Semiconductor device having ranks that perform a termination operation
A semiconductor device includes a first rank and a second rank. The first rank operates in synchronization with a clock signal in response to a first rank selection signal, and the second rank operates in synchronization with the clock signal in response to a second rank selection signal. The first rank performs a termination operation without performing an internal control operation if the first rank selection signal maintains an enabled state in synchronization with a first edge and a second edge of the clock signal.
1. A semiconductor device comprising:
a first rank configured to operate in synchronization with a clock signal in response to a first rank selection signal; and
a second rank configured to operate in synchronization with the clock signal in response to a second rank selection signal,
wherein the first rank generates a command for execution of an internal control operation and a termination command for execution of a termination operation based on the first rank selection signal,
wherein the first rank generates the termination command and terminates generation of the command when the first rank selection signal is enabled during an Nth period of the clock signal, and N is a natural number greater than or equal to 2.
2. The semiconductor device of claim 1 , wherein the first rank performs the internal control operation in response to a pre-command inputted in synchronization with the first edge of the clock signal, if the first rank selection signal is enabled in synchronization with the first edge of the clock signal and is disabled in synchronization with the second edge of the clock signal.
3. The semiconductor device of claim 1 , wherein the second rank performs the termination operation without performing the internal control operation, if the second rank selection signal maintains an enabled state in synchronization with the first and second edges of the clock signal.
4. The semiconductor device of claim 3 , wherein the second rank performs the internal control operation in response to a pre-command inputted in synchronization with the first edge of the clock signal, if the second rank selection signal is enabled in synchronization with the first edge of the clock signal and is disabled in synchronization with the second edge of the clock signal.
5. The semiconductor device of claim 1 , wherein the first and second edges of the clock signal correspond to a rising edge in which a logic level of the clock signal is changed from a logic “low” level into a logic “high” level.
6. The semiconductor device of claim 1 , wherein the internal control operation is any one among a mode register read operation, a write operation and a read operation.
7. The semiconductor device of claim 1 , wherein the first rank includes:
a first command generation circuit configured to generate a first command for execution of the internal control operation and a first termination command for execution of the termination operation from a first pre-command, in response to a first input control signal and a first termination enable signal; and
a second command generation circuit configured to generate a second command for execution of the internal control operation and a second termination command for execution of the termination operation from a second pre-command, in response to a second input control signal and a second termination enable signal.
8. The semiconductor device of claim 7 , wherein:
the first input control signal is enabled if the first rank selection signal is enabled in synchronization with the first edge of the clock signal; and
the second input control signal is enabled if the first rank selection signal is enabled in synchronization with the second edge of the clock signal.
9. The semiconductor device of claim 7 , wherein:
the first command generation circuit receives the first pre-command if the first input control signal is enabled; and
the second command generation circuit receives the second pre-command if the second input control signal is enabled.
10. The semiconductor device of claim 7 , wherein the first termination enable signal is enabled if the second input control signal is enabled while the first termination command is enabled.
11. The semiconductor device of claim 10 , wherein the first command generation circuit terminates generation of the first command if the first termination enable signal is enabled.
12. The semiconductor device of claim 7 , wherein the second termination enable signal is enabled if the first input control signal is enabled while the second termination command is enabled.
13. The semiconductor device of claim 12 , wherein the second command generation circuit terminates generation of the second command if the second termination enable signal is enabled.
14. The semiconductor device of claim 7 , wherein the first command generation circuit terminates generation of the first command and the first termination command if the second termination command is enabled.
15. The semiconductor device of claim 7 , wherein the second command generation circuit terminates generation of the second command and the second termination command if the first termination command is enabled.
16. The semiconductor device of claim 7 , wherein:
the first pre-command includes a first pre-mode register read command, a first pre-write command and a first pre-read command; and
the first command includes a first mode register read command, a first write command and a first read command.
17. The semiconductor device of claim 7 , wherein the first command generation circuit includes:
an internal command generation circuit configured to generate a first internal command from the first pre-command in response to the first input control signal; and
a command output circuit configured to generate the first command and the first termination command from the first internal command in response to the first termination enable signal.
18. The semiconductor device of claim 7 , wherein the first command generation circuit includes an input control signal generation circuit configured to generate the first input control signal, which is enabled if the first rank selection signal is enabled, in synchronization with the first edge of the clock signal,
and configured to generate the second termination enable signal and a second termination enable command in response to the first input control signal and the second termination command.
19. The semiconductor device of claim 7 , wherein:
the first command generation circuit is configured to generate a second termination enable command in response to the second termination enable signal; and
the second command generation circuit is configured to generate a first termination enable command in response to the first termination enable signal.
20. The semiconductor device of claim 19 , wherein the first rank further includes a signal synthesis circuit configured to generate a termination latency signal from the first termination enable command and the second termination enable command in synchronization with the first edge and the second edge of the clock signal.
21. A semiconductor device comprising:
a first command generation circuit configured to generate a first command for execution of a first internal control operation and a first termination command for execution of a termination operation from a first pre-command, in response to a first input control signal and a first termination enable signal; and
a second command generation circuit configured to generate a second command for execution of a second internal control operation and a second termination command for execution of a termination operation from a second pre-command, in response to a second input control signal and a second termination enable signal,
wherein the first pre-command is inputted to the first command generation circuit when a logic level of the clock signal is changed from a first logic level to a second logic level and the second pre-command is inputted to the second command generation circuit when the logic level of the clock signal is changed from the second logic level to the first logic level, and
wherein a termination of the generation of the first termination command occurs during an Nth period of the clock signal, and N is a natural number greater than or equal to 2.
22. The semiconductor device of claim 21 , wherein:
the first input control signal is enabled if a rank selection signal is enabled in synchronization with a first edge of a clock signal; and
the second input control signal is enabled if the rank selection signal is enabled in synchronization with a second edge of the clock signal.
23. The semiconductor device of claim 21 , wherein:
the first command generation circuit receives the first pre-command if the first input control signal is enabled; and
the second command generation circuit receives the second pre-command if the second input control signal is enabled.
24. The semiconductor device of claim 21 , wherein:
the first command generation circuit terminates generation of the first command if the first termination enable signal is enabled; and
the first termination enable signal is enabled if the second input control signal is enabled while the first termination command is enabled.
25. The semiconductor device of claim 21 , wherein:
the second command generation circuit terminates generation of the second command if the second termination enable signal is enabled; and
the second termination enable signal is enabled if the first input control signal is enabled while the second termination command is enabled.
26. The semiconductor device of claim 21 , wherein the first command generation circuit terminates generation of the first command and the first termination command if the second termination command is enabled.
27. The semiconductor device of claim 21 , wherein the second command generation circuit terminates generation of the second command and the second termination command if the first termination command is enabled.
28. The semiconductor device of claim 21 , wherein the first command generation circuit includes:
an internal command generation circuit configured to generate a first internal command from the first pre-command in response to the first input control signal; and
a command output circuit configured to generate the first command and the first termination command from the first internal command in response to the first termination enable signal.
29. The semiconductor device of claim 21 , wherein the first command generation circuit includes an input control signal generation circuit configured to generate the first input control signal, which is enabled if the first rank selection signal is enabled, in synchronization with the first edge of the clock signal,
and configured to generate the second termination enable signal and a second termination enable command in response to the first input control signal and the second termination command.