IP Library › Granted Patent US 10,367,471
Granted Patent B2
US 10,367,471 · App. 15/058,713 · Granted Jul 30, 2019

Resonator package and method of manufacturing the same

Inventors: Tae Yoon Kim (Suwon-si, KR); Yeong Gyu Lee (Suwon-si, KR); Moon Chul Lee (Suwon-si, KR); Jae Chang Lee (Suwon-si, KR); Duck Hwan Kim (Suwon-si, KR)
Assignee: Samsung Electro-Mechanics Co., Ltd.
H03H9/131H03H3/02H03H9/1007
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Quick Facts
Patent No.
US 10,367,471
App. No.
15/058,713
Granted
Jul 30, 2019
Kind
B2
Abstract

A resonator package and a method of manufacturing the same are provided. The method of manufacturing a resonator package involves etching a lower electrode with a hardmask, in which only a portion of a thickness of the lower electrode is etched to shape the lower electrode.

Claims (15)

1. A resonator package comprising:

a lower electrode disposed on a first surface of a piezoelectric layer, an insulating layer being disposed on a second surface of the piezoelectric layer, and the lower electrode having at least two portions with different thicknesses;

a dielectric layer disposed on the lower electrode; and

an upper electrode provided on the dielectric layer and insulated from the lower electrode.

2. The resonator package of claim 1 , wherein the lower electrode has an end step portion disposed along one end portion of the lower electrode and being perpendicular to the first surface of the piezoelectric layer.

3. The resonator package of claim 1 , wherein the lower electrode has an end slope portion disposed along on one end portion of the lower electrode, and wherein a thickness of the end slope portion decreases with approaching the first surface of the piezoelectric layer.

4. A resonator package comprising:

a piezoelectric layer, a lower electrode, a dielectric layer, and an upper electrode disposed in that order,

wherein the lower electrode has a smaller area than the piezoelectric layer in a plan view, and the lower electrode comprises at least two portions with different thicknesses, and

wherein the upper electrode is insulated from the lower electrode.

5. The resonator package of claim 4 , wherein the lower electrode has an end step portion disposed along one end portion of the lower electrode and being perpendicular to the first surface of the piezoelectric layer, and the dielectric layer covers the at least one step portion and the end step portion of the lower electrode.

6. The resonator package of claim 4 , wherein the lower electrode comprises an end slope portion disposed along on one end portion of the lower electrode, a thickness of the end slope portion decreases with approaching the first surface of the piezoelectric layer, and the dielectric layer comprises a corresponding slope portion above the end slope portion of the lower electrode.

7. The resonator package of claim 6 , wherein the at least one step portion and the end slope portion of the lower electrode are obtained by at least two electrode etching processes.

8. The resonator package of claim 1 , wherein the at least two portions are disposed parallel to the first surface of the piezoelectric layer, and are separated by at least one step portion.

9. The resonator package of claim 4 , wherein the at least two portions are disposed parallel to a surface of the piezoelectric layer, and are separated by at least one step portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2016
From: KIM, TAE YOON; LEE, YEONG GYU; LEE, MOON CHUL; LEE, JAE CHANG; KIM, DUCK HWAN
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 037872/0963 →
Priority Claims (2)
KR 10-2015-0070825 · May 21, 2015 · national
KR 10-2015-0126960 · Sep 8, 2015 · national
Continuity (1)
Related Publication 20160344367A1 · Nov 24, 2016