IP Library Granted Patent US 10,340,232
Granted Patent B2
US 10,340,232 · App. 15/975,990 · Granted Jul 2, 2019

Wiring substrate

Inventors: Toshiaki Aoki (Nagano, JP); Shinji Nakazawa (Nagano, JP)
Assignee: SHINKO ELECTRIC INDUSTRIES CO., LTD.
H01L23/645H01L23/49822H01L23/49838H01L23/49866H01L24/16H01L2224/16227
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Quick Facts
Patent No.
US 10,340,232
App. No.
15/975,990
Granted
Jul 2, 2019
Kind
B2
Abstract

A wiring substrate includes a coil wiring and a magnetic layer that is in contact with a lower surface of the coil wiring and includes an opening extending through in a thickness-wise direction. The wiring substrate further includes a first insulation layer covering the coil wiring, an upper surface of the magnetic layer, and a wall surface of the opening and a signal wiring structure formed so that a signal of a semiconductor element, when mounted on the wiring substrate, travels through the opening of the magnetic layer. The signal wiring structure includes a first wiring portion located on an upper surface of the first insulation layer and a first via wiring located inward from the opening of the magnetic layer and connected to the first wiring portion. The magnetic layer is not in contact with the signal wiring structure.

Claims (47)

1. A wiring substrate comprising:

a coil wiring;

a magnetic layer that is in contact with a lower surface of the coil wiring, wherein the magnetic layer includes an opening extending through in a thickness-wise direction;

a first insulation layer covering the coil wiring, an upper surface of the magnetic layer, and a wall surface of the opening; and

a signal wiring structure that transmits a signal of a semiconductor element in the wiring substrate when the semiconductor element is mounted on the wiring substrate, wherein the signal wiring structure is formed so that the signal of the semiconductor element travels through the opening of the magnetic layer, wherein

the signal wiring structure includes

a first wiring portion located on an upper surface of the first insulation layer, and

a first via wiring located inward from the opening of the magnetic layer and connected to the first wiring portion, wherein

the first insulation layer includes an opening extending through in the thickness-wise direction and located inward from the opening of the magnetic layer,

the first via wiring is filled in the opening of the first insulation layer,

the first insulation layer is filled in a gap between the first via wiring and the wall surface of the opening of the magnetic layer, and

the magnetic layer is not in contact with the signal wiring structure.

2. The wiring substrate according to claim 1 , further comprising a second insulation layer covering a lower surface of the magnetic layer, wherein

the signal wiring structure further includes a second wiring portion connected to the first via wiring and embedded in the second insulation layer so that a lower surface of the second wiring portion is exposed.

3. The wiring substrate according to claim 2 , further comprising:

a third wiring portion embedded in the second insulation layer so that a lower surface of the third wiring portion is exposed; and

a second via wiring connecting the third wiring portion to the coil wiring.

4. The wiring substrate according to claim 1 , wherein

the signal wiring structure further includes a second wiring portion connected to the first via wiring, wherein the second wiring portion is located inward from the opening of the magnetic layer and embedded in the first insulation layer so that a lower surface of the second wiring portion is exposed.

5. The wiring substrate according to claim 4 , further comprising:

a third wiring portion embedded in the magnetic layer so that a lower surface of the third wiring portion is exposed; and

a second via wiring connecting the third wiring portion to the coil wiring.

6. The wiring substrate according to claim 1 , further comprising a second insulation layer covering a lower surface of the magnetic layer, wherein

the signal wiring structure further includes a second wiring portion connected to the first via wiring and embedded in the second insulation layer so that a lower surface of the second wiring portion is exposed,

the second insulation layer includes an opening that is continuous with the opening of the magnetic layer and partially exposes an upper surface of the second wiring portion, and

the first insulation layer is further filled in a gap between the first via wiring and a wall surface of the opening of the second insulation layer.

7. The wiring substrate according to claim 1 , wherein

the signal wiring structure further includes a second wiring portion connected to the first via wiring, wherein

the second wiring portion is located inward from the opening of the magnetic layer and embedded in the first insulation layer so that a lower surface of the second wiring portion is exposed, and

the first insulation layer is further filled in a gap between the wall surface of the opening of the magnetic layer and a side surface of the second wiring portion.

8. A wiring substrate comprising:

an insulation layer including an upper surface and a lower surface;

a coil wiring formed on the lower surface of the insulation layer;

a magnetic layer covering the lower surface of the insulation layer and the coil wiring, wherein the magnetic layer includes an opening extending through in a thickness-wise direction; and

a signal wiring structure that transmits a signal of a semiconductor element in the wiring substrate when the semiconductor element is mounted on the wiring substrate, wherein the signal wiring structure is formed so that the signal of the semiconductor element travels through the opening of the magnetic layer,

wherein the magnetic layer is not in contact with the signal wiring structure.

9. The wiring substrate according to claim 8 , wherein

the signal wiring structure includes a wiring portion formed on the lower surface of the insulation layer, and

the opening of the magnetic layer exposes the wiring portion and the lower surface of the insulation layer located around the wiring portion.

10. The wiring substrate according to claim 9 , further comprising a second insulation layer covering the lower surface of the magnetic layer, a wall surface of the opening of the magnetic layer, the lower surface of the insulation layer located around the wiring portion, and a part of the wiring portion, wherein the second insulation layer includes an opening exposing a part of a lower surface of the wiring portion.

11. The wiring substrate according to claim 8 , further comprising a second coil wiring formed in the upper surface of the insulation layer and connected to the coil wiring to form a helical coil.

12. A semiconductor device comprising:

the wiring substrate according to claim 1 ; and

the semiconductor element mounted on the wiring substrate.

13. A semiconductor device comprising:

the wiring substrate according to claim 8 ; and

the semiconductor element mounted on the wiring substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2018
From: AOKI, TOSHIAKI; NAKAZAWA, SHINJI
To: SHINKO ELECTRIC INDUSTRIES CO., LTD.
Reel/Frame 045765/0720 →
Priority Claims (1)
JP 2017-124580 · Jun 26, 2017 · national
Continuity (1)
Related Publication 20180374803A1 · Dec 27, 2018