Methods and apparatus for narrowband ranging systems using reference signal interpolation
Methods and apparatus to determine an accurate distance to a target using reference signal interpolation is disclosed. An example apparatus includes an interpolator to receive a first sample of a reference signal and a second sample of a reference signal; and interpolating a reconstructed reference signal sample based on the first and second samples, the reconstructed reference signal corresponding to the reference signal; a correlator to generate a plurality of phase-shifted, reconstructed reference signals; and correlate each of the plurality of phase-shifted, reconstructed reference signals with a reflected signal; and an optimal phase selector to determine an optimal phase based on the correlations and output a distance to a target based on the optimal phase.
1. A method comprising:
receiving first and second samples of a reference signal having a frequency;
generating reconstructed reference signals having the frequency at different phase offsets, including by interpolating between the first and second samples;
receiving a signal reflected off an object, wherein the signal reflected off the object includes a reflection of the reference signal off the object, and the first and second samples are of the reference signal without reflection off the object;
generate correlations by correlating the reconstructed reference signals with the signal reflected off the object;
selecting a phase based on the correlations; and
determining a distance of the object based on the selected phase.
2. The method of claim 1 , wherein the reference signal is transmitted from a transducer.
3. The method of claim 1 , wherein the selected phase corresponds to the distance of the object.
4. The method of claim 1 , wherein the different phase offsets are between the first sample and the second sample.
5. The method of claim 1 , wherein the correlations include respective peak values and respective side lobe values.
6. The method of claim 5 , wherein the correlations correspond to the different phase offsets.
7. The method of claim 6 , wherein selecting the phase includes selecting the phase based on at least one of: a highest peak value of the correlations; or a highest peak to side lobe ratio of the correlations.
8. The method of claim 7 , further comprising determining a delay based on the selected phase, the delay corresponding to the distance.
9. The method of claim 8 , further comprising performing a curve fit operation around the highest peak value to determine a fine estimate of the highest peak value, the highest peak value corresponding to the delay.
10. An apparatus comprising:
an interpolator having an output, the interpolator configured to: receive first and second samples of a reference signal having a frequency; generate reconstructed reference signals having the frequency at different phase offsets, including by interpolating between the first and second samples; and provide the reconstructed reference signals at the output of the interpolator;
a correlator having an input coupled to the output of the interpolator, the correlator having an output, and the correlator configured to: receive a signal reflected off an object, wherein the signal reflected off the object includes a reflection of the reference signal off the object, and the first and second samples are of the reference signal without reflection off the object; generate correlations by correlating the reconstructed reference signals with the signal reflected off the object; and provide the correlations at the output of the correlator; and
a phase selector having an input coupled to the output of the correlator, the phase selector having an output, and the phase selector configured to: select a phase based on the correlations; determine a distance of the object based on the selected phase; and provide the distance at the output of the phase selector.
11. The apparatus of claim 10 , further comprising a transducer configured to transmit the reference signal.
12. The apparatus of claim 10 , wherein the selected phase corresponds to the distance of the object.
13. The apparatus of claim 10 , wherein the different phase offsets are between the first sample and the second sample.
14. The apparatus of claim 10 , wherein the correlations include respective peak values and respective side lobe values.
15. The apparatus of claim 14 , wherein the correlations correspond to the different phase offsets.
16. The apparatus of claim 15 , wherein the phase selector is configured to select the phase based on at least one of: a highest peak value of the correlations; or a highest peak to side lobe ratio of the correlations.
17. The apparatus of claim 16 , where the phase selector is configured to determine a delay based on the selected phase, the delay corresponding to the distance.
18. The apparatus of claim 17 , wherein the phase selector is configured to perform a curve fit operation around the highest peak value to determine a fine estimate of the highest peak value, the highest peak value corresponding to the delay.