semiconductor device of claim 1 , wherein the dielectric support structures are vertical columns of oxide that extend in a direction perpendicular to the first surface.