Dummy features in redistribution layers (RDLS) and methods of forming same

1. A device comprising:

a semiconductor die;

a first metallization pattern over the semiconductor die, wherein the first metallization pattern comprises:

a first conductive material encircling a first insulating material in a top down view, wherein the first conductive material encircles a third insulating material in the top down view, a second portion of the first conductive material being disposed between the first insulating material and the third insulating material; and

a first signal line electrically connected to the semiconductor die; and

a second metallization pattern over the first metallization pattern, wherein the second metallization pattern comprises a second conductive material encircling a second insulating material in the top down view, and wherein the second insulating material is disposed directly over a first portion of the first insulating material and a first portion of the first conductive material, and wherein the second conductive material is disposed directly over the third insulating material.

2. The device of claim 1 , wherein the second conductive material is disposed directly over a second portion of the first insulating material and a third portion of the first conductive material.

3. The device of claim 1 further comprising a via extending through the second metallization pattern, and wherein the via electrically connects the first signal line to a second signal line disposed over the second metallization pattern.

4. The device of claim 1 , wherein the second conductive material completely covers the first signal line in the top down view.

5. The device of claim 1 , wherein the first conductive material or the second conductive material are electrically insulated from any active devices in the semiconductor die.

6. The device of claim 1 , wherein the second insulating material is disposed directly over the third insulating material.

7. The device of claim 1 , wherein the semiconductor die is encapsulated in a molding compound, and wherein the first metallization pattern is disposed over the molding compound.

8. A package comprising:

an integrated circuit die encapsulated in an encapsulant;

a first metallization pattern over the integrated circuit die, wherein the first metallization pattern comprises:

a first dummy conductive pattern encircling a first plurality of physically separated dielectric regions; and

a first signal line electrically connected to the integrated circuit die; and

a second metallization pattern over the first metallization pattern, wherein the second metallization pattern comprises a second dummy conductive pattern encircling a second plurality of physically separated dielectric regions, wherein a first line perpendicular to a major surface of the integrated circuit die extends through a first one of the second plurality of physically separated dielectric regions and the first dummy conductive pattern.

9. The package of claim 8 , wherein a second line parallel to the first line extends through a first one of the first plurality of physically separated dielectric regions and the second dummy conductive pattern.

10. The package of claim 8 , wherein the first metallization pattern is disposed in a first dielectric layer comprising the first plurality of physically separated dielectric regions, wherein a portion of the first dielectric layer is disposed over the first metallization pattern, and wherein the portion of the first dielectric layer extends from a first one of the first plurality of physically separated dielectric regions to a second one of the first plurality of physically separated dielectric regions.

11. The package of claim 8 further comprising:

a third metallization pattern over the second metallization pattern, wherein the third metallization pattern comprises a third dummy conductive pattern encircling a third plurality of physically separated dielectric regions, and wherein the first line extends through the third dummy conductive pattern.

12. The package of claim 11 , wherein the third dummy conductive pattern has a same shape as the first dummy conductive pattern in a top down view.

13. The package of claim 8 , wherein the second dummy conductive pattern comprises a continuous conductive region, and wherein a surface area of the continuous conductive region is greater than a surface area of the first one of the second plurality of physically separated dielectric regions.

14. The package of claim 13 , wherein the continuous conductive region is disposed directly over the first signal line.

15. The package of claim 14 further comprising a via extending through the continuous conductive region, wherein the via electrically connects the first signal line to a second signal line over the second metallization pattern.

16. A method comprising:

encapsulating an integrated circuit die in a molding compound;

forming a first dummy pattern over the integrated circuit die, wherein the first dummy pattern comprises:

a first conductive material; and

a first plurality of holes extending through the first conductive material and arranged in a first grid of first rows and first columns;

depositing a first dielectric layer in the first plurality of holes;

forming a second dummy pattern over the first dielectric layer, wherein the second dummy pattern comprises:

a second conductive material; and

a plurality of second holes extending through the second conductive material and disposed in a second grid of second rows and second columns, wherein the second grid is offset from the first grid; and

depositing a second dielectric layer in the second plurality of holes.

17. The method of claim 16 , further comprising while forming the first dummy pattern, forming a first signal line electrically connected to the integrated circuit die.

18. The method of claim 16 further comprising:

forming a third dummy pattern over the second dielectric layer, wherein the third dummy pattern comprises:

a third conductive material; and

a plurality of third holes extending through the third conductive material and disposed in a third grid of third rows and third columns, wherein the third grid is offset from the second grid; and

depositing a third dielectric layer in the third plurality of holes.

19. A method of claim 18 , the third grid is aligned with the first grid.

20. The method of claim 16 , the first dielectric layer extends above the first dummy pattern, and wherein the second dielectric layer extends above the second dummy pattern.